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Technique first digitizes difference between input and previous conversion. Digitized difference is added to previous digitized value to yield new digital representation of analog input. Output of analog-to-digital converter is useful as digital derivative of input signal.
A method and apparatus for analog-to-digital conversion. An Analog-to-Digital Converter (ADC) includes M ADC.sub.j, j=1, 2, . . . , M. Each ADC.sub.j comprises a number of cells each of which comprises a first switch, a second switch, a current sink and an inverter. An inverter of a cell in an ADC.sub.j changes state in response to a current associate with an input signal of the ADC.sub.j exceeding a threshold, thus switching on the next cell. Each ADC.sub.j is enabled to perform analog-to-digital conversion on a residual current of a previous ADC.sub.j-1 after the previous ADC.sub.j-1 has completed its analog-to-digital conversion and has been disabled.
Spacecraft analog to digital conversion system employing MOSFET
Spacecraft analog to digital conversion system employing metal oxide semiconductor field effect transistors
This paper presents approaches for on-focal-plane analog-to-digital conversion (ADC). Common approaches and architectures for ADC and their utility for on-focal-plane integration are discussed. Candidate approaches are analyzed with respect to required amplifier gain, bandwidth, capacitance matching, noise and offsets as a function of ADC resolution. A column-parallel ADC architecture appears to be an effective compromise of chip area, power, circuit speed and ADC resolution. The discussion is valid for both infrared focal-plane arrays (FPAs) and visible image sensors.
Analog-digital conversion of TV video data on Mariner IV, noting ground loop effect on encoding
Methods and apparatus for optical analog to digital conversion are disclosed. An optical signal is converted by mapping the optical analog signal onto a wavelength modulated optical beam, passing the mapped beam through interferometers to generate analog bit representation signals, and converting the analog bit representation signals into an optical digital signal. A photodiode receives an optical analog signal, a wavelength modulated laser coupled to the photodiode maps the optical analog signal to a wavelength modulated optical beam, interferometers produce an analog bit representation signal from the mapped wavelength modulated optical beam, and sample and threshold circuits corresponding to the interferometers produce a digital bit signal from the analog bit representation signal.
Detailed analysis of an analog-to-digital conversion system consisting of a linear converter and a logarithmic amplifier containing nonlinear elements. It is shown that the small-signal resolution of such a system is much greater than that of linear systems used under the same conditions. A design for a low-power analog-to-digital converter operating at medium speed with a large input signal variation field is outlined.
This innovation is a series of time-tag pulses from a photomultiplier tube, featuring short time interval between pulses (e.g., 2.5 ns). Using the previous art, dead time between pulses is too long, or too much hardware is required, including a very-high-speed demultiplexer. A faster method is needed. The goal of this work is to provide circuits to time-tag pulses that arrive at a high rate using the hardwired logic in an FPGA - specifically the carry chain - to create what is (in effect) an analog delay line. High-speed pulses travel down the chain in a "wave." For instance, a pulse train has been demonstrated from a 1- GHz source reliably traveling down the carry chain. The size of the carry chain is over 10 ns in the time domain. Thus, multiple pulses will travel down the carry chain in a wave simultaneously. A register clocked by a low-skew clock takes a "snapshot" of the wave. Relatively simple logic can extract the pulses from the snapshot picture by detecting the transitions between logic states. The propagation delay of CMOS (complementary metal oxide semiconductor) logic circuits will differ and/or change as a result of temperature, voltage, age, radiation, and manufacturing variances. The time-to-digital conversion circuits can be calibrated with test signals, or the changes can be nulled by a separate on-die calibration channel, in a closed loop circuit.
The design and projected performance of a low-light-level active-pixel-sensor (APS) chip with semi-parallel analog-to-digital (A/D) conversion is presented. The individual elements have been fabricated and tested using MOSIS* 2 micrometer CMOS technology, although the integrated system has not yet been fabricated. The imager consists of a 128 x 128 array of active pixels at a 50 micrometer pitch. Each column of pixels shares a 10-bit A/D converter based on first-order oversampled sigma-delta (Sigma-Delta) modulation. The 10-bit outputs of each converter are multiplexed and read out through a single set of outputs. A semi-parallel architecture is chosen to achieve 30 frames/second operation even at low light levels. The sensor is designed for less than 12 e^- rms noise performance.
Analog-to-digital encoding system for slow-scan video data processing on Mars spacecraft
Three types of analog-to-digital converters are described: parallel, successive-approximation, and integrating. The functioning of comparators and sample-and-hold amplifiers is explained. Differential and integral linearity are defined, and good and bad examples are illustrated. The applicability and relative advantages of the three types of converters for precision astronomical photometric measurements are discussed. For most measurements, integral linearity is more important than differential linearity. Successive-approximation converters should be used with multielement solid state detectors because of their high speed, but dual slope integrating converters may be superior for use with single element solid state detectors where speed of digitization is not a factor. In all cases, the input signal should be tailored so that they occupy the upper part of the converter's dynamic range; this can be achieved by providing adjustable gain, or better by varying the integration time of the observation if possible.
Conversion system for increasing resolution of analog to digital converters
FM data handling facility for preparing analog physiological data obtained in flight for digital computations
The Oak Ridge National Laboratory (ORNL) has pioneered an approach where low-cost consumer-grade electronics can be used as the basis of a highly reliable data acquisition architecture. One twenty-channel system based on this approach has been operating almost 4 years at ORNL. The architecture allows a mix-and-match level of configurability so the designer can select devices that best match the desired performance trade-offs. The most important device to be selected is the analog-to-digital converter. This paper explores the performance of several candidate audio recording devices that can be used as high-speed analog-to-digital converters for such measurement systems. Various performance metrics are explored including frequency response, noise floor, and synchronous sampling. Sample rates as high as 192 KHz are supported with 16 and 24-bit resolution. While most of the devices are dual-channel, there are multi-channel devices now available that will allow modal type of synchronous sampling. One such device was tested and is discussed is this paper.
There are no author-identified significant results in this report.
Computer-controlled system allows operator to record only those data points selected. It consists of commercially available X-Y plotter, computer, and A/D and D/A converters. New component is strain gage controller and amplifier which can be adapted to existing systems.
Device, which converts directly from analog signal to its radix (-2) representation, is based on successive approximation approach.