Sum-fit method of analysis of nuclear decay spectra affected by extending dead-time
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This paper introduces a dead-time optimization technique for a 2-level voltage source converter (VSC) using turn-off transition monitoring. Dead-time in a VSC impacts power quality, reliability, and efficiency. Silicon carbide (SiC) based VSCs are more sensitive to dead-time from increased reverse conduction losses and turn-off time variability with operating conditions and load characteristics. An online condition monitoring system for SiC devices has been developed using gate drive assist circuits and a micro-controller. It can be leveraged to monitor turn-off time and indicate the optimal dead-time in each switching cycle of any converter operation. It can also be used to specify load current polarity, which is needed for dead-time optimization in an inverter. This is an important distinction from other inverter dead-time elimination/optimization schemes as current around the zero current crossing is hard to accurately detect. A 1kW half-bridge inverter was assembled to test the turn-off time monitoring and dead-time optimization scheme. Results show 91% reduction in reverse conduction power losses in the SiC devices compared to a set dead-time of 500ns switching at 50 kHz.
We present that neutron time correlation analysis is one of the main technical nuclear safeguards techniques used to verify declarations of, or to independently assay, special nuclear materials. Quantitative information is generally extracted from the neutron-event pulse train, collected from moderated assemblies of 3 He proportional counters, in the form of correlated count rates that are derived from event-triggered coincidence gates. These count rates, most commonly referred to as singles, doubles and triples rates etc., when extracted using shift-register autocorrelation logic, are related to the reduced factorial moments of the time correlated clusters of neutrons emerging from the measurement items. Correcting these various rates for dead time losses has received considerable attention recently. The dead time losses for the higher moments in particular, and especially for large mass (high rate and highly multiplying) items, can be significant. Consequently, even in thoughtfully designed systems, accurate dead time treatments are needed if biased mass determinations are to be avoided. In support of this effort, in this paper we discuss a new approach to experimentally estimate the effective system dead time of neutron coincidence counting systems. It involves counting a random neutron source (e.g. AmLi is a good approximation to a source without correlated emission) and relating the second and higher moments of the neutron number distribution recorded in random triggered interrogation coincidence gates to the effective value of dead time parameter. We develop the theoretical basis of the method and apply it to the Oak Ridge Large Volume Active Well Coincidence Counter using sealed AmLi radionuclide neutron sources and standard multiplicity shift register electronics. The method is simple to apply compared to the predominant present approach which involves using a set of 252 Cf sources of wide emission rate, it gives excellent precision in a conveniently short time, and it yields consistent results as a function of the order of the moment used to extract the dead time parameter. In addition, this latter observation is reassuring in that it suggests the assumptions underpinning the theoretical analysis are fit for practical application purposes. However, we found that the effective dead time parameter obtained is not constant, as might be expected for a parameter that in the dead time model is characteristic of the detector system, but rather, varies systematically with gate width.
Over the past few decades, neutron multiplicity counting has played an integral role in Special Nuclear Material (SNM) characterization pertaining to nuclear safeguards. Current neutron multiplicity analysis techniques use singles, doubles, and triples count rates because a methodology to extract and dead time correct higher order count rates (i.e. quads and pents) was not fully developed. This limitation is overcome by the recent extension of a popular dead time correction method developed by Dytlewski. This extended dead time correction algorithm, named Dytlewski-Croft-Favalli (DCF), is detailed in reference Croft and Favalli (2017), which gives an extensive explanation of the theory and implications of this new development. Dead time corrected results can then be used to assay SNM by inverting a set of extended point model equations which as well have only recently been formulated. Here, we discuss and present the experimental evaluation of practical feasibility of the DCF dead time correction algorithm to demonstrate its performance and applicability in nuclear safeguards applications. In order to test the validity and effectiveness of the dead time correction for quads and pents, 252 Cf and SNM sources were measured in high efficiency neutron multiplicity counters at the Los Alamos National Laboratory (LANL) and the count rates were extracted up to the fifth order and corrected for dead time. To assess the DCF dead time correction, the corrected data is compared to traditional dead time correction treatment within INCC. In conclusion, the DCF dead time correction is found to provide adequate dead time treatment for broad range of count rates available in practical applications.
Dead time significantly affects the reliability, power quality, and efficiency of voltage-source converters. For silicon carbide (SiC) devices, considering the high sensitivity of turn-off time to the operating conditions (> 5× difference between light load and full load) and characteristics of inductive loads (> 2× difference between motor load and inductor), as well as large additional energy loss induced by the freewheeling diode conduction during the superfluous dead time (~15% of the switching loss), then the traditional fixed dead time setting becomes inappropriate. This paper introduces an approach to adaptively regulate the dead time considering the current operating condition and load characteristics via synthesizing online monitored turn-off switching parameters in the microcontroller with an embedded preset optimization model. Here, based on a buck converter built with 1200-V SiC MOSFETs, the experimental results show that the proposed method is able to ensure reliability and reduce power loss by 12% at full load and 18.2% at light load (8% of the full load in this case study).
In practice, a dead-time is always provided between the complementary switching instances of the inverter phase-leg devices. At higher operating frequencies, the dead-time issues in wireless power transfer (WPT) systems become critical, especially as the power level increases. In certain operating conditions, the dead-time effect in wireless power transfer system affects the switching characteristics. Consequently, the switching losses in the power semiconductor devices increase and also impact the efficiency of the overall system. In this paper, a simple control scheme is proposed to eliminate the dead-time effect (or voltage polarity reversal) in the WPT inverter. The proposed control scheme monitors the inverter output voltage, and the switching frequency is auto-tuned to eliminate the undesired switching instances in the inverter voltage. The proposed control scheme is validated using the closed-loop simulations in PLECS, and the experimental results on a 5.6 kW WPT prototype are also presented. After eliminating the voltage-polarity-reversal at the inverter output, the inverter losses were reduced by ~40%, and the overall system losses were reduced by ~17%.
Ways in which dead time can be used to constructively enhance or diminish the effects of point processes that display bunching in the shot-noise-driven doubly stochastic Poisson point process (SNDP) are discussed. Interrelations between photocount bunching arising in the SNDP and the antibunching character arising from dead-time effects are investigated. It is demonstrated that the dead-time-modified count mean and variance for an arbitrary doubly stochastic Poisson point process can be obtained from the Laplace transform of the single-fold and joint-moment-generating functions for the driving rate process. The theory is in good agreement with experimental values for radioluminescence radiation in fused silica, quartz, and glass, and the process has many applications in pulse, particle, and photon detection.
In this paper, the effect of dead-time in a single phase wireless power transfer system (WPT) between the complementary switching pulses of the inverter leg is discussed in detail. The dead-time is always provided between the complementary switching pulses in the inverter leg to avoid the short-circuit of the input dc source. In WPT systems, high-frequency (HF) operation is desired to reduce the size of the passive components. As the frequency of operation increases, the dead-time effect becomes significant and must be addressed appropriately. This paper presents the analysis of the dead-time effect in the wireless power transfer system for an electric vehicle (EV) battery charging application. The operating waveforms for the given operating condition of the phase-shift angle and the power-factor are presented and the phenomenon of voltage polarity reversal (VPR) or notch is discussed. The effect of the notch on the fundamental component of the voltage is presented and the effect of the notch on the BMW i3 battery charging profile is evaluated. The theoretical analysis of the dead-time is verified using simulation results in PLECS.
Avalanche photodiodes (APDs) operating in the Geiger mode can provide a significantly improved single-photon detection sensitivity over conventional photodiodes. However, the quenching circuit required to remove the excess charge carriers after each photon event can introduce an undesirable dead time into the detection process. The effect of this detector dead time on the performance of a binary pulse-position-modulated (PPM) channel is studied by analyzing the error probability. It is shown that, when background noise is negligible, the performance of the detector with dead time is similar to that of a quantum-limited receiver. For systems with increasing background intensities, the error rate of the receiver starts to degrade rapidly with increasing dead time. The power penalty due to detector dead time is also evaluated and shown to depend critically on badkground intensity as well as dead time. Given the expected background strength in an optical channel, therefore, a constraint must be placed on the bandwidth of the receiver to limit the amount of power penalty due to detector dead time.
Avalanche photodiodes (APDs) operating in the Geiger mode can provide a significantly improved single-photon detect ion sensitivity over conventional photodiodes. However, the quenching circuit required to remove the excess charge carriers after each photon event can introduce an undesirable dead time into the detection process. The effect of this detector dead time on the performance of a binary pulse-position-modulted (PPM) channel is studied by analyzing the error probability. It is shown that, when back- ground noise is negligible, the performance of the detector with dead time is similar to that o f a quantum-limited receiver. For systems with increasing background intensities, the error rate of the receiver starts to degrade rapidly with increasing dead time. The power penalty due to detector dead time is also evaluated and shown to depend critically on background intensity as well as dead time. Given the expected background strength in an optical channel, therefore, a constraint must be placed on the bandwidth of the receiver to limit the amount of power penalty due to detector dead time.
In this paper, the effect of the dead-time on a single-phase wireless power transfer system is studied in detail. In practice, the dead-time is always placed between the complementary switching pulses of the inverter phase-leg. At higher operating frequencies, the dead-time issues in the resonant inverter become critical, especially as the power level increases. The detailed analysis of the dead-time on a wireless power transfer system is discussed for different operating conditions of the inverter duty-cycle and power factor. The switching characteristics of the wireless power transfer system inverter are analyzed, and the notch phenomenon that appears at the output of the inverter is also discussed. A notch equation based on the observations is derived to predict the notch occurrence during the system operation. Furthermore, the mathematical expressions are presented for different notch conditions. Subsequently, the effect of the notches on the sensitivity and the power transfer of the series-series compensated wireless power transfer system is analyzed. Finally, the approach is verified experimentally on an 8 kW wireless power transfer system prototype, and the results are compared with the theoretical analysis.
Coding schemes have been designed and investigated specifically for optical and electronic data-communication channels in which information is conveyed via pulse-position modulation (PPM) subject to dead-time constraints. These schemes involve the use of error-correcting codes concatenated with codes denoted constrained codes. These codes are decoded using an interactive method. In pulse-position modulation, time is partitioned into frames of Mslots of equal duration. Each frame contains one pulsed slot (all others are non-pulsed). For a given channel, the dead-time constraints are defined as a maximum and a minimum on the allowable time between pulses. For example, if a Q-switched laser is used to transmit the pulses, then the minimum allowable dead time is the time needed to recharge the laser for the next pulse. In the case of bits recorded on a magnetic medium, the minimum allowable time between pulses depends on the recording/playback speed and the minimum distance between pulses needed to prevent interference between adjacent bits during readout. The maximum allowable dead time for a given channel is the maximum time for which it is possible to satisfy the requirement to synchronize slots. In mathematical shorthand, the dead-time constraints for a given channel are represented by the pair of integers (d,k), where d is the minimum allowable number of zeroes between ones and k is the maximum allowable number of zeroes between ones. A system of the type to which the present schemes apply is represented by a binary- input, real-valued-output channel model illustrated in the figure. At the transmitting end, information bits are first encoded by use of an error-correcting code, then further encoded by use of a constrained code. Several constrained codes for channels subject to constraints of (d,infinity) have been investigated theoretically and computationally. The baseline codes chosen for purposes of comparison were simple PPM codes characterized by M-slot PPM frames separated by d-slot dead times.
In this paper, a comparative study of the dead-time effects in a wireless power transfer (WPT) system inverter is performed for different fixed-frequency control techniques. The dead-time is provided between the complementary switching instances of the inverter phase-legs to ensure safe operation of the input power source. Under certain operating conditions, the dead-time results in waveform distortions or voltage-polarity reversal (VPR) at the inverter output. The VPR affects the switching characteristics, harmonic spectrum, switching losses, and output voltage/power of the system. A detailed analysis of the dead-time effect on the WPT system parameters such as output voltage and output power is conducted for the different fixed-frequency control strategies (i.e., traditional phase-shift control, asymmetrical clamped-mode, and asymmetrical duty-cycle control). Furthermore, the impact of dead-time on the inverter switching losses is compared for the different control strategies.
Automatic correction for dead time losses in nuclear counting experiments is implemented by a simple live timer arrangement in which each counting interval is extended for compensation for the dead time during that interval. this method eliminates repetitious manual calculations, source of error, and dependence upon paralysis shifts.
Abstract The number of neutrons emitted from a nuclear reaction plays a crucial role in various fields, including nuclear theory, nuclear nonproliferation, nuclear energy and nuclear criticality safety. Accurate determination of neutron multiplicities requires the application of several corrections, with dead-time correction and background subtraction being particularly significant. These corrections become more challenging for neutron detectors with time-dependent neutron capture. In this work, we perform a comprehensive study of three existing methods used for dead-time correction and background subtraction in neutron detectors with time-dependent neutron capture. The methods were tested for dead-times in the range from 0 to 1 μs using a Monte Carlo model simulating the dead-time and background effects in the standard neutron multiplicity probability distribution of $$^{252}$$ 252 Cf. The previous methods showed larger than desired uncertainty or systematic trade off. Those uncertainties prompted the development of a novel approach using neural networks trained with data from Monte Carlo simulations. The Neural Network method enabled the correction of neutron multiplicity probabilities more accurately than the other methods with fractional errors smaller than 3% for multiplicities around the peak of $$^{252}$$ 252 Cf. A similar approach using neural networks could be applied to problems where the system being studied can be accurately simulated without having an accurate analytical description available. The neural network method presented in this paper can be easily expanded if multiplicities greater than 10 are expected.
This paper introduces a novel procedure to correct pulsed neutron source experimental data for dead-time effects. The procedure is based on the application of the backward extrapolation method to the reaction rate value in each time interval (bin) of the neutron counts distribution as a function of time. The theoretical framework has been successfully applied to the experimental data (timestamps) from the YALINA Thermal facility driven by a pulsed D-D neutron source. Dead-time effects may have more than 500 pcm (1 pcm=1 E-5) impact on the effective multiplication factor calculated by the area method. (authors)
Here, neutron multiplicity counting using shift-register calculus is an established technique in the science of international nuclear safeguards for the identification, verification, and assay of special nuclear materials. Typically passive counting is used for Pu and mixed Pu-U items and active methods are used for U materials. Three measured counting rates, singles, doubles and triples are measured and, in combination with a simple analytical point-model, are used to calculate characteristics of the measurement item in terms of known detector and nuclear parameters. However, the measurement problem usually involves more than three quantities of interest, but even in cases where the next higher order count rate, quads, is statistically viable, it is not quantitatively applied because corrections for dead time losses are currently not available in the predominant analysis paradigm. In this work we overcome this limitation by extending the commonly used dead time correction method, developed by Dytlewski, to quads. We also give results for pents, which may be of interest for certain special investigations. Extension to still higher orders, may be accomplished by inspection based on the sequence presented. We discuss the foundations of the Dytlewski method, give limiting cases, and highlight the opportunities and implications that these new results expose. In particular there exist a number of ways in which the new results may be combined with other approaches to extract the correlated rates, and this leads to various practical implementations.
The observed counting rates of microchannel plate (MCP) based detectors for high resolution observations of celestial EUV and X-ray sources vary over many orders of magnitude; the counting capability of an individual channel, however, is not high, and is associated with dead-times ranging from 0.1 msec to 1 sec. The dead-time increases with the area illuminated; attention is presently given to laboratory determinations of the count rate characteristics of a MCP detector as a function of illuminated area, and a model is developed for these results' use in the interpretation of space observations.