Non-contact based measurement of thin film coatings using eddy current measurements
When a time varying magnetic field attempts to penetrate a conductive surface, the surface will respond to that time varying field by the generation of circular currents around the flux lines. This effect is described by Faraday’s law of induction. An eddy current based measurement system attempts to discern the power loss incurred by these circulating currents within the conductive surface. The measurement system described here uses an Agilent E 4980A LCR meter to quantify the reaction of the film to the high frequency magnetic field lines which are forced into the film. The measurement metric is the meter’s interpretation of the power dissipation caused by the measured film. The meter is setup to use the Ls/Rs inductor model, and is run at 1 Mhz to bring the losses within the film as high as possible for sensitivity.