A robust protonic ceramic fuel cell with a triple conducting oxygen electrode under accelerated stress tests
Accelerated stress test of protonic ceramic fuel cells for evaluating the durability of materials and interfaces.
Zheng, Shuanglin↗
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Results for “Accelerated Stress Test”
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Photovoltaic cable jackets A comparison of representative products using combined-accelerated stress testing
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Miller, David C. (ORCID:0000000246985277)↗
Extended Accelerated Stress Testing (EAST) of Glass/Glass, Glass/Backsheet and Glass/Transparent Backsheet PV Modules: Influence of EVA and POE Encapsulants: Preprint
This paper presents the indoor extended accelerated stress testing (EAST) results of glass/glass (GG), glass/backsheet (GB) and glass/transparent backsheet (GT) modules having identical cells and two different encapsulant types, ethyl-vinyl-acetate (EVA) and polyolefin-elastomer (POE). Six 4-cell modules having the above-mentioned construction combinations were subjected to extended ultraviolet (UV; 600 kWh/m2), damp-heat (DH; 2000 hours) and thermal-cycling (TC; 600 cycles) tests. The post-stress UV fluorescent imaging, electroluminescent imaging, reflectance spectrophotometry and colorimetry results indicated that the grid finger degradation and encapsulant browning are slightly higher in the GG modules compared to the GB modules. The post-stress IV test results indicated, in general, that the GG/EVA modules tend to perform inferior to the GG/POE modules with the EAST evaluation.
EVA↗
Combined-Accelerated Stress Testing of Photovoltaic Materials
By applying multiple environmental stresses in fieldrepresentative combinations and sequences, combined-accelerated stress testing (CAST) identifies degradation modes and failure mechanisms of photovoltaic (PV) modules and components that are missed by single stress factor accelerated testing.
14 SOLAR ENERGY↗
Acceleration Factors for Combined‐Accelerated Stress Testing of Photovoltaic Modules
Combined‐accelerated stress testing (C‐AST) is developed to establish the durability of photovoltaic (PV) products, including for degradation modes that are not a priori known or examined in standardized tests. C‐AST aims to comprehensively represent the sample, stress factors, and their combinations using levels at the statistical tails of the natural environment. Acceleration factors for relevant climate sequences within the C‐AST cycle with respect to the Florida USA climate are estimated for selected degradation mechanisms. It is found that for degradation of the outer backsheet polymer layer, the acceleration factor of the tropical climate sequence (the longest of the climate sequences) is f ( T , G ) = 17.3 with ultraviolet photodegradation; for polyethylene terephthalate hydrolysis (backsheets), f ( T , RH ) = 426; for electrochemical corrosion (PV cell), f ( I ) = 14.1; and for PbSn solder fatigue f (Δ T , r ( T )) = 17.3. Here, T is the module temperature, G is the broadband spectrum irradiance on the plane of array of the module, RH is the relative humidity on the module surface, I is the leakage current through the module packaging, and r ( T ), the number of temperature reversals. The methods discussed herein are generally applicable for evaluating acceleration factors in other accelerated test methods.
14 SOLAR ENERGY↗
Advancing reliability assessments of photovoltaic modules and materials using combined-accelerated stress testing
Previously undiscovered failure modes in photovoltaic (PV) modules continue to emerge in field installations despite passing protocols for design qualification and quality assurance. Failure to detect these modes prior to widespread use could be attributed to the limitations of present-day standard accelerated stress tests (ASTs), which are primarily designed to identify known degradation or failure modes at the time of development by applying simultaneous or sequential stress factors (usually two at most). Here, we introduce an accelerated testing method known as the combined-accelerated stress test (C-AST), which simultaneously combines multiple stress factors of the natural environment. Simultaneous combination of multiple stress factors allows for improved identification of failure modes with better ability to detect modes not known a priori. A demonstration experiment was conducted that reproduced the field-observed cracking of polyamide- (PA-) and polyvinylidene fluoride (PVDF)–based backsheet films, a failure mode that was not detected by current design qualification and quality assurance testing requirements. In this work, a two-phase testing protocol was implemented. The first cycle (“Tropical”) is a predominantly high-humidity and high-temperature test designed to replicate harsh tropical climates. The second cycle (“Multi-season”) was designed to replicate drier and more temperate conditions found in continental or desert climates. Testing was conducted on 2 × 2-cell crystalline-silicon cell miniature modules constructed with both ultraviolet (UV)–transmitting and UV-blocking encapsulants. Cracking failures were observed within a cumulative 120 days of the Tropical condition for one of the PA-based backsheets and after 84 days of Tropical cycle followed by 42 days of the Multi-season cycle for the PVDF-based backsheet, which are both consistent with failures seen in fielded modules. In addition to backsheet cracking, degradation modes were observed including solder/interconnect fatigue, various light-induced degradation modes, backsheet delamination, discoloration, corrosion, and cell cracking. The ability to simultaneously apply multiple stress factors may allow many of the test sequences within the standardized design qualification procedure to be performed using a single test setup.
14 SOLAR ENERGY↗
Accelerated Stress Testing of Perovskite Photovoltaic Modules: Differentiating Degradation Modes with Electroluminescence Imaging
Herein, electroluminescence (EL) and thermal imaging are used to examine p–i–n metal halide perovskite (MHP) photovoltaic (PV) mini-modules (MA0.6FA0.4PbI3, 20 cells, 78 cm2) before and after indoor-accelerated stress testing or outdoor deployment. Distinct spatial patterns in the EL images emerge, which depend on the external stress conditions experienced by the mini-module. Imaging results highlight a distribution of dark speckle features that dominate after UV stress, attributed to widespread interfacial contact degradation. Lateral intensity gradients across cells dominate after thermal cycling (TC) stress, attributed to current crowding near scribe defects. While current–voltage analysis alone does not give full insight on the degradation process, this study shows that distinct degradation modes can be further defined by multimodal electro-optical imaging (i.e., EL combined with photoluminescence and dark lock-in thermography). Neither UV exposure nor TC-accelerated stress testing alone replicates the same degradation signatures observed after outdoor deployment, suggesting that multiple degradation modes occur under concurrent stressors outdoors. Finally, spatial characterization of degradation modes in MHP PV mini-modules before and after accelerated stress testing lays the groundwork for developing targeted accelerated stress testing procedures through comparison with outdoor aging.
14 SOLAR ENERGY↗
Failure Analysis of a New Polyamide-Based Fluoropolymer-Free Backsheet After Combined-Accelerated Stress Testing
The viability of novel coextruded, fluoropolymer-free backsheets for photovoltaic (PV) modules has been questioned as a result of a large number of early-life backsheet failures in PV installations containing one of the earliest co-extruded polyamide (PA)-based backsheet to reach the market, “AAA.” New PV reliability testing protocols have been recently developed and applied to backsheets to reproduce failures observed in the field and evaluate the durability of novel backsheet materials and designs prior to commercialization. A new co-extruded PA-based backsheet was tested using combined-accelerated stress testing (C-AST) and demonstrated a greater lifetime than AAA, and some other fluoropolymer-based backsheets such as polyvinylidene fluoride. The improved PA-based backsheet also eventually failed by through-thickness cracking. Using surface and bulk material characterization techniques, we performed a comprehensive study of material properties before and after the stress testing. Aging of the backsheet resulted in an increase of surface roughness by erosion of the outer PA layer. However the failure is more likely related to an increase in crystallinity of the polyolefin core layer reducing the backsheet tearing energy. The analysis can ultimately inform on the specific weaknesses of the materials so that the manufacturer can improve the backsheet design to extend its lifetime.
14 SOLAR ENERGY↗
Towards Validation of Advanced Accelerated Stress Testing Protocols through Failure Analysis and Materials Characterization
As the lifetime of photovoltaic modules increases toward the goal of 50 years, accelerated stress testing is critical to assessing the viability of newer, improved, and often cheaper materials in the field. However, the validation of accelerated testing to reproduce field failure has remained elusive. The recent developments of more advanced stress testing protocols utilizing sequential and combined stressors have provided another opportunity for validation. Using a suite of mechanical, chemical, and structural characterization methods we report the development of our approach using a known bad backsheet “AAA.” We then apply this approach to PVDF-based backsheets to further confirm the generalizability of this approach. The outcome of this work is two-fold: (1) validation of advanced accelerated testing protocols which will enable the prediction of field failures in new materials, and (2) deeper insights into the degradation mechanisms observed through the extensive characterization allowing for improved materials engineering and development.
accelerated aging↗
Assessment of Accelerated Stress Testing Data for Silicon Photovoltaics Using Tensor Decomposition Methods
In this work, we examine the use of high-order tensor decompositions to analyze degradation pathways emerging from accelerated stress testing of silicon photovoltaic (PV) modules. Matrix-based decompositions are powerful tools for studying two-dimensional data arrays and form the foundation of a host of classical data analysis techniques. Tensors are high-order extrapolations of matrices that are able to account for more parameter dimensions, and a variety of tensor decomposition methods have been developed that similarly seek to extend insights from matrix decompositions to higher dimensions. Applying and interpreting tensor decomposition methods to sequences of PV module image data, we seek to uncover and isolate different degradation modes occurring from accelerated stress testing procedures. Further, we consider the contributions of different modes to PV module performance degradations.
data analysis↗
Towards validation of combined-accelerated stress testing through failure analysis of polyamide-based photovoltaic backsheets
Abstract Novel methods for advancing reliability testing of photovoltaic (PV) modules and materials have recently been developed. Combined-accelerated stress testing (C-AST) is one such method which has demonstrated reliable reproduction of some field-failures which were not reproducible by standard certification tests. To increase confidence and assist in the development of C-AST, and other new testing protocols, it is important to validate that the failure modes observed and mechanisms induced are representative of those observed in the field, and not the product of unrealistic stress conditions. Here we outline a method using appropriate materials characterization and modelling to validate the failure mechanisms induced in C-AST such that we can increase confidence in the test protocol. The method is demonstrated by applying it to a known cracking failure of a specific polyamide (PA)-based backsheet material. We found that the failure of the PA-based backsheet was a result of a combination of stress factors. Photo-oxidation from ultra-violet (UV) radiation exposure caused a reduction in fracture toughness, which ultimately lead to the cracking failure. We show that the chemical and structural changes observed in the backsheet following C-AST aging were also observed in field-aged samples. These results increase confidence that the conditions applied in C-AST are representative of the field and demonstrates our approach to validating the failure mechanisms induced.
14 SOLAR ENERGY↗
Electrochemical characterization of evolving ionomer/electrocatalyst interactions throughout accelerated stress tests
Here, the degradation of polymer electrolyte membrane fuel cells (PEMFCs) catalyst layers used for heavy-duty vehicles was examined using a catalyst-specific accelerated stress test (AST). High surface area carbon supported dispersed Pt (Pt/HSC), annealed Pt (a-Pt/HSC) and PtCo (PtCo/HSC) alloy catalysts were examined over the course of 90,000 cycles by measuring changes in mass activity, O 2 transport resistance, electrochemical active surface area (ECSA), catalyst accessibility and ionomer-electrocatalyst interactions. Compared to a-Pt/HSC and Pt/HSC catalyst, the PtCo/HSC showed better initial mass activity, a larger initial mass transport loss, and faster degradation after the first 30k AST cycles, as a large portion of Co leached out during potential cycling. Pt/HSC showed higher initial performance relative to a-Pt/HSC but had faster degradation. STEM characterizations show that the ECSA losses are largely related to Pt dissolution resulting in either catalyst particle growth via the Ostwald ripening mechanism or redeposition in the membrane. Catalyst accessibility measurements showed decreased RH sensitivity for all three samples, while CO impedance measurements revealed a decrease in both Pt-water and carbon-water interactions. This implies that, Pt is either preferentially redepositing on the exterior of the carbon support, or that the ionomer is undergoing morphological changes enabling the enhanced intrusion of mesopores.
25 ENERGY STORAGE↗
Assessment of Accelerated Stress Testing Data for Silicon Photovoltaics Using Tensor Decomposition Methods
The photovoltaic (PV) industry is simultaneously targeting long warranties and new materials/designs for high-energy-yield modules, requiring an advanced methodology to forecast long-term durability of products with un-proven materials combinations. Extended, sequential, and combined stress testing methods are gaining popularity for assessing durability of PV modules/materials beyond the early-stage mortalities. Importantly, multiple degradation mechanisms can proceed simultaneously, and their separate contributions to the overall power loss should ideally be quantified. This work examines the use of data-driven tools towards developing a strategy for faster learning cycles in accelerated stress testing.
accelerated stress testing↗
Examining Light-Induced Degradation with Combined-Accelerated Stress Testing
While further understanding is sought, the results suggest that a module can show no degradation in performance through a qualification test light soak, (IEC 61215: 2021 MQT 19.1 requirement of 10 kW minimum on one side). Yet, such cells may degrade significantly by LID under conditions within the statistical extremes of the natural environment applied in combined-accelerated stress testing (CAST).
combined-accelerated stress testing↗
Evaluation of bifacial module technologies with combined–accelerated stress testing
In view of the increasing interest and market share of bifacial cells and modules, suitable substrates such as glass and transparent backsheets along with ethylene vinyl acetate (EVA) and polyolefin elastomer (POE) encapsulants were examined in combined-accelerated stress testing (C-AST) to evaluate and compare degradation modes. Testing with both monofacial and bifacial cells, we found glass-glass modules with monofacial cells led to greater grid finger breakage than those with polymeric backsheets. Furthermore, this is attributed to previous X-ray topography and modeling work showing higher stress in cells and interconnections in glass-glass modules than glass-backsheet modules. Consistent with the objectives of C-AST, which stresses modules at levels corresponding to the limits seen in the natural environment, we observed the UV-fluorescence signatures of modules tested in C-AST (considering the degradation associated with developing chromophores, moisture penetration and photobleaching effects) to be like those in fielded modules, more so than other chamber stress testing implemented for comparison. We found light-induced degradation (LID) in module types with regenerated (inactive) cells with C-AST, suggesting the possibility of LID destabilization in some field conditions. We could also distinguish potential-induced degradation (PID) on the back of the bifacial passivated emitter and rear cells (PERC) in C-AST. Confirming with ex-situ tests, we found polarization-type PID most prevalent in glass-glass modules with EVA as would be anticipated considering the greater leakage current through such module encapsulation. Unlike PID tests performed in the dark, which can lead to false positive PID test results, field-representative illumination is experienced by the modules on the front and back side while –1200 V system voltage is applied in C-AST, supporting the conclusion that this module type with glass-glass construction would be susceptible to PID in the field.
14 SOLAR ENERGY↗
Computational Modeling of Photovoltaic Mini-Modules Undergoing Accelerated Stress Testing
A finite element model of a four-cell photovoltaic mini-module was developed and compared to experimental results from an accelerated stress test protocol in order to validate that computational models can accurately represent their physical counterparts when subjected to mechanical loading and to assess mini-module representativeness against full scale photovoltaic modules. Deflected shapes across the simulated mini-modules were compared to measured mini-module shapes when subjected to various pressure loads. Displaced mini-module shape results constrained to the experimental protocols of 0.4 mm and 1.1 mm of displacement at the mini-module center were compared to experimental results of full-size modules subjected to module qualification test load levels of 1.0 kPa and 2.4 kPa, to assess if the bending of mini-modules was representative of full-sized modules under the load. Temperature cycling was incorporated into the model to simulate the impacts of stress due to thermal expansion of the backsheet and cells. A preliminary uncertainty analysis was performed to show how variations in material properties and geometric parameters change the simulation results.
computational modeling↗
Field Accelerated Stress Testing (FAST): Forecasting Plant-specific Failure Modes and Degradation Rates
Photovoltaic plant owners and insurance companies would like to be prepared for the forthcoming material warranty claims (material defects) and power warranty claims (degradation rate). To address the needs of these stakeholders, this presentation aims to introduce a new conceptual approach to perform accelerated testing right at the field of interest and it is called field accelerated stress testing (FAST). The primary goal of this presentation is to present a conceptual approach to forecast the field specific failure modes and degradation rates in advance by a factor of 2 to 5, right at the plant site using a few spare modules available at the plant location itself.
14 SOLAR ENERGY↗
Evaluation of Bifacial Modules and PV Technologies with Combined-Accelerated Stress Testing
In view of the increasing interest and market share of bifacial cells and modules, suitable substrates such as glass and transparent backsheets along with ethylene vinyl acetate (EVA) and polyolefin elastomer (POE) encapsulants were examined in combined-accelerated stress testing (C-AST) to evaluate and compare degradation modes. Testing with both monofacial and bifacial cells, we found glass-glass modules with monofacial cells led to greater grid finger breakage than those with polymeric backsheets. This is attributed to previous x-ray topography work showing higher stress in cells in glass-glass modules than glass backsheet modules. Consistent with the objectives of C-AST, which stresses modules at levels corresponding to the limits seen in the natural environment, we observed the UV-fluorescence signatures of modules tested in C-AST (considering the degradation associated with developing chromophores, moisture penetration and photobleaching effects) to be like those in fielded modules, more so than other chamber stress testing implemented for comparison. Finally, among multiple cell degradation modes that we observed such as light-induced degradation (LID), we differentiated susceptibility to potential-induced degradation (PID) on the back of the bifacial Passivated Emitter Back Cells (PERC) in C-AST. Confirming with ex-situ tests, we found polarization-type PID most prevalent in glass/glass modules with EVA as would be anticipated considering the greater leakage current through such module encapsulation. Unlike PID tests performed in the dark, which can lead to false positive PID test results, field-representative illumination is experienced by the modules on the front and back side while -1200 V system voltage is applied in C-AST, supporting the conclusion that this module type would be susceptible to PID in the field.
bifacial modules↗