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Results for “Accelerated Life Testing”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 19 records
All sourcesNASA NTRSDOE OSTI
DOE OSTI2018

RESULTS OF ACCELERATED LIFE TESTING OF LCLS-II CAVITY TUNER MOTOR

An Accelerated Life Test (ALT) of the Phytron stepper motor used in the LCLS-II cavity tuner has been conducted at JLab. Since the motor will reside inside the cryomodule, any failure would lead to a very costly and arduous repair. As such, the motor was tested for the equivalent of 30 lifetimes before being approved for use in the production cryomodules. The 9-cell LCLS-II cavity is simulated by disc springs with an equivalent spring constant. Plots of the motor position vs. tuner position ' measured via an installed linear variable differential transformer (LVDT) ' are used to measure motor motion. The titanium spindle was inspected for loss of lubrication. The motor passed the ALT, and is set to be installed in the LCLS-II cryomodules.

Huque, Naeem↗
NASA NTRS1977

Accelerated life testing effects on CMOS microcircuit characteristics

Accelerated life tests were performed on CMOS microcircuits to predict their long term reliability. The consistency of the CMOS microcircuit activation energy between the range of 125 C to 200 C and the range 200 C to 250 C was determined. Results indicate CMOS complexity and the amount of moisture detected inside the devices after testing influences time to failure of tested CMOS devices.

Source record↗
NASA NTRS1972

Accelerated life testing of spacecraft subsystems

The rationale and requirements for conducting accelerated life tests on electronic subsystems of spacecraft are presented. A method for applying data on the reliability and temperature sensitivity of the parts contained in a sybsystem to the selection of accelerated life test parameters is described. Additional considerations affecting the formulation of test requirements are identified, and practical limitations of accelerated aging are described.

Wiksten, D.↗
DOE OSTI2012

Bayesian Analysis of Step-Stress Accelerated Life Test with Exponential Distribution

In this article, we propose a general Bayesian inference approach to the step-stress accelerated life test with type II censoring. We assume that the failure times at each stress level are exponentially distributed and the test units are tested in an increasing order of stress levels. We formulate the prior distribution of the parameters of life-stress function and integrate the engineering knowledge of product failure rate and acceleration factor into the prior. The posterior distribution and the point estimates for the parameters of interest are provided. Through the Markov chain Monte Carlo technique, we demonstrate a nonconjugate prior case using an industrial example. It is shown that with the Bayesian approach, the statistical precision of parameter estimation is improved and, consequently, the required number of failures could be reduced.

14 SOLAR ENERGY↗
NASA NTRS1976

Accelerated life testing effects on CMOS microcircuit characteristics, phase 1

An accelerated life test of sufficient duration to generate a minimum of 50% cumulative failures in lots of CMOS devices was conducted to provide a basis for determining the consistency of activation energy at 250 C. An investigation was made to determine whether any thresholds were exceeded during the high temperature testing, which could trigger failure mechanisms unique to that temperature. The usefulness of the 250 C temperature test as a predictor of long term reliability was evaluated.

Maximow, B.↗
DOE OSTI2015

Accelerated Life Testing of LCLS-II Cavity Tuner Motor

An Accelerated Life Test (ALT) of the Phytron stepper motor used in the LCLS-II cavity tuner is being carried out at JLab. Since the motor will reside inside the cryomodule, any failure would lead to a very costly and arduous repair. As such, the motor will be tested for the equivalent of five lifetimes before being approved for use in the production cryomodules. The 9-cell LCLS-II cavity will be simulated by disc springs with an equivalent spring constant. Hysteresis plots of the motor position vs. tuner position – measured via an installed linear variable differential transformer (LVDT) – will be used to determine any drift from the required performance. The titanium spindle will also be inspected for loss of lubrication. This paper outlines the ALT plan and latest results.

Huque, Naeem A.↗
NASA NTRS1980

Accelerated life testing effects on CMOS microcircuit characteristics

This report covers the time period from May 1976 to December 1979 and encompasses the three phases of accelerated testing: Phase 1, the 250 C testing; Phase 2, the 200 C testing; and Phase 3, the 125 C testing. The duration of the test in Phase 1 and Phase 2 was sufficient to take the devices into the wear out region. The wear out distributions were used to estimate the activation energy between the 250 C and the 200 C test temperatures. The duration of the 125 C test, 20,000 hours, was not sufficient to bring the test devices into the wear out region; consequently the third data point at 125 C for determining the consistency of activation energy could not be obtained. It was estimated that, for the most complex of the three device types, the activation energy between 200 C and 125 C should be at least as high as that between 250 C and 200 C. The practicality of the use of high temperature for the accelerated life tests from the point of view of durability of equipment was assessed. Guidelines for the development of accelerated life test conditions were proposed. The use of the silicon nitride overcoat to improve the high temperature accelerated life test characteristics of CMOS microcircuits was explored in Phase 4 of this study and is attached as an appendix to this report.

Source record↗
DOE OSTI2014

Apparatus and method for highly accelerated life testing of solar cells

An apparatus is provided for highly accelerated life testing (HALT) of multi-junction solar cells according to a method that utilizes a high vacuum chamber, as well as lenses and windows transparent to broad spectrum solar radiation from typically a single source to house packaged solar chips and temperature monitoring and control means during testing, thereby allowing substantially greater control of environmental variables such as temperature, atmospheric composition, and light spectrum than is currently available.

Lamarche, Paul F.↗
NASA NTRS1980

Accelerated life testing effects on CMOS microcircuit characteristics

The 250 C, 200C and 125C accelerated tests are described. The wear-out distributions from the 250 and 200 C tests were used to estimate the activation energy between the two test temperatures. The duration of the 125 C test was not sufficient to bring the test devices into the wear-out region. It was estimated that, for the most complex of the three devices types, the activation energy between 200 C and 125 C should be at least as high as that between 250 C and 200 C. The practicality of the use of high temperature for the accelerated life tests from the point of view of durability of equipment is assessed. Guidlines for the development of accelerated life-test conditions are proposed. The use of the silicon nitride overcoat to improve the high temperature accelerated life-test characteristics of CMOS microcircuits is described.

Source record↗
NASA NTRS1980

NWSC nickel cadmium spacecraft cell accelerated life test program data analysis

An analysis of the data leading to a proposed accelerated life test scheme to test a nickel cadmium cell under spacecraft usage conditions is described. The amount and concentration of electrolyte and the amount of precharge in the cell are discussed in relation to the design of the cell and the accelerated test design. A failure analysis of the cell is summarized. The analysis included such environmental test variables as the depth of discharge, the temperature, the amount of recharge and the charge and discharge rate.

Lander, J.↗
DOE OSTI2017

High Pressure Hydrogen Pressure Relief Devices: Accelerated Life Testing and Application Best Practices

Pressure relief devices (PRDs ) are used to protect high pressure systems from burst failure caused by overpressurization. Codes and standards require the use of PRDs for the safe design of many pressurized systems. These systems require high reliability due to the risks associated with a burst failure. Hydrogen service can increase the risk of PRD failure due to material property degradation caused by hydrogen attack. The National Renewable Energy Laboratory (NREL) has conducted an accelerated life test on a conventional spring loaded PRD. Based on previous failures in the field, the nozzles specific to these PRDs are of particular interest. A nozzle in a PRD is a small part that directs the flow of fluid toward the sealing surface to maintain the open state of the valve once the spring force is overcome. The nozzle in this specific PRD is subjected to the full tensile force of the fluid pressure. These nozzles are made from 440C material, which is a type of hardened steel that is commonly chosen for high pressure applications because of its high strength properties. In a hydrogen environment, however, 440C is considered a worst case material since hydrogen attack results in a loss of almost all ductility and thus 440C is prone to fatigue and material failure. Accordingly, 440C is not recommended for hydrogen service. Conducting an accelerated life test on a PRD with 440C material provides information on necessary and sufficient conditions required to produce crack initiation and failure. The accelerated life test also provides information on other PRD failure modes that are somewhat statistically random in nature.

33 ADVANCED PROPULSION SYSTEMS↗
NASA NTRS2017

Applications of Fracture Mechanics to Quantitative Accelerated Life Testing of Plastic Encapsulated Microelectronics

Accelerated testing must address the failure mechanisms active within the devices undergoing tests in order to assess lifetimes in a meaningful way. The assumption of constant temperature, thermally activated lifetime, based upon the Arrhenius assumptions, does not always provide the necessary understanding to interpret accelerated tests in microelectronics. Plastic encapsulants, dielectric polymers, and underfill materials are subject to delamination and cracking with thermal cycling. Crack propagation during use environment exposure, drives the potential for failure of microelectronic devices and is therefore a necessary focal point in qualification and life testing. This paper reviews the available research in the application of fracture mechanics to this class of problems in microelectronics including relevant test data. In addition, useful acceleration factor models are derived for polymer crack propagation based on principles of linear elastic fracture mechanics. Further, a simple approach to estimating the minimum temperature cycling ranges, necessary to propagate a crack, is also presented. Finally, a methodology of applying acceleration factors to develop testing plans is shown, with an example in spaceflight for a cubesat in low Earth orbit. Overall, this is a paper that shows a useful and appropriate process for creating physics of failure based life testing for delamination and cracking failures in microelectronic polymers in a temperature cycling environment.

Accelerated testing↗
NASA NTRS1981

Accelerated life testing and reliability of high K multilayer ceramic capacitors

The reliability of one lot of high K multilayer ceramic capacitors was evaluated using accelerated life testing. The degradation in insulation resistance was characterized as a function of voltage and temperature. The times to failure at a voltage-temperature stress conformed to a lognormal distribution with a standard deviation approximately 0.5.

Minford, W. J.↗