Concerning Apparent Similarity of Structures of Fluoropolymer Surfaces Exposed to an Argon Plasma or Argon Ion Beam
X-ray photoelectron spectroscopy (XPS) C(sub 1s) spectra of fluoropolymers exposed to either an argon plasma or argon ion beam show remarkable similarity, implying that the surface-modification reactions for these two processes likely proceed through comparable mechanisms, revolving predominantly ion-surface interactions. The importance of working with a monochromatized x-ray source for XPS analysis of the surface-modified fluoropolymers is once again emphasized.