Measurement of the magnetic penetration depth of a superconducting MgB2 thin film with a largeintraband diffusivity
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75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗
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Results for “DEPTH”
Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.
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Magnetic penetration-depth measurements of a suppressed superfluid density of superconductingCa0.5Na0.5Fe2As2 single crystals by proton irradiation
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75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗
Digital holography algorithms to estimate the morphology and depth of non-spherical absorbing particles.
Abstract Not Provided
Guildenbecher, Daniel Robert↗
Novel Approach for Depth-of-Interaction Encoding in PET
Explore the source record for details and available documents.
Shah, Kanai↗
Uncertainty characterization of particle depth measurement using digital in-line holography and the hybrid method.
Abstract not provided.
Reu, Phillip L.↗
Digital holography reconstruction algorithms to estimate the morphology and depth of non-spherical absorbing particles.
Abstract not provided.
Guildenbecher, Daniel Robert↗
Snow hydrology with cosmic-ray neutrons: reviving a little known but highly successful method for measuring snow water equivalent depth.
Abstract not provided.
Desilets, Darin Maurice↗
Experimental methods to quantify particle positional and displacement uncertainty along the depth direction in digital in-line holography.
Abstract not provided.
Guildenbecher, Daniel Robert↗
Experimental methods to quantify particle positional and displacement uncertainty along the depth direction in digital in-line holography.
Abstract not provided.
Guildenbecher, Daniel Robert↗
Automatic Registration of LiDAR and Optical Imagery using Depth Map Stereo
Abstract not provided
97 MATHEMATICS AND COMPUTING↗
Auto-calibrated scanning-angle prism-type total internal reflection microscopy for nanometer-precision axial position determination and optional variable-illumination-depth pseudo total internal reflection microscopy
A method, apparatus, and system for improved VA-TIRFM microscopy. The method comprises automatically controlled calibration of one or more laser sources by precise control of presentation of each laser relative a sample for small incremental changes of incident angle over a range of critical TIR angles. The calibration then allows precise scanning of the sample for any of those calibrated angles for higher and more accurate resolution, and better reconstruction of the scans for super resolution reconstruction of the sample. Optionally the system can be controlled for incident angles of the excitation laser at sub-critical angles for pseudo TIRFM. Optionally both above-critical angle and sub critical angle measurements can be accomplished with the same system.
36 MATERIALS SCIENCE↗