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At least 1,747 records · Page 97
All sourcesNASA NTRSDOE OSTI
DOE OSTI2024

Sample mount for electron backscatter diffraction

A sample mount having a bottom surface, a front surface, and a second portion is disclosed. The first portion is perpendicular to the bottom surface. The second portion has an external surface and an internal surface and extends from the first portion to form a 70-degree angle relative to the bottom surface. The sample mount may also have a top surface, an opening extending through the second portion of the front surface, and a receiving area configured to receive a sample, wherein the top surface presents an unimpeded path between the sample and an SEM pole piece. The sample mount may include a spring-loaded handle configured to push the sample against the internal surface of the second portion of the front surface, wherein pushing the sample against the internal surface places the sample at the 70-degree angle relative to the bottom surface.

Wieliczka, David M.↗
DOE OSTI2026

Hydride and Seek: Comparing Crystallographic Hydride Placement Techniques with an Open-Shell Cobalt Complex

Locating hydrides is crucial in organometallic chemistry but difficult to do accurately using X-ray diffraction. Electron diffraction has been proposed as a way to overcome this problem but has not been systematically compared to neutron diffraction and to quantum crystallography (Hirshfeld atom refinement, HAR) to test this hypothesis. Here, we present a comparative analysis of methods for a terminal cobalt hydride complex by comparing a single-crystal neutron diffraction reference structure to results from single-crystal X-ray diffraction with and without Hirshfeld atom refinement (HAR, NoSpherA2), density functional theory (DFT), and electron diffraction (3D-ED/MicroED) refined under kinematical and dynamical formalisms. Conventional X-ray diffraction gives lower precision than neutron diffraction as expected. Despite expected improvements, HAR gives systematic deviation from the neutron benchmark. Interestingly, optimized DFT equilibrium geometries are closer to the neutron value than the value from HAR. On the other hand, electron diffraction with a high-quality data set coupled with dynamical refinement localizes the hydride in difference maps and gives excellent agreement with the neutron data. Dynamical refinement is crucial, as kinematical refinement does not allow assignment of a hydride peak. This cross-modal comparison defines the conditions under which 3D-ED/MicroED delivers high-precision metal–hydride distances for this open-shell cobalt hydride.

anions↗
DOE OSTI2020

Atomic structures determined from digitally defined nanocrystalline regions

Nanocrystallography has transformed our ability to interrogate the atomic structures of proteins, peptides, organic molecules and materials. By probing atomic level details in ordered sub-10 nm regions of nanocrystals, scanning nanobeam electron diffraction extends the reach of nanocrystallography and in principle obviates the need for diffraction from large portions of one or more crystals. Scanning nanobeam electron diffraction is now applied to determine atomic structures from digitally defined regions of beam-sensitive peptide nanocrystals. Using a direct electron detector, thousands of sparse diffraction patterns over multiple orientations of a given crystal are recorded. Each pattern is assigned to a specific location on a single nanocrystal with axial, lateral and angular coordinates. This approach yields a collection of patterns that represent a tilt series across an angular wedge of reciprocal space: a scanning nanobeam diffraction tomogram. Using this diffraction tomogram, intensities can be digitally extracted from any desired region of a scan in real or diffraction space, exclusive of all other scanned points. Intensities from multiple regions of a crystal or from multiple crystals can be merged to increase data completeness and mitigate missing wedges. It is demonstrated that merged intensities from digitally defined regions of two crystals of a segment from the OsPYL/RCAR5 protein produce fragment-based ab initio solutions that can be refined to atomic resolution, analogous to structures determined by selected-area electron diffraction. In allowing atomic structures to now be determined from digitally outlined regions of a nanocrystal, scanning nanobeam diffraction tomography breaks new ground in nanocrystallography.

36 MATERIALS SCIENCE↗
NASA NTRS1992

Electromagnetic scattering by coated convex surfaces and wedges simulated by approximate boundary conditions

Asymptotic/high-frequency solutions are developed for analyzing the non-specular scattering mechanisms associated with coated convex surfaces and edges simulated by approximate boundary conditions. In particular, the standard impedance boundary conditions (SIBC's) and the second order generalized impedance boundary conditions (GIBC's) are employed for a characterization of the edge diffraction, creeping wave, and surface diffracted wave contributions. To study the creeping wave and surface diffracted wave mechanisms, rigorous UTD (uniform geometrical theory of diffraction) diffraction coefficients are developed for a convex coated cylinder simulated with SIBC's and GIBC's. The ray solutions obtained remain valid in the transition region and reduce uniformly to those in the deep lit and shadow regions. A uniform asymptotic solution is also presented for observations in the close vicinity of the cylinder. The diffraction coefficient for a convex cylinder are obtained via a generalization of the corresponding ones of the circular cylinder. To validate the asymptotic/high-frequency solution, integral equations are derived for both E and H-polarization and solved numerically using the method of moments. Results are presented for a single and three layered coated convex cylinder. Some insights are also provided on the accuracy of the employed GIBC's versus SIBC's for application to curved surfaces. To characterize the scattering by impedance wedges illuminated at skew incidence, diffraction coefficients are derived from an approximate solution of the governing functional difference equations. This solution exactly recovers the known ones for an impedance half plane or an arbitrary wedge at normal incidence, and to validate it for other wedge angles, a moment method code was used. Finally, to test the usefulness of the approximate skew incidence impedance wedge diffraction coefficient for three dimensional structures, equivalent currents are derived in the context of the physical theory of diffraction (PTD) for a finite length impedance wedge of arbitrary internal angles. These are incorporated in a standard general purpose PTD code and results are presented for a number of different impedance structures.

Syed, H. H.↗
DOE OSTI2024

Ultrafast photonic micro-systems

A microelectromechanical device for diffracting optical beams comprises a diffractive element suspended over a channel. The diffractive element is configured to receive an optical beam and diffract and/or transmit the optical beam based on an orientation of the diffractive element. At least one torsional actuator is operatively connected to the diffractive element. The at least one torsional actuator is configured to selectively adjust the orientation of the diffractive element. The diffractive element has a diffractive element resonant frequency that is nearly the same as a resonant frequency of the optical beam.

Wang, Jin↗