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Results for “failure” Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.
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At least 1,657 records · Page 92NASA NTRS 1964
Failure mode determination for transistors - transient spike voltage, life test data on manufacturing processes, and computer calculated distributions for test matrix
NASA NTRS 1965
Structural failure criteria for viscoelastic materials
NASA NTRS 1965
Failure criteria of inert composite solid propellant under five biaxial tension stress fields and effect of loading rate
NASA NTRS 1965
Noncatastrophic guidance and navigation equipment failures detected in flight, using two separate statistical tests
NASA NTRS 1965
Buckling test of truss-core sandwich cylinder loaded in bending - cylinder failure due to growth of wall buckles
NASA NTRS 1965
Test equipment for recording failures of contacts to open or close
NASA NTRS 1965
Stress corrosion tests on aluminum alloys with respect to statistical nature of distribution of failure times
NASA NTRS 1965
Environmental testing - analysis of spacecraft failures during thermal vacuum testing - quality assurance and spacecraft reliability
NASA NTRS 1966
Hydrotest failure analysis of arc welded, solid propellant rocket motor case
NASA NTRS 1966
Tolerance and confidence limits for classes of distributions based on failure rates
NASA NTRS 1966
Redundant system reliability estimation after component failure
NASA NTRS 1965
Failure modes of diffused planar transistors under stress screening and life testing
NASA NTRS 1963
Development and testing of integrated circuits and redundant systems for circuit reliability and failure free systems
NASA NTRS 1963
Failure analysis for rhenium mass spectrometer filaments in atmospheric structure satellite
SATELLITE INSTRUMENTATION ↗ NASA NTRS 1963
Component reliability, and failure-free systems for electrochemical cell, magnetic devices, and mercury cell integrator
NASA NTRS 1966
Failure analyses on eleven microelectronic devices subjected to temperature-stress cycling, and life testing
MICROMINIATURIZED ELECTRONIC EQUIPMENT ↗ NASA NTRS 1966
Failure analyses on microelectronic devices subjected to temperature-stress cycling, and life testing
MICROMINIATURIZED ELECTRONIC EQUIPMENT ↗ NASA NTRS 1966
Failure mechanisms of glass-resin composites - flat sided rectangular microtape to measure strain and effects on castings of shrinkage