W band power amplifier development for the Herschel HIFI instrument
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W band amplifiers MMIC GaAs MMIC↗
SEARCH · Engineering Papers
Results for “SWIFT”
Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.
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Backside device irradiation for single event upset tests of advanced devices
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heavy ion testing single event testing beam degrad↗
Retrieval of atmospheric attenuation using combined ground-based and airborne 95-GHz cloud radar measurements
This paper discusses cloud radar calibration and intercomparison of airborne and ground-based radar measurements and presents a unique algorithm for attenuation retrieval. This algorithm is based on dual 95-GHz radar measurements of the same cloud and precipitation volumes collected from opposing viewing angles.
Cloud radar measurements precipitation earth atmos↗
Radiation Effects in Nanostructures: Comparison of Proton Irradiation Induced Changes on Quantum Dots and Quantum Wells
Successful implementation of technology using self-forming semiconductor Quantum Dots (QDs) has already demonstrated that temperature independent Dirac-delta density of states can be exploited in low current threshold QD lasers and QD infrared photodetectors.
nanostructures space reliability radiation effects↗
Changes in luminescence emission induced by proton irradiation: InGaAs/GaAs quantum wells and quantum dots
The photoluminescence emission from InGaAs/GaAs quantum-well and quantum-dot (QD) structures are compared after controlled irradiation with 1.5 MeV proton fluxes. Results presented here show a significant enhancement in radiation tolerance with three-dimensional quantum confinement.
Radiation recombination heterostructures transform↗
Assurance Issues for the Use of Optoelectronics in NASA Systems
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Assurance Issues Optoelectronics NASA Systems↗
Catastrophic Heavy-Ion Failure of a Commercial ASIC
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Heavy-Ion SEGR↗
A Neat Methodology for Microprocessor Upset Testing
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single event effects single event upset microproce↗
A Brief History of Memory in Space From an SEE Perspective
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Single Event Effects RAM Memory Upsets↗
Angular dependence of DRAM upset susceptibility
Heavy ion irradiations of two types of commercial DRAMs reveal unexpected angular responses. One device's cross section varied by two orders of magnitude with azimuthal angle. Accurate prediction of space rates requires accommodating this effect.
DRAM angle SEU multiple bit upset DRAM upsets↗
The effects of TID on wear-out of advanced flash memories
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nonvolatile memories↗
A Brief History of Memories in Space from a SEE (Single Event Effects) Perspective
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flight anomalies space radiation effects single ev↗
64Mb COTS DRAMs: A Variety of SEE Responses
Advanced commercial DRAMs are particularly attractive to designers for space applications needing large memory arrays due to resulting savings in mass, volume, and power.
(MCMs)↗
TOPEX/Poseidon Radiation Issues: Displacement Damage in Optocouplers
In this paper we describe observed failures of optocouplers on the TOPEX/Poseidon (T/P) ocean measuring satellite. An indirect assessment is made of proton doses by the spacecraft, and these data are compared with laboratory proton irradiations of optocouplers. It is shown that the T/P failures occur at expected doses for proton-induced displacement damage.
optocouplers TOPEX Poseidon↗
Device See Susceptibility From Heavy Ions (1995-1996)
A seventh set of heavy ion single event effects (SEE) test data have been collected since the last IEEE publications. SEE trends are indicated for several functional classes of ICs.
Heavy Ions↗
Investigations into the Power MOSFET SEGR Phenomenon and its Physical Mechanism
The state of understanding of the destructive SEGR event in power MOSFETs is relatively mature with large published efforts, both experimental and theoretical. However, gasps remain in the uderstanding of the phenomenon, including unexplained anomalies, emperical-only dependencies on some important device and incident ion physical parameters, and limited insight into latent effets.
MOSFET SEGR↗
Trends in Device SEE Susceptibility from Heavy Ions
The sixth set of heavy ion single event effects (SEE) test data have been collected since the last IEEE publications in December issues of IEEE - Nuclear Science Transactions for 1985, 1987, 1989, 1991, and the IEEE Workshop Record, 1993. Trends in SEE susceptibility (including soft errors and latchup) for state-of- are evaluated.
single event effects latchup radiation hardening↗
Radiation Effects on Fused Biconical Taper Wavelength Division Multiplexers
The effects of radiation on fused biconical taper wavelength division multiplexers are presented. A theoretical model indicates that index changes in the fiber are primarily responsible for the degradation of these devices.
Wavelengths↗