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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 1,621 records · Page 90

Circuit Controls Turn-On Current

Single choke used in primary circuit with diode arrangement, maintaining dc current flow through choke and setting up a unidirectional magnetic field, limits turn-on current of transformer-rectifier power supply. Technique reduces number and weight of components and minimizes effect of initial inrush surge current on source.

Holmes, K. G.↗

Driver circuit for inductive loads

Circuit, based on use of power transistors which do not display second breakdown under valve loading, drives inductive loads. Peak voltages, power dissipations, heat sink requirements, and thermal stability considerations can be obtained by theoretical analysis.

Cooke, W. A.↗

Magnet-wire wrapping tool for integrated circuits

Wire-dispensing tool which resembles mechanical pencil is used to wrap magnet wire around integrated circuit terminals uniformly and securely without damaging insulative coating on wire. Tool is hand-held and easily manipulated to execute wire wrapping movements.

Takahashi, T. H.↗

A research on integrated-circuit sensors for gas chromatography

Fabrication of a miniature gas chromatograph column using integrated circuit technology was studied and found to be feasible. A bonding problem of forming a strong, gas tight seal between two wafers of silicon has prevented the completion of the column design. Continuing research using tin or a chromium-gold bond promises to overcome the problems of using the proposed gold-eutectic bond. Specifications for the miniature gas chromatograph column are: a spiral capillary column of semi-circular cross section, 30 micron radius, and a total length of 6.9 meters etched into a silicon structure 50 mm in diameter and 0.625 mm thick.

Source record↗

An eclectic integrated circuit reliability model

A general form of a comprehensive reliability modeling rationale was formulated for the integrated circuit. Integrated device failure models amenable to long term applications were investigated.

Fetcher, B. C.↗