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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 1,621 records · Page 90
All sourcesNASA NTRSDOE OSTI
DOE OSTI2015

Study of modification methods of probes for critical-dimension atomic-force microscopy by the deposition of carbon nanotubes

The results of an experimental study of the modification of probes for critical-dimension atomicforce microscopy (CD-AFM) by the deposition of carbon nanotubes (CNTs) to improve the accuracy with which the surface roughness of vertical walls is determined in submicrometer structures are presented. Methods of the deposition of an individual CNT onto the tip of an AFM probe via mechanical and electrostatic interaction between the probe and an array of vertically aligned carbon nanotubes (VACNTs) are studied. It is shown that, when the distance between the AFM tip and a VACNT array is 1 nm and the applied voltage is within the range 20–30 V, an individual carbon nanotube is deposited onto the tip. On the basis of the results obtained in the study, a probe with a carbon nanotube on its tip (CNT probe) with a radius of 7 nm and an aspect ratio of 1:15 is formed. Analysis of the CNT probe demonstrates that its use improves the resolution and accuracy of AFM measurements, compared with the commercial probe, and also makes it possible to determine the roughness of the vertical walls of high-aspect structures by CD-AFM. The results obtained can be used to develop technological processes for the fabrication and reconditioning of special AFM probes, including those for CD-AFM, and procedures for the interoperational express monitoring of technological process parameters in the manufacturing of elements for micro- and nanoelectronics and micro- and nanosystem engineering.

77 NANOSCIENCE AND NANOTECHNOLOGY↗
DOE OSTI2015

Study of the structure of a thin aluminum layer on the vicinal surface of a gallium arsenide substrate by high-resolution electron microscopy

The results of electron-microscopy studies of a thin epitaxial aluminum layer deposited onto a misoriented gallium-arsenide substrate are reported. It is established that the layer consists of differently oriented grains, whose crystal lattices are coherently conjugated with the substrate with the formation of misfit dislocations, as in the case of a layer on a singular substrate. Atomic steps on the substrate surface are visualized, and their influence on the growth of aluminum crystal grains is discussed.

36 MATERIALS SCIENCE↗
DOE OSTI2016

Study of the structure and composition of the strained epitaxial layer in the InAlAs/GaAs(100) heterostructure by transmission electron microscopy

The results of electron microscopy studies of an epitaxial InAlAs layer on a GaAs(100) substrate are reported. It is established that there exist misfit dislocations at the interface between the materials and there are residual strains distorting the lattice in the layer. From the measurements of lattice parameters in the directions parallel and orthogonal to the growth direction away from misfit dislocations, the local nominal lattice parameter of the layer is calculated and the relative content of indium is determined.

36 MATERIALS SCIENCE↗
DOE OSTI2018

A Study of Iron Phthalocyanine Pyrolyzate with Mössbauer Spectroscopy and Transmission Electron Microscopy

A pyrolyzate of iron phthalocyanine is studied by Mössbauer spectroscopy and transmission electron microscopy. The phase composition and magnetic state were found for pyrolysis products (α-Fe, γ-Fe, Fe{sub 3}C, and magnetite). Morphological features of carbon and iron-containing phases (metal particles of various shapes and sizes, as well as carbon nanotubes, carbon hollow nanopolihedra, and nongraphitized carbon) are determined. The morphology and structure of iron phthalocyanine pyrolyzates and diphthalocyanines of rare-earth elements are analyzed.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗
DOE OSTI2018

Magnetization Reversal of Permalloy Microparticles with the Configuration Anisotropy by Magnetic-Force Microscopy

Abstract—Magnetic force microscopy has been used to study the distribution of the magnetization in permalloy microparticles with a configurational anisotropy. The triangular particles with different degrees of concavity of the lateral sides have been studied. An analysis of the results enables us to state that the particles can be in several quasi-homogeneous stable states. It is shown that the particle magnetization reversal can occur both stepwise and also via an intermediate state in the dependence on the particle orientation. It is demonstrated that the quasi-homogeneous magnetization orientation in a particle can be changed by a magnetic-force microscope probe.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗
DOE OSTI2019

Microstructure of Si Crystals Subjected to Irradiation with High-Energy H{sup +} Ions and Heat Treatment by High-Resolution Three-Crystal X-Ray Diffraction and Transmission Electron Microscopy

The structural features of the formation of radiation defects in proton-implanted layers of silicon plates during their heat treatment have been studied. New data on the nature, the characteristics, and the microdefect concentration in Si crystals irradiated with protons with energies 100 + 200 + 300 keV with the total dose 2 × 10{sup 16} cm{sup –2} and the evolution of the defect structure during heat treatment have been obtained by high-resolution three-crystal X-ray diffraction and transmission electron microscopy over wide temperature range from 200 to 1100°C.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗
DOE OSTI2019

Determination of the Thicknesses and Visualization of Ion-Exchange Waveguides in Glasses by Scanning Electron Microscopy

The formation of a surface layer with silver and sodium concentration gradients in K8-grade glasses as a result of ion exchange is demonstrated by scanning electron microscopy (SEM) and electron probe X-ray microanalysis. The silver ions enriched layers with different thicknesses, depending on the duration of the ion exchange from the silver melt, are visualized in the secondary electrons mode. SEM data on the thickness of the silver enriched layer are in good agreement with the results of calculation from the diffusion equation for silver in glass. The dependence of the silver concentration on the diffusion depth is obtained using elemental composition mapping over the glass cross section. The presence of a layer with a silver concentration gradient leads to formation of a gradient waveguide. Discrete peaks in silver concentration profiles, caused by specific features of mutual diffusion of sodium and silver ions in glasses, are found.

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND ↗
DOE OSTI2019

Atomic-Force Microscopy of Resistive Nonstationary Signal Switching in ZrO{sub 2}(Y) Films

Local resistive switching by complex nonstationary signals in zirconium-dioxide-stabilized films on conducting substrates has been studied by atomic-force microscopy with a conducting probe. Film resistance was switched by triangular voltage pulses on which a high-frequency sinusoidal signal was superimposed. It is found that the ratio of currents through the junction between the probe and film surface in high-resistance and low-resistance states increases after the superposition of a sinusoidal signal (as compared to switching by simple triangular pulses). An increase in the temporal stability of the current strength in these states was also found when switching with a sinusoidal signal. This effect is associated with resonant activation of oxygen ion migration over vacancies in an external ac electric field.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗
DOE OSTI2018

Atomic-Force Microscopy Probe-Activated Morphological Transformations in a Nanophase Copper Wetting Layer on Silicon

The phase transition of the nanophase Cu{sub 2}Si wetting layer on a Si(001) substrate to more stable Cu silicide has been selectively activated by atomic-force microscopy in air. The transition is accompanied by an increase in the lateral size and height of grains and a decrease in their density. The effect that has been identified can be used to form ordered nanoisland ensembles and in nanolithography.

77 NANOSCIENCE AND NANOTECHNOLOGY↗
DOE OSTI2019

Electron Microscopy and Elemental Composition of the Near-Surface Layer of Electron-Irradiated LiF Crystals

Electron microscopy and optical vibrational spectroscopy techniques have been used to study Li nanoparticles formed on the cleaved surface of lithium fluoride (LiF) crystals irradiated by 4-MeV electron beam to a total fluence of 5 × 10{sup 16} cm{sup –2}. It is suggested that ionization accompanying this intense irradiation leads to radiolysis of the target and removal of fluorine from interblock boundaries, where lithium cations are collected and mutually oriented to form microwires. This functional surface may be of practical interest.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗
DOE OSTI2019

Probing Mechanical Characteristics of Living Fibroblasts via Atomic Force Microscopy

Atomic force microscopy (AFM) measurements have revealed hardening of intact fibroblasts after treatment with colchicine. The reliability of AFM measurements was confirmed by the identification of cells the lateral response of which to indentation did not disturb the normal force contribution. AFM data on the mechanical characteristics of such cells admit an unambiguous interpretation.

36 MATERIALS SCIENCE↗
DOE OSTI2023

Quantitative Scanning Transmission Electron Microscopy for Materials Science: Imaging, Diffraction, Spectroscopy, and Tomography

Scanning transmission electron microscopy (STEM) is one of the most powerful characterization tools in materials science research. Due to instrumentation developments such as highly coherent electron sources, aberration correctors, and direct electron detectors, STEM experiments can examine the structure and properties of materials at length scales of functional devices and materials down to single atoms. STEM encompasses a wide array of flexible operating modes, including imaging, diffraction, spectroscopy, and 3D tomography experiments. This review outlines many common STEM experimental methods with a focus on quantitative data analysis and simulation methods, especially those enabled by open source software. The hope is to introduce both classic and new experimental methods to materials scientists and summarize recent progress in STEM characterization. The review also discusses the strengths and weaknesses of the various STEM methodologies and briefly considers promising future directions for quantitative STEM research.

36 MATERIALS SCIENCE↗
DOE OSTI2010

Tests of microstructure reconstruction by forward modeling of high energy X-ray diffraction microscopy data

Verification tests of the forward modeling technique for near-field high energy X-ray diffraction microscopy are conducted using two simulated microstructures containing uniformly distributed orientations. Comparison between the simulated and reconstructed microstructures is examined with consideration to both crystallographic orientation and spatial geometric accuracy. To probe the dependence of results on experimental parameters, simulated data sets use two different detector configurations and different simulated experimental protocols; in each case, the parameters mimic the experimental geometry used at Advanced Photon Source beamline 1-ID. Results indicate that element orientations are distinguishable to less than 0.1{sup o}, while spatial geometric accuracy is limited by the detector resolution.

36 MATERIALS SCIENCE↗
DOE OSTI2010

Spectrally resolved phase-shifting interference microscopy: technique based on optical coherence tomography for profiling a transparent film on a patterned substrate

Spectrally resolved white-light phase-shifting interference microscopy has been used for measurements of the thickness profile of a transparent thin-film layer deposited upon a patterned structure exhibiting steps and discontinuities. We describe a simple technique, using an approach based on spectrally resolved optical coherence tomography, that makes it possible to obtain directly a thickness profile along a line by inverse Fourier transformation of the complex spectral interference function.

71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSIC↗
DOE OSTI2016

Determination of the Goos-Hanchen shift in dielectric waveguides via photo emission electron microscopy in the visible spectrum

Photoemission Electron Microscopy (PEEM) is a versatile tool that relies on the photoelectric effect to produce high-resolution images. Pulse lasers allow for multi-photon PEEM where multiple photons are required excite a single electron. This non-linear process can directly image the near field region of electromagnetic fields in materials. We use this ability here to analyze wave propagation in a linear dielectric waveguide with wavelengths of 410nm and 780nm. The propagation constant of the waveguide can be extracted from the interference pattern created by the coupled and incident light and shows distinct polarization dependence. Furthermore, the electromagnetic field interaction at the boundaries can then be deduced which is essential to understand power flow in wave guiding structures. These results match well with simulations using finite element techniques.

75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND↗
DOE OSTI2016

Transmission electron microscopy examinations of metal-oxide interface of zirconium-based alloys irradiated in Halden reactor-IFA-638 - 2016-0039

This paper provides the results of investigations by transmission electron microscopy (TEM) on the selected materials from in-reactor oxidation tests in the Halden test reactor (Reference No. IFA-638) from 1998 to 2006. The objective of the IFA-638 test was to study the corrosion behavior of modern zirconium-based claddings to high burnup in pressurized water reactor water chemistry and thermal hydraulic conditions. The aim of this paper is to report on the microstructure of selected materials (ZIRLO{sup R}, E635, and Alloy A) after the irradiation to different burnup levels to determine the modifications induced by irradiation and to correlate results to their oxidation behavior. The TEM examinations revealed the nature of secondary phase particles (SPPs) and their modification under irradiation. Four types of SPPs were observed, namely β-niobium precipitates, Zr{sub 0.5}Nb{sub 0.3}Fe{sub 0.2} (mainly in the ZIRLO alloy), Zr(Fe,Nb){sub 2} (in E635), and (Cr,Fe){sub 2}Zr,Nb with varying niobium content (present in Alloy A: Zr-0.58Sn-0.31Nb-0.36Fe-0.26Cr). TEM observations showed that all three materials contained still several precipitates after irradiation and in the case of the ZIRLO alloy even after high burnups. Furthermore, the analysis of the metal side of the interface and its comparison with the oxide side led to the conclusion that all types of precipitates dissolved to some extent under irradiation and that their alloying element content decreased. The dissolution was intensified in the oxide. However, a more detailed examination showed that the β-niobium precipitates dissolved at a slower rate, or knowing that their composition was much richer in niobium, the time needed for the precipitates to become fully depleted from niobium was longer. Regarding the amorphization under irradiation, the b-niobium- and chromium-containing precipitates did not amorphize in the metal part of the interface. This was not the case for the other types of precipitates. Furthermore, these two types of SPP both showed delayed oxidation and due to this behavior the typical crack above the SPP in the oxide was also observed. These results are discussed to gain an improved understanding of the oxidation behavior of materials studied as a function of irradiation and residence time. (authors)

36 MATERIALS SCIENCE↗
DOE OSTI2016

Quantifying irradiation defects in zirconium alloys: a comparison between transmission electron microscopy and whole-pattern diffraction line-profile analysis - 2016-0089

Irradiation-induced dislocations significantly affect the mechanical properties of zirconium alloys, altering slip and influencing creep and growth. Thus, the quantitative characterization of irradiation defects as a function of fluence, cold work, and/or thermal treatments is important for models that attempt to predict their impact on properties. Whole-pattern diffraction line-profile analysis (DLPA) is a well-established modern tool for microstructure characterization based on first-principle physical models for dislocation density measurements in plastically deformed materials. However, applying these DLPA methods directly to irradiated materials yields higher than expected dislocation density values compared with historical transmission electron microscopy (TEM) measurements and past line-broadening analysis studies calibrated to TEM observations. In an effort to understand these differences, a new microstructural model was developed for DLPA to specifically address dislocation structures consisting of elliptical - and -component loops. To compare the refined DLPA method with TEM measurements, high-resolution neutron diffraction patterns on nonirradiated and irradiated Zr-2.5Nb samples were collected with the Neutron Powder Diffractometer instrument at the Los Alamos Neutron Science Center and were evaluated. High-resolution TEM measurements were performed at the Reactor Materials Testing Laboratory, Queen's University, for comparison with the DLPA results. The capabilities and inherent uncertainties of both the refined DLPA and TEM methods are compared and discussed in detail. We show that the differences between the density values provided by DLPA and TEM are inherent to the methods and can be reconciled with the interpretation of the data. (authors)

36 MATERIALS SCIENCE↗