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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 163 records · Page 9
All sourcesNASA NTRSDOE OSTI
NASA NTRS1988

Heavy ion induced Single Event Phenomena (SEP) data for semiconductor devices from engineering testing

The accumulation of JPL data on Single Event Phenomena (SEP), from 1979 to August 1986, is presented in full report format. It is expected that every two years a supplement report will be issued for the follow-on period. This data for 135 devices expands on the abbreviated test data presented as part of Refs. (1) and (3) by including figures of Single Event Upset (SEU) cross sections as a function of beam Linear Energy Transfer (LET) when available. It also includes some of the data complied in the JPL computer in RADATA and the SPACERAD data bank. This volume encompasses bipolar and MOS (CMOS and MHNOS) device data as two broad categories for both upsets (bit-flips) and latchup. It also includes comments on less well known phenomena, such as transient upsets and permanent damage modes.

Nichols, Donald K.↗
NASA NTRS2011

Radiation Characterization of Commercial GaN Devices

Radiative feedback from primordial protostars and final mass of the first star Commercially available devices fabricated from GaN are beginning to appear from a number of different suppliers. Based on previous materials and prototype device studies, it is expected that these commercial devices will be quite tolerant to the types of radiation encountered in space. This expectation needs to be verified and the study described herein was undertaken for that purpose. All of the parts discussed in this report are readily available commercially. The parts chosen for study are all targeted for RF applications. Three different studies were performed: 1) a preliminary DDD/TID test of a variety of part types was performed by irradiating with 50 MeV protons, 2) a detailed DDD/TID study of one particular part type was performed by irradiating with 50 MeV protons, and 3) a SEB/SEGR test was performed on a variety of part types by irradiating with heavy ions. No significant degradation was observed in the tests performed in this study.

HEMT↗
DOE OSTI2025

Bridging nuclear physics across energy scales: from neutrinoless double-beta decay to high-energy heavy-ion collisions

This paper exemplifies how connecting methods at disparate energy scales can illuminate fundamental questions. By demonstrating that nuclear wave function properties governing rare decay processes also influence collective behavior at extreme temperatures and densities, the authors have opened a new pathway for constraining physics beyond the Standard Model. With multiple ton-scale 0νββ experiments under construction, any method reducing NME uncertainties will directly impact our ability to interpret discoveries or constrain neutrino properties. The general principle—that collective phenomena in high-energy collisions can illuminate subtle features of many-body correlations in the colliding nuclei—may find applications across nuclear and particle physics. Furthermore, this intersection of nuclear structure theory, heavy-ion physics, and fundamental symmetry tests represents fertile ground for future discoveries in modern physics.

73 NUCLEAR PHYSICS AND RADIATION PHYSICS↗
NASA NTRS1991

Update on parts SEE suspectibility from heavy ions

JPL and the Aerospace Corporation have collected a fourth set of heavy ion single event effects (SEE) test data. Trends in SEE susceptibility (including soft errors and latchup) for state-of-the-art parts are displayed. All data are conveniently divided into two tables: one for MOS devices, and one for a shorter list of recently tested bipolar devices. In addition, a new table of data for latchup tests only (invariably CMOS processes) is given.

Nichols, D. K.↗
NASA NTRS1998

Overview of Device SEE Susceptibility from Heavy Ions

A fifth set of heavy ion single event effects (SEE) test data have been collected since the last IEEE publications (1,2,3,4) in December issues for 1985, 1987, 1989, and 1991. Trends in SEE susceptibility (including soft errors and latchup) for state-of-the-art parts are evaluated.

Nichols, D. K.↗
NASA NTRS1995

Trends in Device SEE Susceptibility from Heavy Ions

The sixth set of heavy ion single event effects (SEE) test data have been collected since the last IEEE publications in December issues of IEEE - Nuclear Science Transactions for 1985, 1987, 1989, 1991, and the IEEE Workshop Record, 1993. Trends in SEE susceptibility (including soft errors and latchup) for state-of- are evaluated.

single event effects latchup radiation hardening↗
DOE OSTI2022

Investigating the coalescence-inspired sum rule for light nuclei and hypernuclei in heavy-ion collisions

A data-driven idea is presented to test if light nuclei and hypernuclei obey the coalescence-inspired sum rule, i.e., to test if the flow of a light nucleus or hypernucleus is the summed flow of each of its constituents. Here, the mass difference and charge difference among the constituents of light nuclei and hypernuclei are treated appropriately. The idea is applied to the available data for $\sqrt{^sNN}$ = 3 GeV fixed-target Au + Au collisions at the Relativistic Heavy Ion Collider (RHIC), published by the STAR Collaboration. It is found that the sum rule for light nuclei is approximately valid near midrapidity (-0.3 < $\mathcal{y}$ < 0), but there is a clear violation of the sum rule at large rapidity ($\mathcal{y}$ < -0.3). Further, the Jet AA Microscopic Transport Model (JAM), with baryonic mean-field plus nucleon coalescence, generates a similar pattern as obtained from the experimental data. In the present approach, the rapidity dependence of directed flow of the hypernuclei $^3_Λ$⁢H and $^4_Λ$H is predicted in a model-independent way for $\sqrt{^sNN}$ = 3 GeV Au + Au collisions, which will be explored by ongoing and future measurements from STAR.

73 NUCLEAR PHYSICS AND RADIATION PHYSICS↗
DOE OSTI2022

Testing the impact of electromagnetic fields on the directed flow of constituent quarks in heavy-ion collisions

It has been proposed that strong electromagnetic fields produced in the early stages of heavy-ion collisions can lead to splitting of the rapidity-odd directed flow of positive and negative hadrons. For light hadrons, the interpretation of such measurements is complicated by the low magnitude of directed flow as well as by ambiguities arising from transported quarks. To overcome these complications, we propose measurements using only hadrons carrying produced quarks (u¯, d¯, s s¯ ). Here, we discuss how to identify the kinematics where such hadrons are produced via the coalescence mechanism and therefore their flow is the sum of the flow of their constituent quarks. With this sum rule verified for certain combinations of hadrons, the expected systematic violation of this rule with increasing electric charge can be measured, which could be a consequence of the electromagnetic fields produced in the collisions. Our approach can be tested with the high statistics data from Phase II of the Beam Energy Scan program at the Relativistic Heavy Ion Collider.

73 NUCLEAR PHYSICS AND RADIATION PHYSICS↗
NASA NTRS1992

Diagnosis of NMOS DRAM functional performance as affected by a picosecond dye laser

A picosec pulsed dye laser beam was at selected wavelengths successfully used to simulate heavy-ion single-event effects (SEEs) in negative channel NMOS DRAMs. A DRAM was used to develop the test technique because bit-mapping capability and previous heavy-ion upset data were available. The present analysis is the first to establish such a correlation between laser and heavy-ion data for devices, such as the NMOS DRAM, where charge collection is dominated by long-range diffusion, which is controlled by carrier density at remote distances from a depletion region. In the latter case, penetration depth is an important parameter and is included in the present analysis. A single-pulse picosecond dye laser beam (1.5 microns diameter) focused onto a single cell component can upset a single memory cell; clusters of memory cell upsets (multiple errors) were observed when the laser energy was increased above the threshold energy. The multiple errors were analyzed as a function of the bias voltage and total energy of a single pulse. A diffusion model to distinguish the multiple upsets from the laser-induced charge agreed well with previously reported heavy ion data.

Kim, Q.↗
NASA NTRS2003

A Monte Carlo Model for LET Spectra of 200 MeV Protons Used for Microelectronic Testing

The direct ionization Linear Energy Transfer (LET) for 200 MeV protons in silicon is much smaller than that for higher charged particles since LET increases as the square of the ion charge. However, occasionally the proton interacts with the silicon nuclei and produces a shower of fragments and a recoiling nucleus. When this happens, the LET produced is much greater than the direct ionization LET. Testing the single event effect susceptibility of components using energetic (200 MeV) protons is often the only viable option for system level testing commercial-off-the-shelf (COTS) avionics that have not been designed for space environments. However, the question of how a system tested with protons will perform in a heavy ion environment arises. Here the concern is not only with prediction of on-orbit upset rate, but also about possibility of on-orbit failures that were not observed during proton testing.

O'Neill, Patrick M.↗
NASA NTRS1996

The calculation of radial dose from heavy ions: predictions of biological action cross sections

The track structure model of heavy ion cross sections was developed by Katz and co-workers in the 1960s. In this model the action cross section is evaluated by mapping the dose-response of a detector to gamma rays (modeled from biological target theory) onto the radial dose distribution from delta rays about the path of the ion. This is taken to yield the radial distribution of probability for a "hit" (an interaction leading to an observable end-point). Radial integration of the probability yields the cross section. When different response from ions of different Z having the same stopping power is observed this model may be indicated. Since the 1960s there have been several developments in the computation of the radial dose distribution, in the measurement of these distributions, and in new radiobiological data against which to test the model. The earliest model, by Butts and Katz made use of simplified delta ray distribution functions, of simplified electron range-energy relations, and neglected angular distributions. Nevertheless it made possible the calculation of cross sections for the inactivation of enzymes and viruses, and allowed extension to tracks in nuclear emulsions and other detectors and to biological cells. It set the pattern for models of observable effects in the matter through which the ion passed. Here we outline subsequent calculations of radial dose which make use of improved knowledge of the electron emission spectrum, the electron range-energy relation, the angular distribution, and some considerations of molecular excitation, of particular interest both close to the path of the ion and the outer limits of electron penetration. These are applied to the modeling of action cross sections for the inactivation of several strains of E-coli and B. subtilis spores where extensive measurements in the "thin-down" region have been made with heavy ion beams. Such calculations serve to test the radial dose calculations at the outer limit of electron penetration. We lack data from which to test these calculations in regions close to the path of the ion aside from our earliest work on latent tracks in plastics, though it appears that the criterion then suggested for the threshold of track formation, of a minimal dose at a minimal distance (of about 20 angstroms, in plastics), remains valid.

NASA Discipline Radiation Health↗
NASA NTRS1985

Calculations of heavy ion charge state distributions for nonequilibrium conditions

Numerical calculations of the charge state distributions of test ions in a hot plasma under nonequilibrium conditions are presented. The mean ionic charges of heavy ions for finite residence times in an instantaneously heated plasma and for a non-Maxwellian electron distribution function are derived. The results are compared with measurements of the charge states of solar energetic particles, and it is found that neither of the two simple cases considered can explain the observations.

Luhn, A.↗
NASA NTRS1993

More About Laser Scanner Tests For Single-Event Upsets

Two reports describe preliminary theoretical and experimental studies based on method described in "Laser Scanner Tests For Single-Event Upsets" (NPO-18216). Laser-scan and heavy-ion data found correlated within factor of two. Method of testing for single-event upsets intended to overcome disadvantages of, complement, and/or substitute for more-expensive cyclotron-testing method, which does not provide spatial resolution.

Kim, Quiesup↗