Instrumentation for solar spectrophotometry at extreme ultraviolet and soft X-ray wavelengths
The solar extreme ultraviolet and soft X-ray (XUV) spectrum at wavelengths between 20 and 300 A contains a wealth of emission lines from ions formed at temperatures from 10 to the 5th K to greater than 2 x 10 to the 7th K. The requirements for high resolution spectrophotometric instrumentation are discussed in the light of data obtained with extreme ultraviolet and X-ray telescopes flown on Skylab. The design of a grazing-incidence spectroheliometer for active region and flare studies over the wavelength range from 40 to 630 A is presented and recently developed high-efficiency detectors and detector-arrays for use at XUV wavelengths are described.