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At least 163 records · Page 9

Organic nonlinear optical materials

Recently, it became clear that organic compounds with delocalized pi electrons show a great nonlinear optical response. Especially, secondary nonlinear optical constants of more than 2 digits were often seen in the molecular level compared to the existing inorganic crystals such as LiNbO3. The crystallization was continuously tried. Organic nonlinear optical crystals have a new future as materials for use in the applied physics such as photomodulation, optical frequency transformation, opto-bistabilization, and phase conjugation optics. Organic nonlinear optical materials, e.g., urea, O2NC6H4NH2, I, II, are reviewed with 50 references.

Umegaki, S.↗

X ray, extreme and far ultraviolet optical thin films for space applications

Far and extreme ultraviolet optical thin film filters find many uses in space astronomy, space astrophysics, and space aeronomy. Spacebased spectrographs are used for studying emission and absorption features of the earth, planets, sun, stars, and the interstellar medium. Most of these spectrographs use transmission or reflection filters. This requirement has prompted a search for selective filtering coatings with high throughput in the FUV and EUV spectral region. Important progress toward the development of thin film filters with improved efficiency and stability has been made in recent years. The goal for this field is the minimization of absorption to get high throughput and enhancement of wavelength selection. The Optical Aeronomy Laboratory (OAL) at the University of Alabama in Huntsville has recently developed the technology to determine optical constants of bulk and film materials for wavelengths extending from x-rays (0.1 nm) to the FUV (200 nm), and several materials have been identified that were used for designs of various optical devices which previously have been restricted to space application in the visible and near infrared. A new design concept called the Pi-multilayer was introduced and applied to the design of optical coatings for wavelengths extending from x-rays to the FUV. Section 3 of this report explains the Pi-multilayer approach and demonstrates its application for the design and fabrication of the FUV coatings. Two layer Pi-stacks have been utilized for the design of reflection filters in the EUV wavelength range from 70 - 100 nm. In order to eliminate losses due to the low reflection of the imaging optics and increase throughput and out-of-band rejection of the EUV instrumentation we introduced a self-filtering camera concept. In the FUV region, MgF2 and LiF crystals are known to be birefringent. Transmission polarizers and quarterwave retarders made of MgF2 or LiF crystals are commercially available but the performances are poor. New techniques for the design of the EUV and FUV polarizers and quarterwave retarders are described in Section 5. X- and gamma-ray detectors rely on a measurement of the electron which is effected when a ray interacts with matter. The design of an x- and gamma-ray telescope to operate in a particular region of the spectrum is, therefore, largely dictated by the mechanism through which the rays interact. Energy selection and the focusing of the incident high energy rays can be achieved with spectrally selective high reflective multilayers. The design and spectral performance of narrowband reflective x-ray Pi-multilayers are presented in section 6.

Zukic, Muamer↗

Circumstellar dust emission models

We present the wavelength-dependent absorption coefficient K(sub lambda) the scattering coefficient o(sub lambda), the albedo w(sub lambda), and the average cosine of the scattering phase function g(sub lambda) between 0.0912 micrometers and 1000 micrometers for four interstellar medium grain models. These grain models are used in a radiation transfer code to calculate the properties of dust shells surrounding a newly formed O star. For each shell model a distribution of 25 grain sizes and two compositions were used in our calculations. The spectral type of the central star (O6 ZAMS), the geometry (shell), and circumstellar density distribution (constant) are the same in all models, so that different model predictions result entirely from differences in grain properties. For each grain type the models predict the emergent spectral energy distribution with wavelength, the optical depth with wavelength, and the mean dust temperature with distance from the central star. In addition, we find the emitted envelope flux (total flux minus the direct stellar contribution) included within an angular radius theta for several wavelengths between 2.2 micrometers and 100 micrometers. It is found that large differences in the emitted spectrum can occur when grains with different optical constants and size distributions are used.

Wolfire, Mark G.↗

Optical conductivity of alpha-Mn

The optical constants were measured at room temperature in the photon-energy range 0.6-6.5 eV on evaporated thin films. Evaporation conditions were chosen that gave the alpha-Mn crystal structure with relatively large grains. The optical conductivity was separated into intraband and interband contributions by fitting to the Drude formula at low energies. The results are anomalous in comparison to other 3d transition metals: the free-electron lifetime is exceptionally short (in agreement with the large dc resistivity of Mn), and the interband transitions seem unusually weak at the lower energies. Possible explanations related to the complicated crystal structure of alpha-Mn with its loss of point symmetry at the atom sites are discussed.

Scoles, K. J.↗

Optical conductivity of alpha-Mn

The optical constants were measured at room temperature in the photon-energy range 0.6 to 6.5 eV on evaporated thin films. Evaporation conditions were chosen that gave the alpha-Mn crystal structure with reasonably large grains. The optical conductivity was separated into intraband and interband contributions by fitting to the Drude formula at low energies. The results are anomalous in comparison to other 3d transition metals. The free-electron lifetime is exceptionally sort (in agreement with the large dc resistivity of Mn), and the interband transitions seem unusually weak at the lower energies. Possible explanations related to the complicated crystal structure of alpha-Mn are discussed.

Scoles, K. J.↗

Amorphous silicon carbide coatings for extreme ultraviolet optics

Amorphous silicon carbide films formed by sputtering techniques are shown to have high reflectance in the extreme ultraviolet spectral region. X-ray scattering verifies that the atomic arrangements in these films are amorphous, while Auger electron spectroscopy and Rutherford backscattering spectroscopy show that the films have composition close to stoichiometric SiC, although slightly C-rich, with low impurity levels. Reflectance vs incidence angle measurements from 24 to 1216 A were used to derive optical constants of this material, which are presented here. Additionally, the measured extreme ultraviolet efficiency of a diffraction grating overcoated with sputtered amorphous silicon carbide is presented, demonstrating the feasibility of using these films as coatings for EUV optics.

Kortright, J. B.↗

Band-gap Engineering in Sputter Deposited Amorphous/Microcrystalline Sc(x)Ga(1-x)N

Reactive sputtering was used to grow thin films of Sc(x)Ga(1-x)N with scandium concentrations of 20%-70% on quartz substrates at temperatures of 300-675 K. X-ray diffraction (XRD) of the films showed either weak or no structure, suggesting the films are amorphous or microcrystalline. Optical absorption spectra were taken of each sample and the optical band gap was determined. The band gap varied linearly with increasing Ga concentration between 2.0 and 3.5 eV. Ellipsometry was used to confirm the band gap measurements and provide optical constants in the range 250-1200 nm. ScN and GaN have different crystal structures (rocksalt and wurzite, respectively), and thus may form a heterogeneous mixture as opposed to an alloy. Since the XRD data were inconclusive, bilayers of ScN/GaN were grown and optical absorption spectra taken. A fundamental difference in the spectra between the bilayer films and alloy films was seen, suggesting the films are alloys, not heterogeneous mixtures.

Little, Mark E.↗

Sputter process investigation: Material and environment interaction processes investigation

The multilayer Ellipsometry program has been developed with which the thickness and the optical properties of top layer can be determined with the additional information obtained from other measurement such as the optical constant of the middle layer film. Once the proper parameters are input into the program, the multilayer Ellipsometry program which was developed by H. Kim and Dr. Fromhold gives the best possible set of the solutions for the top layer thickness or its optical index graphically on a PC screen. In this report the basic two layer Ellipsometry theory will be summarized briefly as well as the one layer case. All the code is written in Microsoft Quickbasic version 4.5 for IBM PC with a VGA color graphics monitor so that the measurement could be cross-checked out graphically on the screen.

Williams, John R.↗

Spectral slicing X-ray telescope

Layered synthetic microstructure (LSM) X-ray optics is investigated as a system for coupling a conventional glancing incidence X-ray mirror to a high sensitivity X-ray detector. It is shown that, by the use of figured LSM optics, it is possible to magnify the X-ray image produced by the primary mirrors so as to maintain their high inherent spatial resolution. The results of theoretical and design analyses of several spectral slicing X-ray telescope systems that utilize LSM mirrors of hyperboloidal, spherical, ellipsoidal, and constant optical path aspheric configurations are presented. It is shown that the spherical LSM optics are the preferred configuration, yielding subarcsecond performance over the entire field. The Stanford/Marshall Space Flight Center Rocket X-ray Telescope, which will utilize normal incidence LSM optics to couple a Wolter-Schwarzschild primary mirror to high resolution detectors for solar X-ray/EUV studies, is discussed. Design diagrams are included.

Hoover, R. B.↗

Exposure of Highly Reflective Far-Ultraviolet Coatings to LEO Environment for TRL Advancement for the Habitable Worlds Observatory

Over the past several years, our team at the NASA Goddard Space Flight Center (GSFC), in collaboration with the Jet Propulsion Laboratory (JPL) and the Naval Research Laboratory (NRL), have developed several new protected Al coating technologies with improved Far-Ultraviolet (FUV) reflectance performance and more robust environmental stability. These include Al protected with lithium-based fluoride (LiF) coatings such as hot deposited LiF (eLiF), XeF 2 -passivated LiF coatings (XeLiF), Li 3 AlF 6 overcoats, AlF 3 (plasma passivated), and XeF 2 passivated MgF 2 coatings (XeMgF 2 ). However, despite these developments, relatively little experimental information exists regarding the long-term stability of these coatings after simultaneous exposure to the Low Earth Orbit (LEO) environment. To evaluate their environmental durability and advance their Technology Readiness Level (TRL), representative samples of these coating technologies, Al+XeLiF, Al+eLiF, Al+Li 3 AlF 6 , Al+AlF 3 , Al+XeMgF 2 , and bare Al as reference samples, were flown onboard the International Space Station (ISS) as part of the Materials International Space Station Experiment 20 (MISSE-20). The MISSE platform is operated by Aegis Aerospace for relatively long-duration (e.g. 6 months) external exposure experiments in a space environment. The coatings were deposited on ULE and Zerodur substrates, and witness samples deposited on the same coatings runs, but on glass slides were left on Earth as control. A subset of the flight samples were fitted with MgF 2 windows to reduce direct exposure to atomic oxygen (AO) and charged particles, and still let through UV and other types of radiation on these samples. After approximately 6 months of exposure in the forward-facing (RAM) direction, the samples were returned to Earth and characterized by performing FUV/NUV/VIS/NIR reflectance measurements to quantify degradation, spectroscopic ellipsometry to evaluate coating thickness and optical constants, atomic force microscopy (AFM) to quantify surface roughness evolution during the flight in the ISS. The MgF 2 protective windows were also analyzed through FUV transmission measurements. Comparison with the witness samples left on the ground and with the flown bare Al samples (with just the naturally occurring Al 2 O 3 layer) provided a quantitative assessment of coating thickness variations, optical performance degradation, and morphological changes induced by prolonged exposure to the LEO environment.

Far Ultraviolet (FUV)↗

Multilayer and grazing incidence X-ray/EUV optics for astronomy and projection lithography; Proceedings of the Meeting, San Diego, CA, July 19-22, 1992

The present volume on multilayer and grazing incidence X-ray/EUV optics for astronomy and projection lithography discusses AXAF grazing incidence mirrors, the theory and high throughput optics of grazing incidence optics, multilayer mirror fabrication and characterization, and multilayer optics for X-ray projection lithography. Attention is given to the VETA-I X-ray detection system, a motion detection system for AXAF X-ray ground testing, image analysis of the AXAF VETA-I X-ray mirror, and optical constants from mirror reflectivities measured at synchrotrons. Topics discussed include the application of aberration theory to calculate encircled energy of Wolter I-II telescopes, W/C multilayers deposited on plastic films, nonspecular X-ray scattering from Si/Mo multilayers, and multilayer thin-film design as FUV polarizers. Also discussed are thin-film filter lifetesting results in the EUV, chromospheric and coronal observations with multilayer optics, present and future requirements of soft X-ray projection lithography, and the imaging Schwarzschild multilayer X-ray microscope.

Hoover, Richard B.↗

Cryolite Overcoated Aluminum Reflectors for Far-Ultraviolet Spectroscopy

Aluminum (Al) mirrors are conventionally protected with metal-fluoride coatings (e.g., MgF2, LiF, or AlF3) immediately after deposition to prevent oxidation and preserve its far-ultraviolet (FUV) spectral efficiency. However, the resulting FUV reflectance of the aluminum reflector is limited by the metal-fluoride overcoat film index of refraction, morphology, stoichiometry, and its absorption cut-off in the lower end of the FUV spectra. Cryolite (sodium hexafluoroaluminate, Na3AlF6) emerges as a potential candidate to preserve the aluminum FUV reflectance due to its relatively lower index of refraction in the visible to ultraviolet; therefore, allowing for the thin-film design of highly spectral efficient reflectors over a wide spectral range. We investigate the use of cryolite in aluminum reflector FUV coating design. The deposited aluminum reflector overcoated with cryolite will be examined in terms of spectral efficiency and environmental durability. The deposited cryolite overcoat will be evaluated in terms of optical constants and structural properties. Preliminary results have shown that the use of cryolite as an overcoat to protect aluminum would yield unprecedented results as an optimal Hydrogen Lyman-alpha (HLyα) spectral line reflector, with experimental reflectance values >96%.

optical coatings↗

Cryolite Overcoated Aluminum Reflectors for Far-Ultraviolet Spectroscopy

Aluminum (Al) mirrors are conventionally protected with metal-fluoride coatings (e.g., MgF 2 , LiF, or AlF 3 ) immediately after deposition to prevent oxidation and preserve its far-ultraviolet (FUV) spectral efficiency. However, the resulting FUV reflectance of the aluminum reflector is limited by the metal-fluoride overcoat film index of refraction, morphology, stoichiometry, and its absorption cut-off in the lower end of the FUV spectra. Cryolite (sodium hexafluoroaluminate, Na 3 AlF 6 ) emerges as a potential candidate to preserve the aluminum FUV reflectance due to its relatively lower index of refraction in the visible to ultraviolet; therefore, allowing for the thin-film design of highly spectral efficient reflectors over a wide spectral range. We investigate the use of cryolite in aluminum reflector FUV coating design. The deposited aluminum reflector overcoated with cryolite will be examined in terms of spectral efficiency and environmental durability. The deposited cryolite overcoat will be evaluated in terms of optical constants and structural properties. Preliminary results have shown that the use of cryolite as an overcoat to protect aluminum would yield unprecedented results as an optimal Hydrogen Lyman-alpha (HLyα) spectral line reflector, with experimental reflectance values >96%.

optical coating↗

A New Method for Estimating the Single Scattering Phase Functions of Regolith Grains

Hapke's photometric model has been widely used in solar system remote sensing applications for nearly two decades. Recently, Hapke extended his model to describe the coherent-backscatter opposition effect and multiple-scattering by particles with anisotropic single particle phase functions (SPPF's). A practical difficulty for retrieving Hapke's model parameters from typical planet, satellite, and asteroid photometry data sets is that the model employs a large number of adjustable parameters (at least eight) that can be reliably constrained only for a small number of planetary data sets in which both disk-resolved and whole-disk observations are available from opposition to very large phase angles. The present work aims to reduce the number of adjustable parameters and preserve (or even enhance) the model's accuracy and usefulness by expressing Hapke's parameters in terms of more fundamental physical properties on which they mutually depend. The most difficult part of this task, described here, is to develop a simple method for computing the effective SPPF for structurally complex regolith grains from optical constants, grain-size distribution, and average regolith porosity. The development of light-scattering models for irregularly shaped particles is a large, complex subject and many sophisticated methods, such as Discrete Dipole Approximation (DDA) and Monte-Carlo simulations, have been explored elsewhere. Many of these methods are computationally intensive and probably impractical for routine substitution in Hapke's model. Here, progress is reported in developing a practical, semi-empirical method for estimating the directional scattering behavior (i.e. SPPF) of irregular regolith grains. The method employs Optical Transfer Function (OTF) techniques to model how the structural complexity of regolith particles broaden and attenuate the angular distribution of scattered light relative to that expected from ideal spherical particles of equivalent size and composition.

Helfenstein, P.↗

Polycyclic aromatic hydrocarbon optical properties and contribution to the acceleration of stellar outflows

The optical constants of four polycyclic aromatic hydrocarbon (PAH) molecules (benzene, pyrene, pentacene, and coronene) are determined from their measured laboratory absorption spectra. The Planck mean of the radiation pressure cross section is computed for each molecule and for amorphous carbon (AC) grains, and semiempirically estimated for large PAH molecules up to 400 carbon atoms. Assuming that PAHs are present in carbon-rich stellar outflows, the radiation pressure forces acting on them are calculated and compared with the radiation forces on AC particles. The results show that PAHs possess very different optical properties from AC grains. Small PAHs may experience an 'inverse greenhouse' effect in the inner part of the envelope, as they decouple from the gas close to the photosphere. The radiation pressure force on PAHs is always much less than the force at work on AC grains, and PAH molecules do not affect significantly the dynamics of the outflow.

Cherchneff, Isabelle↗