Simulations of Ion Migration in the LCLS RF Gun and Injector
The motivation for this work was the observed surface contamination of the first LCLS RF gun copper cathode. We will present the results of simulations in regards to ion migration in the LCLS gun. Ions of residual gases will be created by interaction of molecular gas species with the UV drive laser beam and by the electron beam itself. The larger part of those ionized molecules remain in the vicinity of creation, are transported towards beam line walls or away from the cathode. However a small fraction gains enough kinetic energy, focused by RF and magnetic fields and propagates to the cathode, producing an undesirable increase of the cathode's surface work function. Although this fraction is small, during long term operation, this effect may become a significant factor limiting the source performance.