Impact of symmetry on the ferroelectric properties of CaTiO 3 thin films
Epitaxial strain is a powerful tool to induce functional properties such as ferroelectricity in thin films of materials that do not possess ferroelectricity in bulk form. In this paper, a ferroelectric state was stabilized in thin films of the incipient ferroelectric, CaTiO 3 , through the careful control of the biaxial strain state and TiO 6 octahedral rotations. Detailed structural characterization was carried out by synchrotron x-ray diffraction and scanning transmission electron microscopy. CaTiO 3 filmsgrown on La 0.18 Sr 0.82 Al 0.59 Ta 0.41 O 3 (LSAT) and NdGaO 3 (NGO) substrates experienced a 1.1% biaxial strain state but differed in their octahedral tilt structures. A suppression of the out-of-plane rotations of the TiO 6 octahedral in filmsgrown on LSAT substrates resulted in a robust ferroelectricI4 mm phase with remnant polarization ~5 μC/cm 2 at 10 K and T c near 140 K. In contrast, filmsgrown on NGO substrates with significant octahedral tilting showed reduced polarization and T c . Finally, these results highlight the key role played by symmetry in controlling the ferroelectric properties of perovskite oxide thin films.