Automated homodyne analysis instrumentation for characterizing S.C. lasers
A versatile laser characterization method is described for evaluating semiconductor lasers developed under R&D efforts and also commercially available lasers. This method features a high-resolution technique for measuring laser linewidth that was also found to introduce optical feedback to the laser. The modified delayed self-homodyne system is therefore utilized to collect a variety of laser characteristic measurements under dynamic operating conditions while simultaneously assessing the effects of optical feedback on the laser. Measurements employing scanning Fabry-Perot interferometers are described which supplement the data obtained from direct measurements and measurements made utilizing the self-homodyne system.