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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.
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Pulse current source uses low loss, high reliability, LC circuits to provide the necessary high impedance for magnetic memory cores, frequently used in digital computational equipment. Square-loop reactors replace the semiconductor switches previously used.
High reliability solid cryogen refrigeration system consists of a container initially filled with a solid cryogen which is coupled thermally to an infrared detector by means of a link of high thermal conductivity extending from a heat exchanger within the cryogen container.
New fundamental technique of reliability prediction for semiconductor diodes based on realistic mathematical models can be applied to component failure rate prediction including mechanical degradation, electrical degradation, environmental stress factors, and electrical load stress factors.
Reliability and prognostic validity of serial electrocardiograms in men over 24 year period, and relationship of observed changes to pathological or physiological variables
Fast scan infrared microscope for measuring thermal and electromechanical parameters affecting reliability of microelectronic devices
Distribution plots of electrical parameters as means of investigating potential reliability of integrated circuits
High reliability specification for digital integrated circuits
Geographical location and optical path length effects upon fade margin required for desired propagation reliability of microwave signals
Operational computerized system for automatic surveillance of reliability and maintainability of spacecraft hardware
Graphic optimization technique for mass reduction in solar powered ion propulsion system with acceptable reliability constraint
Reliability assessment test program for determining capabilities and limitations of 2 kw hydrogen-oxygen fuel cell stacks
Mechanized data reduction system has been designed to take advantage of the data handling capacity of computers and to reduce voluminous and unrelated test and performance data to a format useful for the rapid analysis of electronic component reliability.
Simple, reliable, inexpensive method for gross-leak testing has been devised, based upon the conventional fine-leak technique. The sensitivity ranges from the detection of very large leaks down to leaks of 10 to the minus seven cc helium per sec.
Global point-to-point communications system network ground station reliability analyses
Ground tracking reliability data for Gemini flights 9/9A, 10, 11, and 12
Factors and procedures influencing statistical reliability of agricultural data from earth orbiting sensor systems
Reliability assessment for fuel cell stack performance under high stress conditions
Reliability of integrated circuits and discrete components of electronics for computer and dormant module for Minuteman 2