Accurate Refinement of the Crystal Structure of Ba{sub 3}TaGa{sub 3}Si{sub 2}O{sub 14} from Langasite Family and Analysis of Structural Transformations Due to Isomorphous Cation Substitutions
An accurate structure analysis of a Ba{sub 3}TaGa{sub 3}Si{sub 2}O{sub 14} single crystal from langasite family was performed using four X-ray diffraction data sets collected on a diffractometer equipped with a CCD area detector (sp. gr. P321, Z = 1, sinθ/λ ≤ 1.35 Å{sup –1}; at 295 K a = 8.516(1) Å, c = 5.1910(6) Å, R/wR = 0.58/0.56%, Δρ{sub min}/Δρ{sub max} =–0.73/0.42 e/Å{sup 3}, 4414 independent reflections; at 106 K a = 8.5109(9) Å, c = 5.1861(9) Å, R/wR = 0.75/0.86%, Δρ{sub min}/Δρ{sub max} =–0.81/1.06 e/Å{sup 3}, 4382 reflections). The distinguishing feature of the Ba{sub 3}TaGa{sub 3}Si{sub 2}O{sub 14} structure is a strong disorder of the Ga atom at the 3f site. Structural transformations in the series of Сa{sub 3}TaGa{sub 3}Si{sub 2}O{sub 14}–Sr{sub 3}TaGa{sub 3}Si{sub 2}O{sub 14}–Ba{sub 3}TaGa{sub 3}Si{sub 2}O{sub 14}–Ba{sub 3}TaFe{sub 3}Si{sub 2}O{sub 14} crystals were analyzed.