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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 1,585 records · Page 88
All sourcesNASA NTRSDOE OSTI
NASA NTRS1972

Studies relating to FM television and telemetry transmitters

The Auburn University Model S-2 FM television transmitter was examined to determine if the performance and reliability could be improved by application of new techniques and devices developed since completion of the original design work. In particular this study examined the possibility of increased use of integrated circuits. It was determined that improvements in both performance and reliability were possible. In addition a study was conducted to determine the feasibility of converting the transmitter to handle telemetry signals. The study revealed that this conversion was feasible and the modifications were made to the prototype model for verification.

Albritton, W. P.↗
NASA NTRS1972

Prototype data terminal: Multiplexer/demultiplexer

The design and operation of a quad redundant data terminal and a multiplexer/demultiplexer (MDU) design are described. The most unique feature is the design of the quad redundant data terminal. This is one of the few designs where the unit is fail/op, fail/op, fail/safe. Laboratory tests confirm that the unit will operate satisfactorily with the failure of three out of four channels. Although the design utilizes state-of-the-art technology. The waveform error checks, the voting techniques, and the parity bit checks are believed to be used in unique configurations. Correct word selection routines are also novel, if not unique. The MDU design, while not redundant, utilizes, the latest state-of-the-art advantages of light couplers and integrated circuit amplifiers.

Leck, D. E.↗
NASA NTRS1973

Coaxial inverted geometry transistor having buried emitter

The invention relates to an inverted geometry transistor wherein the emitter is buried within the substrate. The transistor can be fabricated as a part of a monolithic integrated circuit and is particularly suited for use in applications where it is desired to employ low actuating voltages. The transistor may employ the same doping levels in the collector and emitter, so these connections can be reversed.

Hruby, R. J.↗
NASA NTRS1972

A very high speed hard decision sequential decoder.

Description of a 40-megabit-per-second hard decision sequential decoder which employs the fastest commercially available digital integrated circuits - MECL III. With this decoder an internal computational rate of 70,000,000 computations per second has been achieved. The computational efficiency of the decoding algorithm has been improved by incorporating two modifications to the Fano algorithm - namely, 'double quick threshold loosening' and 'diagonal steps.' On the basis of preliminary results, an output error rate of 0.00001 can be achieved with E sub b/N sub zero less than 5.4 dB at data rates up to 40 megabits per second. The very high internal operating speed of the decoder represents a factor of five increase in speed over any previous sequential decoder.

Gilhousen, K. S.↗
NASA NTRS1972

A very high speed hard decision sequential decoder.

Description of a 40-Mbps hard-decision sequential decoder for high-data-rate coding systems for earth-orbiting space missions with power-limited links. A prototype decoder has been designed and fabricated using the fastest commercially available digital integrated circuits, MECL III. Thus far, an internal computational rate of 70 million computations per second has been achieved. Computational efficiency of the decoding algorithm was greatly improved by incorporating two modifications to the Fano algorithm - 'double quick threshold loosening' and 'diagonal steps.' Preliminary results indicate that an output error rate of 0.00001 can be achieved with E sub b/N sub zero less than 5.4 dB at data rates up to 40 Mbps. At lower data rates, even less signal energy is required. This decoder is believed to be at least five times faster than any previous sequential decoder.

Gilhousen, K. S.↗
NASA NTRS1975

Straight-line IC removal tool

Tool operates by applying force perpendicularly to socket plane. Tool can be operated in cramped or confined quarters and can effect integrated circuit removal without damage. It may also be useful to hold nut or bolt in confined space while tightening, when it is not possible to use conventional tool.

Marzek, R. A.↗
NASA NTRS1973

Methods of Measurement for Semiconductor Materials, Process Control, and Devices

The development of methods of measurement for semiconductor materials, process control, and devices is reported. Significant accomplishments include: (1) Completion of an initial identification of the more important problems in process control for integrated circuit fabrication and assembly; (2) preparations for making silicon bulk resistivity wafer standards available to the industry; and (3) establishment of the relationship between carrier mobility and impurity density in silicon. Work is continuing on measurement of resistivity of semiconductor crystals; characterization of generation-recombination-trapping centers, including gold, in silicon; evaluation of wire bonds and die attachment; study of scanning electron microscopy for wafer inspection and test; measurement of thermal properties of semiconductor devices; determination of S-parameters and delay time in junction devices; and characterization of noise and conversion loss of microwave detector diodes.

Bullis, W. M.↗
NASA NTRS1973

The NASA computer aided design and test system

A family of computer programs facilitating the design, layout, evaluation, and testing of digital electronic circuitry is described. CADAT (computer aided design and test system) is intended for use by NASA and its contractors and is aimed predominantly at providing cost effective microelectronic subsystems based on custom designed metal oxide semiconductor (MOS) large scale integrated circuits (LSIC's). CADAT software can be easily adopted by installations with a wide variety of computer hardware configurations. Its structure permits ease of update to more powerful component programs and to newly emerging LSIC technologies. The components of the CADAT system are described stressing the interaction of programs rather than detail of coding or algorithms. The CADAT system provides computer aids to derive and document the design intent, includes powerful automatic layout software, permits detailed geometry checks and performance simulation based on mask data, and furnishes test pattern sequences for hardware testing.

Gould, J. M.↗
NASA NTRS1973

Parts, materials, and processes experience summary, volume 2

This summary provides the general engineering community with the accumulated experience from ALERT reports issued by NASA and the Government-Industry. Data Exchange Program, and related experience gained by Government and industry. It provides expanded information on selected topics by relating the problem area (failure) to the cause, the investigation and findings, the suggestions for avoidance (inspections, screening tests, proper part applications, requirements for manufacturer's plant facilities, etc.), and failure analysis procedures. Diodes, integrated circuits, and transistors are covered in this volume.

Source record↗
NASA NTRS1972

Optimization in the design of a 12 gigahertz low cost ground receiving system for broadcast satellites. Volume 1: System design, performance, and cost analysis

The technical and economical feasibility of using the 12 GHz band for broadcasting from satellites were examined. Among the assigned frequency bands for broadcast satellites, the 12 GHz band system offers the most channels. It also has the least interference on and from the terrestrial communication links. The system design and analysis are carried out on the basis of a decision analysis model. Technical difficulties in achieving low-cost 12 GHz ground receivers are solved by making use of a die cast aluminum packaging, a hybrid integrated circuit mixer, a cavity stabilized Gunn oscillator and other state-of-the-art microwave technologies for the receiver front-end. A working model was designed and tested, which used frequency modulation. A final design for the 2.6 GHz system ground receiver is also presented. The cost of the ground-terminal was analyzed and minimized for a given figure-of-merit (a ratio of receiving antenna gain to receiver system noise temperature). The results were used to analyze the performance and cost of the whole satellite system.

Ohkubo, K.↗
NASA NTRS1973

High bit rate mass data storage device

The HDDR-II mass data storage system consists of a Leach MTR 7114 recorder reproducer, a wire wrapped, integrated circuit flat plane and necessary power supplies for the flat plane. These units, with interconnecting cables and control panel are enclosed in a common housing mounted on casters. The electronics used in the HDDR-II double density decoding and encoding techniques are described.

Source record↗
NASA NTRS1973

Design, development, and fabrication of a electronic analog microminiaturized electronic analog signal to discrete time interval converter

The microminiaturization of an electronic analog signal to discrete time interval converter is presented. Discrete components and integrated circuits comprising the converter were assembled on a thin-film ceramic substrate containing nichrome resistors with gold interconnections. The finished assembly is enclosed in a flat package measuring 3.30 by 4.57 centimeters. The module can be used whenever conversion of analog to digital signals is required, in particular for the purpose of regulation by means of pulse modulation. In conjunction with a precision voltage reference, the module was applied to control the duty cycle of a switching regulator within a temperature range of -55 C to +125 C, and an input voltage range of 10V to 35V. The output-voltage variation was less than + or - 300 parts per million, i.e., less than + or - 3mV for a 10V output.

Schoenfeld, A. D.↗
NASA NTRS1974

Diffused optical waveguides

Diffused optical waveguides are studied using the modal and the ray tracing approach, with an emphasis on the case of a hollow waveguide with diffuse cladding. The properties of the guided modes are investigated in detail. The applications of these structures to optical circuits, integrated optics lasers and capillary gas lasers are discussed.

Elachi, C.↗
NASA NTRS1975

Fourier waveform analyzer

Real-time Fourier analysis is provided by "bucket brigade' charge-transfer shift register. Device is small, inexpensive integrated circuit which does analog-to-digital-to-analog conversion, data processing, and time delay.

Sutton, J. F.↗
NASA NTRS1975

Heat pipes

The development and use of heat pipes are described, including space requirements and contributions. Controllable heat pipes, and designs for automatically maintaining a selected constant temperature, are discussed which would add to the versatility and usefulness of heat pipes in industrial processing, manufacture of integrated circuits, and in temperature stabilization of electronics.

Source record↗
NASA NTRS1975

Research on pressure sensors for biomedical instruments

The development of a piezo-resistive pressure transducer is discussed suitable for recording pressures typically encountered in biomedical applications. The pressure transducer consists of a thin silicon diaphragm containing four strain-sensitive resistors, and is fabricated using silicon monolithic integrated-circuit technology. The pressure transducers can be as small as 0.7 mm outer diameter, and are, as a result, suitable for mounting at the tip of a catheter. Pressure-induced stress in the diaphragm is sensed by the resistors, which are interconnected to form a Wheatstone bridge.

Angell, J. B.↗
NASA NTRS1975

Failure analysis of electronic parts: Laboratory methods

Failure analysis test methods are presented for use in analyzing candidate electronic parts and in improving future design reliability. Each test is classified as nondestructive, semidestructive, or destructive. The effects upon applicable part types (i.e. integrated circuit, transitor) are discussed. Methodology is given for performing the following: immersion tests, radio graphic tests, dewpoint tests, gas ambient analysis, cross sectioning, and ultraviolet examination.

Anstead, R. J.↗