Scanning electron mirror microscopy and scanning electron microscopy of integrated circuits.
Scanning electron mirror microscope advantages over electron mirror and scanning electron microscopes for examining integrated circuits
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Scanning electron mirror microscope advantages over electron mirror and scanning electron microscopes for examining integrated circuits
Al interconnections discontinuities at integrated circuit contact windows observed by scanning electron microscope, noting catastrophic failure and Si presence
Network Analysis for Systems Application Program development for batch and on-line solution of circuit problems
Time varying resistance wire to arrest oscillations in pulsed capacitor discharge circuit, deriving over, under and critical damping conditions
Si integrated circuits single and composite layered metallization systems, comparing characteristics of various refractory and noble metals
Miniaturized circuit improves measurement of radiation dose absorbed in a scintillation crystal. The temperature coefficient of the field-effect transistor gate-source voltage in the isolation amplifier can be readily controlled.
Printed circuit board has a thermal coefficient of expansion similar to that of the electronic component leads. High-expansion composite materials are sandwiched between the outer layers of copper and woven fiber glass.
Cold testing method prevents formation of frost on printed circuit boards and part holders during testing at sub-zero temperatures. Freon permits rapid attainment of the required testing temperature.
Ferric chloride in an aqueous medium etches copper from the surface of printed-circuit boards. Ferric ions are reduced to ferrous ions resulting in a reduced etching rate.
Averaging circuit provides a secondary control signal during inoperative periods of an intermittent primary control system. It can also provide an average pulse rate over a fixed time interval, such as in a digital frequency meter.
Feedback loop, which contains an inductor in series with a saturable reactor, is added to a standard inverter circuit to permit the inverter power transistors to be switched in a controlled and efficient manner. This inverter is applicable where the power source has either high or low impedance properties.
Self-checking technique detects defective solid state modules used in electronic test and checkout instrumentation. A ten bit register provides failure monitor and indication for 1023 comparator circuits, and the automatic fault-isolation capability permits the electronic subsystems to be repaired by replacing the defective module.
Circuit breaker consists of a preset current amplitude sensor, and a lamp-photo-resistor combination in a feedback arrangement which energizes a power switching relay. The ac input power is removed from the load at predetermined current amplitudes.
Circuitry requires modulated subcarrier to be split, part going to a phase modulator, and part going to a new circuit which utilizes a square law detector, a balanced mixer, and an amplifier to remove spurious sidebands. A summer recombines the two outputs, and final signal no longer includes spures.
Techniques for preparing printed circuit boards are used to provide an alternate method for producing panel symbology for ground computer test trap. After processing, the panel unit is either solder or gold plated.
Alternating current circuit breaker is suitable for reliable long-term service at 1000 deg F in the vacuum conditions of outer space. Construction materials are resistant to nuclear radiation and vacuum welding. Service test conditions and results are given.
Multichip hybrid fabrication techniques for prototype function generator circuits
Quasi-optical circuit techniques in varactor multipliers