Process techniques study of integrated circuits Interim scientific report, May 1968 - Feb. 1969
Oxide defects and shear stress effects in integrated circuits
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Oxide defects and shear stress effects in integrated circuits
Dielectric defects in oxide layers by ion migration, and hydrogen effects on integrated circuits with packaging considerations
Gyrator tuned circuit amplifier and microcircuit interconnections
Power control switching circuit using low voltage semiconductor controlled rectifiers for high voltage isolation
Spark gap type protective circuit for fast sensing and removal of overvoltage conditions
Microstrip transmission line integrated circuits on semiinsulating GaAs substrates, showing feasibility at millimeter wave frequencies
Algorithms for linear system of first order differential equations, emphasizing equations associated with computer oriented circuit design
Magnetic core logic circuit system for bidirectional stepping motor drive voltage power supply control in proper phase and time sequence
Current mode amplifier circuit used with carbon resistors for measuring low flow rates of liquid hydrogen from small containers
Square loop magnetic core model for computer aided circuit transient analysis
Silicon double injection diode, discussing HF noise measurement, Nyquist noise equivalent circuit for double injection process and source of LF noise
Small signal coupled mode analysis including relativistic effects for studying spiraling electron beam interaction with fast wave circuits
Precision monolithic circuits fabrication techniques, describing differential amplifier design incorporating emitter feedback and direct DC errors compensation
In-circuit diodes testing by semiautomatic low current regulated voltage test set
Photoconductor open circuit voltage determination, calculating responsivity and sensitivity of actual and ideal cases
Bias circuit LF oscillations in short Gunn devices, analyzing sinusoidal and relaxation oscillations and stable bias in terms of terminal I-V characteristics
Computer determination of symbolic state equations for nonlinear circuits using FORTRAN notation
Arbitrary single gate failures diagnosis in combinational logic circuits not requiring fault table construction