Quantile-based bias correction and uncertainty quantification of extreme event attribution statements
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Here, operando X-ray transient absorption measurements were successfully performed for the first time on the Co-Pi catalyst, confirming a photoreduction in Co-Pi under 400 nm blue light excitation. This provides key insights into spectroelectrochemical mechanistic studies of relevant oxygen evolution catalysts and guidance for photocatalysis using these metal oxides. Limiting blue-light exposure of these films should allow for better self-healing and higher turnover in photon-driven water oxidation. These results also demonstrate the importance of performing XTA measurements under operating conditions. Further development of this technique will allow for analysis of complex materials such as tethered molecules on surfaces and in complex device architectures to yield beneficial data for applied materials.
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Quantum dots are semiconductor crystals that are less than 100 nanometers in size; that is, between 1 billionth and 100 billionths of a meter. They can be composed of one semiconductor material or a core of one semiconductor surrounded by a shell of another. The quantum dots studied in this work consisted of a cadmium selenide core surrounded by a cadmium sulfide shell. When a quantum dot is illuminated with light, some of it can be absorbed and excites the quantum dot to a higher energy state. To relax back down to its resting state, light can be emitted in the form of fluorescence. The nature of the fluorescence that is emitted from a single quantum dot differs from that which is emitted from a bulk sample (usually a solid film or a solution of quantum dots). While in bulk samples the fluorescence over time fluctuates randomly about some average, maintaining a continuous average intensity, single quantum dot fluorescence switches between two or more intensities. This phenomenon is referred to as quantum dot blinking, and its origin is of significant relevance to solar cell, light emitting diode and biological tracking applications. Quantum dot blinking can be studied by exciting an isolated quantum dot with light and recording the ensuing fluorescence using sensitive detectors. This is done over many minutes, resulting in a fluorescence intensity (in counts per second) versus time trajectory. These trajectories must be further analyzed in order to understand the nature of the blinking behavior. Conventionally, a bin and threshold analysis is used, whereby the arrival times of fluorescent photons are binned to reduce the signal noise, and a threshold is used to separate the trajectory into periods of high and low fluorescence. In this study, the effects of bin size and threshold on the blinking kinetics were investigated, and the assumption that there is only one bright and one dark state was tested. To do so, a statistically rigorous method called change point analysis was needed which does not require binning and which can determine the number of intensity levels present. Blinking in 17 quantum dots was studied using both analysis methods. The primary parameter that was compared between the two methods is called a truncation time. Increasing the bin size was found to generally lead to a larger truncation time while increasing the threshold always decreased the truncation time. Using the change point analysis method, 12 out of 17 quantum dots were found to exhibit more than two intensity levels. Lastly, the assumption that only two intensity levels exist was found to significantly affect the blinking statistics: when individual levels were combined into one bright level, the truncation time would increase. The change point analysis method was found to be more suitable for studying multilevel blinking in quantum dots than the conventional bin and threshold method, since the effects of binning and thresholding can be alleviated and the two-level assumption relaxed.
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Theory predicts that a large spontaneous electric polarization and concomitant inversion symmetry breaking in GeSe monolayers result in a strong shift current in response to their excitation in the visible range. Shift current is a coherent displacement of electron density on the order of a lattice constant upon above-bandgap photoexcitation. A second-order nonlinear effect, it is forbidden by the inversion symmetry in the bulk GeSe crystals. In our paper, we use terahertz (THz) emission spectroscopy to demonstrate that ultrafast photoexcitation with wavelengths straddling both edges of the visible spectrum, 400 and 800 nm, launches a shift current in the surface layer of a bulk GeSe crystal, where the inversion symmetry is broken. The direction of the surface shift current determined from the observed polarity of the emitted THz pulses depends only on the orientation of the sample and not on the linear polarization direction of the excitation. Strong absorption by the low-frequency infrared-active phonons in the bulk of GeSe limits the bandwidth and the amplitude of the emitted THz pulses. We predict that reducing GeSe thickness to a monolayer or a few layers will result in a highly efficient broadband THz emission. Experimental demonstration of THz emission by the surface shift current in bulk GeSe crystals puts this 2D material forward as a candidate for next-generation shift current photovoltaics, nonlinear photonic devices, and THz sources.
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