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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 145 records · Page 8
All sourcesNASA NTRSDOE OSTI
NASA NTRS1994

Operating in the space plasma environment: A spacecraft charging study of the Solar X-ray Imager

This study presents the results of a spacecraft charging effects protection study conducted on the Solar X-ray Imager (SXI). The SXI is being developed by NASA Marshall Space Flight Center for NOAA's Space Environment Laboratory, and will be used to aid in forecasting energetic particle events and geomagnetic storms. Images will provide information on the intensity and location of solar flares, coronal mass ejections, and high speed solar streams. The SXI will be flown on a next-generation GOES sometime in the mid to late 1990's. Charging due to the encounter with a worst-case magnetic substorm environment is modeled using the NASCAP/GEO computer code. Charging levels of exterior surfaces and the floating potential of the spacecraft relative to plasma are determined as a function of spacecraft design, operational configuration, and orbital conditions. Areas where large surface voltage gradients exist on or near the SXI are identified as possible arc-discharge sites. Results of the charging analysis are then used to develop design recommendations that will limit the effects of spacecraft charging on the SXI operation.

Herr, Joel L.↗
DOE OSTI2023

Atomic motifs govern the decoration of grain boundaries by interstitial solutes

Abstract Grain boundaries, the two-dimensional defects between differently oriented crystals, tend to preferentially attract solutes for segregation. Solute segregation has a significant effect on the mechanical and transport properties of materials. At the atomic level, however, the interplay of structure and composition of grain boundaries remains elusive, especially with respect to light interstitial solutes like B and C. Here, we use Fe alloyed with B and C to exploit the strong interdependence of interface structure and chemistry via charge-density imaging and atom probe tomography methods. Direct imaging and quantifying of light interstitial solutes at grain boundaries provide insight into decoration tendencies governed by atomic motifs. We find that even a change in the inclination of the grain boundary plane with identical misorientation impacts grain boundary composition and atomic arrangement. Thus, it is the smallest structural hierarchical level, the atomic motifs, that controls the most important chemical properties of the grain boundaries. This insight not only closes a missing link between the structure and chemical composition of such defects but also enables the targeted design and passivation of the chemical state of grain boundaries to free them from their role as entry gates for corrosion, hydrogen embrittlement, or mechanical failure.

36 MATERIALS SCIENCE↗
DOE OSTI2022

Probing charge density in materials with atomic resolution in real space

The charge distribution in materials at the nanoscale can often explain the origin of macroscopic properties such as localized conductivity or the plasmonic response and illuminate more fundamental changes in the microscopic structure such as changes in chemical bonding characteristics. Previously, direct visualization of the charge density with high spatial resolution was often a missing link in the formation of structure–property relationships, especially in heterogeneous materials systems. Furthermore, recent advancements in microscopy technology have enabled researchers to visualize the charge distribution in materials down to subatomic length scales. In this Technical Review, we discuss the developments in high-resolution real-space charge distribution imaging using diffraction techniques and electron microscopy, with a focus on the recent advancement of four-dimensional scanning transmission electron microscopy, electron holography, and applications to materials interfaces.

Electronic properties and materials↗
DOE OSTI2022

Photoelectron spectroscopy in molecular physical chemistry

Photoelectron spectroscopy has long been a powerful method in the toolbox of experimental physical chemistry and molecular physics. Recent improvements in coincidence methods, charged-particle imaging, and electron energy resolution have greatly expanded the variety of environments in which photoelectron spectroscopy can be applied, as well as the range of questions that can now be addressed. In this Perspectives Article, we focus on selected recent studies that highlight these advances and research areas. Furthermore, the topics include reactive intermediates and new thermochemical data, high-resolution comparisons of experiment and theory using methods based on pulsed-field ionisation (PFI), and the application of photoelectron spectroscopy as an analytical tool to monitor chemical reactions in complex environments, like model flames, catalytic or high-temperature reactors.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗
NASA NTRS1979

Reliability of imaging CCD's

Report on reliability of imaging charge-coupled devices (CCD's) is intended to augment rather-meager existing information on CCD reliability. Study focuses on electrical and optical performance tests, packaging constraints, and failure modes of one commercially available device (Fairchild CCD121H).

Beal, J. R.↗
NASA NTRS1977

Charge coupled devices for intensified imager applications

Three types of CCD sensors have been successfully incorporated into ICCD (intensified CCD) tubes. Intensifier tubes of varying design and application have been manufactured by three different manufacturers. Typical characteristics of the thinned CCDs incorporated into these ICCD's will be presented. Problems concerning the compatibility of tube processing and CCD performance will be discussed, as well as the procedures used to minimize CCD degradation during tube processing. ICCD tube characteristics will also be presented.

Stubbs, D. P.↗
NASA NTRS1981

Development of a Shuttle Infrared Telescope Facility /SIRTF/ fine guidance sensor

Fine guidance technology development for the Shuttle Infrared Telescope Facility (SIRTF) centers upon the use of a single multiple-star-tracking sensor to provide the position information necessary to produce three-axis attitude control signals for precision payload pointing. The effort described in this paper is concerned with the development of a fine guidance sensor that employs a high-density charge-coupled imaging device for producing position information signals by using star fields. Multiple star position information produces three-axis position error signals that are used to update inertial reference gyros. The sensor employs advanced position interpolation algorithms to enhance field-of-view resolution and to correct for optical aberrations inherent in spatially chopped star images resulting from the telescope's movable secondary mirror. Operation of the sensor is under the control of a high-performance microcomputer that provides both autonomy and flexibility in a guidance application.

Salomon, P. M.↗
NASA NTRS1982

Visible charge-coupled device (CCD) focal plane design considerations for multispectral applications

The typical Multispectral Linear Array (MLA) Instrument mission would be to gather high-resolution, radiometrically accurate earth resources data in several spectral bands over a prolonged period of time. These bands would include the visible (VIS), near infrared (NIR) and short wavelength infrared. Silicon charge-coupled imaging devices (CCDs) can be assembled into contiguous pixel focal planes which will cover the VIS/NIR region and operate reliably for several years in a space environment. A typical MLA focal plane would have approximately 12,000 pixels, with a pixel-to-pixel registration requirement on the order of + or - 0.1 pixel. The technology to assemble such focal planes has been developed and is described. The problem of polarization sensitivity associated with certain types of focal plane assemblies is addressed. Radiation effects on CCDs are also discussed, and a practical solution to the problem through the use of shielding is described.

Sadowski, H.↗
NASA NTRS1991

Significant reduction in arc frequency biased solar cells: Observations, diagnostics, and mitigation technique(s)

A variety of experiments were performed which identify key factors contributing to the arcing of negatively biased high voltage solar cells. These efforts have led to reduction of greater than a factor of 100 in the arc frequency of a single cell following proper remediation procedures. Experiments naturally lead to and focussed on the adhesive/encapsulant that is used to bond the protective cover slip to the solar cell. An image-intensified charge coupled device (CCD) camera system recorded UV emission from arc events which occurred exclusively along the interfacial edge between the cover slip and the solar cell. Microscopic inspection of this interfacial region showed a bead of encapsulant along this entire edge. Elimination of this encapsulant bead reduced the arc frequency by two orders of magnitude. Water contamination was also identified as a key contributor which enhances arcing of the encapsulant bead along the solar cell edge. Spectrally resolved measurements of the observable UV light shows a feature assignable to OH(A-X) electronic emission, which is common for water contaminated discharges. Experiments in which the solar cell temperature was raised to 85 C showed a reduced arcing frequency, suggesting desorption of H2O. Exposing the solar cell to water vapor was shown to increase the arcing frequency. Clean dry gases such as O2, N2, and Ar show no enhancement of the arcing rate. Elimination of the exposed encapsulant eliminates any measurable sensitivity to H2O vapor.

Upschulte, B. L.↗
NASA NTRS1992

Coded aperture devices for viewing extended objects from space

Coded aperture sensors for photons or energetic neutral atoms (ENAs), which incorporate FOV limiters and subdivide the object field into a number of elements which is smaller than the number of detector pixels, are described. A least squares fit to the data is made in reconstructing the object field. To evaluate the optics and reconstruction algorithms, two 'breadboard' sensors have been constructed, one based on a film camera and the other upon a UV-light sensitive microchannel plate detector system. Results obtained thus far show that the concept is viable, and no special difficulties should be encountered in adapting the detector geometries to neutral particle imaging systems. Charged particle deflection plates could be incorporated into the region between the FOV limiter and the aperture, or installed ahead of the limiter.

Curtis, C. C.↗
NASA NTRS2002

Performance of the Microwave Anisotropy Probe AST-201 Star Trackers

The Microwave Anisotropy Probe (MAP) was launched to create a full-sky map of the cosmic microwave background. MAP incorporates two modified Lockheed Martin AST-201 (Autonomous Star Tracker) star trackers. The AST-201 employs an eight element radiation hardened lens assembly which is used to focus an image on a charge coupled device (CCD). The CCD image is then processed by a star identification algorithm which outputs a three-axis attitude. A CCD-shift algorithm called Time Delayed Integration (TDI) was also included in each star tracker. In order to provide some radiation effect filtering during MAP's three to five phasing loop passes through the Van Allen radiation belts, a simple pixel filtering scheme was implemented, rather than using a more complex, but more robust windowing algorithm. The trackers also include a fiber optic data interface. This paper details the ground testing that was accomplished on the MAP trackers.

Ward, David K.↗
DOE OSTI2020

Apparatus, method and system for imaging and utilization of SEM charged particles

A scanning electron microscope (SEM) system includes an SEM objective that emits an electron beam toward a sample, causing emission of charged particles including secondary electrons, Auger electrons, backscattered electrons, anions and cations. The SEM system includes electron optics elements that are configured to establish electric fields around the sample that accelerate charged particles toward a detector. A two-dimensional distribution of locations of incidence of the charged particles on the detector is indicative of energies of the charged particles and their emission angles from the sample. A three-dimensional spatial distribution of charged particles emitted from the sample is recovered by performing an Abel transform over the distribution on the detector. The energies and emission angles of the charged particles are then determined from the three-dimensional spatial distribution.

42 ENGINEERING↗
NASA NTRS1995

Active pixel sensor with intra-pixel charge transfer

An imaging device formed as a monolithic complementary metal oxide semiconductor integrated circuit in an industry standard complementary metal oxide semiconductor process, the integrated circuit including a focal plane array of pixel cells, each one of the cells including a photogate overlying the substrate for accumulating photo-generated charge in an underlying portion of the substrate, a readout circuit including at least an output field effect transistor formed in the substrate, and a charge coupled device section formed on the substrate adjacent the photogate having a sensing node connected to the output transistor and at least one charge coupled device stage for transferring charge from the underlying portion of the substrate to the sensing node.

Fossum, Eric R.↗
NASA NTRS2003

Active pixel sensor with intra-pixel charge transfer

An imaging device formed as a monolithic complementary metal oxide semiconductor integrated circuit in an industry standard complementary metal oxide semiconductor process, the integrated circuit including a focal plane array of pixel cells, each one of the cells including a photogate overlying the substrate for accumulating photo-generated charge in an underlying portion of the substrate, a readout circuit including at least an output field effect transistor formed in the substrate, and a charge coupled device section formed on the substrate adjacent the photogate having a sensing node connected to the output transistor and at least one charge coupled device stage for transferring charge from the underlying portion of the substrate to the sensing node.

Fossum, Eric R.↗
NASA NTRS2004

Active pixel sensor with intra-pixel charge transfer

An imaging device formed as a monolithic complementary metal oxide semiconductor integrated circuit in an industry standard complementary metal oxide semiconductor process, the integrated circuit including a focal plane array of pixel cells, each one of the cells including a photogate overlying the substrate for accumulating photo-generated charge in an underlying portion of the substrate, a readout circuit including at least an output field effect transistor formed in the substrate, and a charge coupled device section formed on the substrate adjacent the photogate having a sensing node connected to the output transistor and at least one charge coupled device stage for transferring charge from the underlying portion of the substrate to the sensing node.

Fossum, Eric R.↗
NASA NTRS1976

Linear charge coupled device detector array for imaging light propagating in an integrated thin-film optical waveguide

Device design, fabrication, and operation of a linear charge coupled device (CCD) detector array integrated with a thin film optical waveguide and applications of this structure to integrated optical signal processing and fiber optical communications were discussed. A two phase, overlapping-gate CCD is connected in parallel by means of a series of gates to an array of photodiodes. The photodiode provides an electrode free surface region so that a highly efficient waveguide detector coupling technique can be implemented. A thermally-oxidized layer of SiO2 forms an effective substrate for the optical waveguide.

Chen, C. L.↗
NASA NTRS2004

Event-Driven Random-Access-Windowing CCD Imaging System

A charge-coupled-device (CCD) based high-speed imaging system, called a realtime, event-driven (RARE) camera, is undergoing development. This camera is capable of readout from multiple subwindows [also known as regions of interest (ROIs)] within the CCD field of view. Both the sizes and the locations of the ROIs can be controlled in real time and can be changed at the camera frame rate. The predecessor of this camera was described in High-Frame-Rate CCD Camera Having Subwindow Capability (NPO- 30564) NASA Tech Briefs, Vol. 26, No. 12 (December 2002), page 26. The architecture of the prior camera requires tight coupling between camera control logic and an external host computer that provides commands for camera operation and processes pixels from the camera. This tight coupling limits the attainable frame rate and functionality of the camera. The design of the present camera loosens this coupling to increase the achievable frame rate and functionality. From a host computer perspective, the readout operation in the prior camera was defined on a per-line basis; in this camera, it is defined on a per-ROI basis. In addition, the camera includes internal timing circuitry. This combination of features enables real-time, event-driven operation for adaptive control of the camera. Hence, this camera is well suited for applications requiring autonomous control of multiple ROIs to track multiple targets moving throughout the CCD field of view. Additionally, by eliminating the need for control intervention by the host computer during the pixel readout, the present design reduces ROI-readout times to attain higher frame rates. This camera (see figure) includes an imager card consisting of a commercial CCD imager and two signal-processor chips. The imager card converts transistor/ transistor-logic (TTL)-level signals from a field programmable gate array (FPGA) controller card. These signals are transmitted to the imager card via a low-voltage differential signaling (LVDS) cable assembly. The FPGA controller card is connected to the host computer via a standard peripheral component interface (PCI).

Monacos, Steve↗