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At least 145 records · Page 8

Technologies to Enable the Next Great Observatory

The Large Ultraviolet/Optical/Infrared Surveyor (LUVOIR) is one of four mission concepts being studied by NASA for the 2020 Decadal Survey in Astronomy and Astrophysics. LUVOIR will be capable of a broad range of science, including: direct imaging and characterization of a wide range of exoplanets and the search for biosignatures on Earth-like planets around sun-like stars; studying galaxy formation and evolution; investigating star and planet formation; and remote sensing of bodies within the Solar System. Enabling a mission as ambitious as LUVOIR requires an array of technologies, such as ultra-stable structures and optics, precision metrology and wavefront sensing, high-contrast imaging techniques, large-format detectors with very low noise, and high-throughput ultraviolet instrumentation. Critically, a systems-level approach must be taken to developing these technologies, guided by architecture studies to place each technology in the appropriate system context.In this poster, we describe LUVOIR's technology needs, as well as current efforts that are actively developing these technologies. We will discuss recent advancements in: measuring picometer-level displacements of optical and structural elements; sub-milli-kelvin thermal sensing and control; non-contact vibration isolation for pointing and dynamic stability; coronagraph design for achieving 10-10 contrast on a segmented system; high-speed metrology for optical system alignment; low-order and out-of-band wavefront sensing for maintaining high-contrast images; low-noise detectors across the ultraviolet, optical, and near infrared bands; broadband coatings with high-reflectivity below Ly. We will also describe a systems approach to coordinating the development of these technologies to achieve the necessary maturity for a LUVOIR mission start in the next decade.

space telescopes↗

Ground Truth for CSP Mirror Metrology (Full-Length)

The high optical accuracy required for concentrating solar power (CSP) systems in turn requires accurate metrology to assess mirror optical parameters during design, manufacturing, and operation. To meet this need, researchers have developed a variety of CSP optical metrology systems, which include complex calculations and calibration terms. This raises the question: How do we know these methods’ accuracy? One approach is to compare metrology system measurements against a ground truth reference.

14 SOLAR ENERGY↗

Laser Metrology for an Optical-Path-Length Modulator

Laser gauges have been developed to satisfy requirements specific to monitoring the amplitude of the motion of an optical-path-length modulator that is part of an astronomical interferometer. The modulator includes a corner-cube retroreflector driven by an electromagnetic actuator. During operation of the astronomical interferometer, the electromagnet is excited to produce linear reciprocating motion of the corner-cube retroreflector at an amplitude of 2 to 4 mm at a frequency of 250, 750, or 1,250 Hz. Attached to the corner-cube retroreflector is a small pick-off mirror. To suppress vibrations, a counterweight having a mass equal to that of the corner-cube retroreflector and pick-off mirror is mounted on another electromagnetic actuator that is excited in opposite phase. Each gauge is required to measure the amplitude of the motion of the pick-off mirror, assuming that the motions of the pick-off mirror and the corner-cube retroreflector are identical, so as to measure the amplitude of motion of the corner- cube retroreflector to within an error of the order of picometers at each excitation frequency. Each gauge is a polarization-insensitive heterodyne interferometer that includes matched collimators, beam separators, and photodiodes (see figure). The light needed for operation of the gauge comprises two pairs of laser beams, the beams in each pair being separated by a beat frequency of 80 kHz. The laser beams are generated by an apparatus, denoted the heterodyne plate, that includes stabilized helium-neon lasers, acousto-optical modulators, and associated optical and electronic subsystems. The laser beams are coupled from the heterodyne plate to the collimators via optical fibers.

Gursel, Yekta↗

Large Volume, Optical and Opto-Mechanical Metrology Techniques for ISIM on JWST

The final, flight build of the Integrated Science Instrument Module (ISIM) element of the James Webb Space Telescope is the culmination of years of work across many disciplines and partners. This paper covers the large volume, ambient, optical and opto-mechanical metrology techniques used to verify the mechanical integration of the flight instruments in ISIM, including optical pupil alignment. We present an overview of ISIM's integration and test program, which is in progress, with an emphasis on alignment and optical performance verification. This work is performed at NASA Goddard Space Flight Center, in close collaboration with the European Space Agency, the Canadian Space Agency, and the Mid-Infrared Instrument European Consortium.

ISIM↗

Estimation, UQ, and Sensitivity Analysis for a New Diagnostic Setup [Slides]

This is for an early career talk I am giving at the Association for Women in Math’s Research Symposium. It provides a general overview of three projects: the first focuses on velocity measurements from optical laser diagnostics, the second focuses on probe alignment and location (metrology), and the third is my Site-Directed Research and Development (SDRD) which focuses on neural networks for image datasets. All three projects have strong uncertainty quantification components.

97 MATHEMATICS AND COMPUTING↗

Wavefront sensing for a future HabEx space telescope.

HabEx is a concept study for a next generation space telescope having a 4 to 6.5 m primary mirror diameter. Primarily designed for exoplanet science, but also carrying general astrophysics instruments, it will have stability requirements orders of magnitude more stringent than any previously flown space-based observatory. Wavefront control, including active sensing/control of wavefront jitter and drift, will be essential to achieving and maintaining coronagraph performance. There are currently two complementary techniques that can be used to sense the wavefront drift. An attractive method is to use starlight rejected from the coronagraph to sense changes in the wavefront incident on the coronagraph mask. This method suffers from photon noise especially when imaging dim stars. It is also unavailable during slews between target stars. Laser metrology is a complementary system in which a laser “truss” enables rigid body displacements of the optics to be measured from changes in the separation of pairs of optical fiducials which can be separated by many meters. In closed loop with actuated optics, laser metrology actively maintains rigid body alignment of the front-end optics, thereby eliminating the dominant source of wavefront drift. This method can maintain rigid body stability of the telescope optics and thereby wavefront control, even during slews between targets.

Martin, Stefan↗

Metrology and Standards Gaps and FY27 Work Focusing on Impact

This work focuses on the Heliostat Consortium (HelioCon) optical measurements and characterization, testing and modeling capabilities and infrastructure at NLR and Sandia supporting heliostat technology research, development, validation, and deployment in relevant industries. The development of standards in HelioCon requires a collective effort across the global heliostat community of industry, researchers, academia and other stakeholders.

14 SOLAR ENERGY↗

Quantifying uncertainty in uranium concentration measurements via K-edge densitometry

This study quantifies the uncertainty in uranium concentration predictions of fluoride and chloride-based salts within a steel pipe using K-edge densitometry. Modeling and simulation was conducted with the Monte Carlo N-Particle Transport (MCNP) code. The quality of of this technique’s prediction in a pipe requires proper characterization of the pipe’s thickness, which is dependent on the source size and axial offset from the pipe centerline. The thickness was determined as either the center-line thickness seen by the X-ray source or an average value determined through random sampling. Generally, the predicted concentrations were slightly better at lower offset with the random sampling thickness and using the center-line thickness for the highest offsets. For a line-beam source and varying axial offsets, the relative error of concentration was within 1% of the true value but uncertainty increased by 2 orders of magnitude. Similarly, for no axial offset, the relative error was significantly less than 1% while no trend for uncertainty was found. However, at the largest possible offset for a given source size, the concentrations become erroneous and greater than the allowable 1% relative error. Furthermore, high offsets tended to increase the variance of the transmission spectra by 3 orders of magnitude.

Characterization and Analytical Technique↗

Reliable Optical Pump Architecture for Highly Coherent Lasers Used in Space Metrology Applications

The design and initial demonstration of a laser pump module (LPM) incorporating single-mode, grating-stabilized 808-nm diode lasers and a low-loss, high-port-count optical combiner are completed. The purpose of the developed LPM is to reliably pump an Nd:YAG crystal in the laser head (LH), which serves as the optical metrology source for SIMLite mission. Using the narrow-linewidth, single-mode laser diodes enables placement of the pump power near Nd adsorption peak, which enhances pumping efficiency. Grating stabilization allows for stable pump spectra as diode operating temperature and bias current change. The low-loss, high-port-count optical combiner enables efficient combining of tens of pumps. Overall, the module supports 5+ years of continuous operation at 2 W of pump power with reliability approaching 100 percent. The LPM consists of a laser diode farm (LDF) and a pump beam combiner (PBC). An array of 807- to 808-nm fiber-pigtailed laser diodes makes up the LDF. A Bragg grating in each 5- m core single-mode (SM) fiber pigtail acts to stabilize the lasing spectra over a range of diode operating conditions. These commercially available single-mode laser diodes can deliver up to 150 mW of optical power. The outputs from the multiple pumps in the LDF are routed to the PBC, which is a 37-input by 1-output all-fiber device. The input ports consist of 5- m core SM fiber, while the output port consists of 105- m core, 0.15 NA (numerical aperture) multi-mode (MM) fiber. The combiner is fabricated by fusing the 37 input fibers while simultaneously tapering the fused region. At the completion of this process, the MM fiber is spliced to the end of the adiabatic taper, and, for protection, the combiner is sheathed by a capillary tube. A compact and robust metal housing was designed and fabricated to protect the PBC during space deployment.

Erlig, Herman↗

Investigations into mirror fabrication metrology analysis

This final report describes the work performed under this delivery order from June 1993 through August 1994. The scope of work included three distinct tasks in support of the AXAF-I program. The objective of the first task was to perform investigations of the grinding and polishing characteristics of the zerodur material by fabricating several samples. The second task was to continue the development of the integrated optical performance modeling software for AXAF-I. The purpose of third and final task was to develop and update the database of AXAF technical documents for an easy and rapid access. The MSFC optical and metrology shops were relocated from the B-wing of Building 4487 to Room BC 144 of Building 4466 in the beginning of this contract. This included dismantling, packing, and moving the equipment from its old location, and then reassembling it at the new location. A total of 65 zerodur samples, measuring 1 inch x 2 inches x 6 inches were ground and polished to a surface figure of lambda/10 p-v, and a surface finish of 5A rms were fabricated for coating tests. A number of special purpose tools and metal mirrors were also fabricated to support various AXAF-I development activities. In the metrology area, the ZYGO Mark 4 interferometer was relocated and also upgraded with a faster and more powerful processor. Surface metrology work was also performed on the coating samples and other optics using ZYGO interferometer and WYKO profilometer. A number of new features have been added to the GRAZTRACE program to enhance its analysis and modeling capabilities. A number of new commands have been added to the command mode GRAZTRACE program to provide a better control to the user on the program execution and data manipulation. Some commands and parameter entries have been reorganized for a uniform format. The command mode version of the convolution program CONVOLVE has been developed. An on-line help system and a user's manual have also been developed for the benefit of the users. The database of AXAF technical documents continues to progress. The titles, company name, date, and location of over 390 documents have been entered in this database. This database provides both a data search and retrieval function, and a data adding function. These functions allow a user to quickly search the data files for documents or add new information. A detailed user's guide has also been prepared. This user guide includes a document classification guide, a list of abbreviations, and a list of acronyms, which have been used in compiling this database of AXAF-I technical documents.

Dimmock, John O.↗

Corner cube model for internal metrology system of Space Interferometer Mission (SIM)

A corner cube (CC) articulation model has been developed to evaluate the SIM internal metrology (IntMet) optical delay bias (with the accuracy of picometer) due to the component imperfections, such as vertex offset, reflection coating index error, dihedral error, and surface figure error at each facet. This physics-based and MATLAB-implemented geometric optics model provides useful guidance on the flight system design, integration, and characterization. The first portion of this paper covers the CC model details. Then several feature of the model, such as metrology beam footprint visualization, roofline straddling/crossing analysis, and application to drive the sub-system design and the error budget flow-down, are demonstrated in the second part.

Corner cube,↗

[Development of Nanotechnology for X-Ray Astronomy Instrumentation]

This Research Grant provides support for development of nanotechnology for x-ray astronomy instrumentation. MIT has made significant progress in several development areas. In the last year we have made considerable progress in demonstrating the high-fidelity patterning and replication of x-ray reflection gratings. We developed a process for fabricating blazed gratings in silicon with extremely smooth and sharp sawtooth profiles, and developed a nanoimprint process for replication. We also developed sophisticated new fixturing for holding thin optics during metrology without causing distortion. We developed a new image processing algorithm for our Shack-Hartmann tool that uses Zernike polynomials. This has resulted in much more accurate and repeatable measurements on thin optics.

Schattenburg, Mark L.↗

Optical Imaging Methods for Volumetric Additive Manufacturing

Tomographic volumetric additive manufacturing (VAM) is a technique that enables light-induced curing of photoresins into complex 3D end use objects within a single step. This is made possible through projecting tomographically patterned light energy into a photo-curable resin volume within a rotating container. In order to monitor, quantify, and control curing during tomographic VAM, researchers need to visualize the curing parts in real-time. This may enable advancements toward dynamic, controlled and closedloop VAM methods in the future, as some researchers have shown. Herein we briefly review various optical imaging methods used to monitor printing in real-time, as well as provide some perspectives for future needs and considerations for imaging methods in VAM.

36 MATERIALS SCIENCE↗

Absolute Measurement of Tilts via Fourier Analysis of Interferograms

The Fourier method of interferogram analysis requires the introduction of a constant tilt into the inteferogram to serve as a 'carrier signal' for information on the figure of the surface under test. This tilt is usually removed in the first steps of analysis and ignored thereafter. However, in the problem of aligning optical components and systems, knowledge of part orientation is crucial to proper instrument performance. This paper outlines an algorithm which uses the normally ignored carrier signal in Fourier analysis to compute an absolute tilt (orientation) of the test surface. We also provide a brief outline of how this technique, incorporated in a rotating Twyman-Green interferometer, can be used in alignment and metrology of optical systems.

Toland, Ronald W.↗

Absolute Measurement of Tilts via Fourier Analysis of Interferograms

The Fourier method of interferogram analysis requires the introduction of a constant tilt into the interferogram to serve as a carrier signal for information on the figure of the surface under test. This tilt is usually removed in the first steps of analysis and ignored thereafter. However, in the problem of aligning optical components and systems, knowledge of part orientation is crucial to proper instrument performance. This paper outlines an algorithm which uses the normally ignored carrier signal in Fourier analysis to compute an absolute tilt (orientation) of the test surface. We also provide a brief outline of how this technique, incorporated in a rotating Twyman-Green interferometer, can be used in alignment and metrology of optical systems.

Toland, Ronald W.↗

Optical figure testing of prototype mirrors for JPL's Precision Segmented Reflector (PSR) program

JPL's PSR program is developing enabling technologies for large space telescopes employing segmented optics, and in particular, lightweight, thermally stable mirrors for telescopes operating at sub-mm wavelengths. JPL's vacuum cryointerferometric optical test facility includes a computer-controlled phase shifting interferometer operating at 10.59 microns and laser metrology for measurement of piston and absolute radius of curvature. The optical metrology has been integrated with a large vacuum chamber including a liquid nitrogen shroud capable of radiatively cooling 1.5 meter aperture mirrors down to 150 K. The facility is now being used to characterize prototype mirrors in both their room-temperature 'as-replicated' condition, and under orbital temperature conditions. The performance and limitations of the optical metrology hardware and software components are noted. Representative test results on prototype one meter-class composite mirrors being developed for PSR and related ground-based programs are also presented.

Hochberg, Eric B.↗

Demonstration and Automation of Reflected Target Optical Measurement for Heliostats

Accurate optical surfaces are a primary driver of concentrated solar power plant performance. Errors in pointing and tracking mirrors, the canting of individual mirror facets, and the surface slope of the mirror itself can be caused by errors during assembly, transportation, wind loading, gravity, and many other sources. The tools that exist to measure these error sources today largely rely on fringe deflectometry (SOFAST, QDec, others), or photogrammetry with targets attached to the mirror surface. Since 2022, NREL has been developing a measurement method called the Reflected Target Non-intrusive Assessment (ReTNA) system. This system differs from most established methods in that we perform deflectometry with a pattern of coded targets, identified in space with photogrammetry. Reflected target systems have several advantages over traditional fringe deflectometry systems. Firstly, they can be operated in bright or ambient lighting, a challenge for fringe systems that use a projector and screen. Reflected target systems also can use a much lighter and less expensive target than projector-based systems. Lastly, 2D slope measurement can be solved from a single image, which leads to several advantages for accommodating faster measurements and smaller sized targets. These advantages make ReTNA particularly well-suited for applications where there are space or lighting constraints, like performing heliostat quality assurance on an assembly line. It's also useful when a lightweight, flexible system is needed, like for heliostat developers to quickly measure a new heliostat design at different orientations, to observe gravitational effects on the mirror surface shape. In the last year, significant improvements were made to this tool to make it more useful for these applications. These improvements were focused around validation of the ReTNA measurement system, and automation of the setup and measurement process. First, we present an improved ReTNA layout, for use on the heliostat assembly line. Next, we detail the various changes to the ReTNA software and computer vision methods to automate data collection in this new setup, and lessons learned from this process. The goal with this new setup is to perform a full heliostat surface characterization without removing the mirror from the assembly line. Lastly, we share results from several ReTNA validation studies undertaken over the last year. These include repeated ReTNA measurement on demonstration mirror facets, comparisons with other optical measurement tools, and some studies aimed at quantifying the uncertainty of ReTNA measurement under various constraints (mirror-target spacing, camera resolution, etc.). These results are compared with 2024 HelioCon performance targets, and our planned next steps for the ReTNA measurement system are presented.

CSP↗

Improvements in Optical Surface Measurement Using Reflected Computer Vision Targets

Since 2021, NREL has been developing a system to measure heliostats by measuring the deflection of printed computer vision targets, called the Reflected Target Non-intrusive Assessment (ReTNA) [6], [7]. While this system will have lower resolution than a fringe deflectometry system, it has several important advantages that make it a complimentary technology: 2D surface slope measurement can be generated from a single image, it can operate in ambient lighting, target points can be directly located in 3D space with photogrammetry allowing for a non-flat target, and it's well suited to using a smaller target, and multiple images to measure larger optical surfaces. ReTNA has undergone several significant changes and improvements, described below. This talk will summarize new system layouts designed for commercial use, new computer vision algorithms used to automate the analysis process and validation campaigns for the ReTNA software.

computer vision↗