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Concept has several important advantages over close-wound system: memory and coil chips are separate and interchangeable; interconnections in coil level are eliminated by packing memory chip and electronics in single structure; and coil size can be adjusted to optimum value in terms of power dissipation and field uniformity.
Integrated shared memory heterogeneous architectures are pervasive because they satisfy the diverse needs of mobile, autonomous, and edge computing platforms. Although specialized processing units (PUs) that share a unified system memory improve performance and energy efficiency by reducing data movement, they also increase contention for this memory since the PUs interact with each other. Prior work has investigated performance degradation due to memory contention, but few have studied the relationship of power and energy to memory contention. Moreover, a comprehensive solution that models memory contention for kernel placement on contemporary heterogeneous systems on chip (SoCs) in response to energy and performance has been largely unaddressed.This paper presents MEPHESTO, a novel and holistic approach for managing this balance. The authors characterize applications and PUs in terms of two memory contention factors - time factors and power factors - to achieve the desired trade-off between energy and performance for collocated kernel execution on heterogeneous systems. The authors believe that this investigation is the first to combine all of these factors and present a simple knob-based approach that expresses the target trade-off. The approach is evaluated on a diverse integrated shared memory heterogeneous system with a CPU, GPU, and programmable vision accelerator. By using an empirical model for memory contention that provides up to 92% accuracy, the kernel collocation approach can provide a near-optimal ordering and placement based on the user-defined, energy-performance trade-off parameter. Moreover, the dynamic programming-based heuristics provide up to 30% better energy or 20% performance benefits when compared with the greedy approaches commonly employed by previous studies.
The performance is examined of Redundant Arrays of Inexpensive Disks (RAID) the First, a prototype disk array. A hierarchy of bottlenecks was discovered in the system that limit overall performance. The most serious is the memory system contention on the Sun 4/280 host CPU, which limits array bandwidth to 2.3 MBytes/sec. The array performs more successfully on small random operations, achieving nearly 300 I/Os per second before the Sun 4/280 becomes CPU limited. Other bottlenecks in the system are the VME backplane, bandwidth on the disk controller, and overheads associated with the SCSI protocol. All are examined in detail. The main conclusion is that to achieve the potential bandwidth of arrays, more powerful CPU's alone will not suffice. Just as important are adequate host memory bandwidth and support for high bandwidth on disk controllers. Current disk controllers are more often designed to achieve large numbers of small random operations, rather than high bandwidth. Operating systems also need to change to support high bandwidth from disk arrays. In particular, they should transfer data in larger blocks, and should support asynchronous I/O to improve sequential write performance.
Reliable miniature spaceborne memory system design, and testing of breadboard version of circuits and memory plane
A decoding procedure is described for the (n,k) t-error-correcting Reed-Solomon (RS) code, and an implementation of the (31,15) RS code for the I4-TENEX central system. This code can be used for error correction in large archival memory systems. The principal features of the decoder are a Galois field arithmetic unit implemented by microprogramming a microprocessor, and syndrome calculation by using the g(x) encoding shift register. Complete decoding of the (31,15) code is expected to take less than 500 microsecs. The syndrome calculation is performed by hardware using the encoding shift register and a modified Chien search. The error location polynomial is computed by using Lin's table, which is an interpretation of Berlekamp's iterative algorithm. The error location numbers are calculated by using the Chien search. Finally, the error values are computed by using Forney's method.
Relationships between human memory systems and hypermedia systems are discussed with particular emphasis on the underlying importance of associational memory. The distinctions between knowledge presentation, knowledge representation, and knowledge constructions are addressed. Issues involved in actually developing individualizable hypermedia based knowledge construction tools are presented.
Radiation requirements and trends. TID: 1) >90% of NASA applications are < 100 krads-Si in piecepart requirements. a) Many commercial devices (NVM and SDRAMs) meet or come close to this. b) Charge pump TID tolerance has improved an order magnitude over the last 10 years. 2) There are always a few programs with higher level needs and, of course, defense needs SEL: 1) Prefer none or rates that are considered low risk. a) Latent damage is a bear to deal with. 2) As we re packing cells tighter and even with lower Vdd, we re seeing SEL on commercial devices regularly (<90nm). a) Often in power conversion, I/O, or control areas. SEU: 1) It s not the bit errors, it s the SEFIs errors that are the biggest issues. a) Scrubbing concerns for risk, power, speed.
The Memory Test Experiment is a space test of a ferroelectric memory device on a low Earth orbit satellite that launched in November 2010. The memory device being tested is a commercial Ramtron Inc. 512K memory device. The circuit was designed into the satellite avionics and is not used to control the satellite. The test consists of writing and reading data with the ferroelectric based memory device. Any errors are detected and are stored on board the satellite. The data is sent to the ground through telemetry once a day. Analysis of the data can determine the kind of error that was found and will lead to a better understanding of the effects of space radiation on memory systems. The test is one of the first flight demonstrations of ferroelectric memory in a near polar orbit which allows testing in a varied radiation environment. The initial data from the test is presented. This paper details the goals and purpose of this experiment as well as the development process. The process for analyzing the data to gain the maximum understanding of the performance of the ferroelectric memory device is detailed.
The latest edition is presented of the Systems Characteristics and Programming Manual of the ILLIAC 4 array and parallel disc memory system. The major aspects of the array described include: the array systems characteristics, programming characteristics, definition and flow charts, and timing. A glossary of terms, and an instruction index are included.
A microprocessor-based controller and data logger for pressure scanning systems is described. The microcomputer positions and manages data from as many as four 48-port electro-mechanical pressure scanners. The maximum scanning rate is 80 pressure measurements per second (20 ports per second on each of four scanners). The system features on-line calibration, position-directed data storage, and once-per-scan display in engineering units of data from a selected port. The system is designed to be interfaced to a facility computer through a shared memory. System hardware and software are described. Factors affecting measurement error in this type of system are also discussed.
A microprocessor-based controller and data logger for pressure scanning systems is described. The microcomputer positions and manages data from as many as four 48-port electro-mechanical pressure scanners. The maximum scanning rate is 80 pressure measurements per second (20 ports per second on each of four scanners). The system features on-line calibration, position-directed data storage, and once-per-scan display in engineering units of data from a selected port. The system is designed to be interfaced to a facility computer through a shared memory. System hardware and software are described. Factors affecting measurement error in this type of system are also discussed.
The basic principle of the associative memory is to match the unknown input pattern against a stored training set, and responding with the 'closest match' and the corresponding label. Generally, an associative memory system requires two preparatory steps: selecting attributes of the pattern class, and training the system by associating patterns with labels. Experimental results gained from using Parallel Associative Memory are presented. The primary concern is an automatic search for ground control points in aerial photographs. Synthetic patterns are tested followed by real data. The results are encouraging as a relatively high level of correct matches is reached.
The Memory Test Experiment is a space test of a ferroelectric memory device on a low Earth orbit satellite. The test consists of writing and reading data with a ferroelectric based memory device. Any errors are detected and are stored on board the satellite. The data is send to the ground through telemetry once a day. Analysis of the data can determine the kind of error that was found and will lead to a better understanding of the effects of space radiation on memory systems. The test will be one of the first flight demonstrations of ferroelectric memory in a near polar orbit which allows testing in a varied radiation environment. The memory devices being tested is a Ramtron Inc. 512K memory device. This paper details the goals and purpose of this experiment as well as the development process. The process for analyzing the data to gain the maximum understanding of the performance of the ferroelectric memory device is detailed.
A microdensitometer, scanning pairs of star plates of identical areas of the sky taken a decade apart, is coupled to a magnetic tape unit through a data acquisition system. This system performs an image density threshold level selection for each plate and a buffer memory system to smooth the data flow as well as analog and digital display controls. The data from the tape are processed later by a large scale high speed computer which reconstructs the scanned images, discovers, measures, and documents stellar proper motions by precise comparison of corresponding areas of the two star plates to detect those images which have moved at least 0.10 seconds annually in the time interval between the exposures.
An optical associative memory system suitable for both auto- and hetero-associative recall is demonstrated. This system utilizes Hamming distance as the similarity measure between a binary input and a memory image with the aid of a two-dimensional optical EXCLUSIVE OR (XOR) gate and a parallel electronics comparator module. Based on the Hamming distance measurement, this optical associative memory performs a nearest neighbor search and the result is displayed in the output plane in real-time. This optical associative memory is fast and noniterative and produces no output spurious states as compared with that of the Hopfield neural network model.
Lithium niobate is a significant electro-optic material, with potential applications in ultra high capacity storage and processing systems. Lithium niobate is the material of choice for many integrated optical devices and holographic mass memory systems. For crystals of lithium niobate were passively exposed to the space environment of the Long Duration Exposure Facility (LDEF). Three of these crystals contained volume holograms. Although the crystals suffered the surface damage characteristics of most of the other optical components on the Georgia Tech tray, the crystals were recovered intact. The holograms were severely degraded because of the lengthy exposure, but the bulk properties are being investigated to determine the spaceworthiness for space data storage and retrieval systems.
"Shape memory" is a unique property of certain alloys that, when deformed (within certain strain limits) at low temperatures, will remember and recover to their original predeformed shape upon heating. It occurs when an alloy is deformed in the low-temperature martensitic phase and is then heated above its transformation temperature back to an austenitic state. As the material passes through this solid-state phase transformation on heating, it also recovers its original shape. This behavior is widely exploited, near room temperature, in commercially available NiTi alloys for connectors, couplings, valves, actuators, stents, and other medical and dental devices. In addition, there are limitless applications in the aerospace, automotive, chemical processing, and many other industries for materials that exhibit this type of shape-memory behavior at higher temperatures. But for high temperatures, there are currently no commercial shape-memory alloys. Although there are significant challenges to the development of high-temperature shape-memory alloys, at the NASA Glenn Research Center we have identified a series of alloy compositions in the Ti-Ni-Pt system that show great promise as potential high-temperature shape-memory materials.
The principal design features and operational experiences of the X-29 forward-swept-wing aircraft and F-18 high alpha research vehicle (HARV) automated test systems are discussed. It is noted that operational experiences in developing and using these automated testing techniques have highlighted the need for incorporating target system features to improve testability. Improved target system testability can be accomplished with the addition of nonreal-time and real-time features. Online access to target system implementation details, unobtrusive real-time access to internal user-selectable variables, and proper software instrumentation are all desirable features of the target system. Also, test system and target system design issues must be addressed during the early stages of the target system development. Processing speeds of up to 20 million instructions/s and the development of high-bandwidth reflective memory systems have improved the ability to integrate the target system and test system for the application of automated testing techniques. It is concluded that new methods of designing testability into the target systems are required.