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134 records · Page 8
All sourcesNASA NTRSDOE OSTI
NASA NTRS2016

Detectors and Focal Plane Modules for Weather Satellites

Weather satellite instruments require detectors with a variety of wavelengths ranging from the visible to VLWIR. One of the remote sensing applications is the geostationary GOES-ABI imager covering wavelengths from the 450 to 490 nm band through the 13.0 to 13.6 micron band. There are a total of 16 spectral bands covered. The Cross-track infrared Sounder (CrIS) is a Polar Orbiting interferometric sensor that measures earth radiances at high spectral resolution, using the data to provide pressure, temperature and moisture profiles of the atmosphere. The pressure, temperature and moisture sounding data are used in weather prediction models that track storms, predict levels of precipitation etc. The CrIS instrument contains SWIR (lamba(sub c) approximately 5 micron at 98K), MWIR (lambda(sub c) approximately 9 micron at 98K) and LWIRs (lamba(sub c) approximately 15.5 micron at 81K) bands in three Focal Plane Array Assemblies (FPAAs). GOES-ABI contains three focal plane modules (FPMs), (i) a visible-near infrared module consisting of three visible and three near infrared channels, (ii) a MWIR module comprised of five channels from 3.9 micron to 8.6 micron and (iii) a 9.6 micron to 13.3 micron, five-channel LWIR module. The VNIR FPM operates at 205 K, and the MWIR and LWIR FPMs operate at 60 K. Each spectral channel has a redundant array built into a single detector chip. Switching is thus permitted from the primary selected array in each channel to the redundant array, given any degradation in performance of the primary array during the course of the mission. Silicon p-i-n detectors are used for the 0.47 micron to 0.86 micron channels. The thirteen channels above 1 micron are fabricated in various compositions of Hg1-xCdxTe, and in this particular case using two different detector architectures. The 1.38 micron to 9.61 micron channels are all fabricated in Hg1-xCdxTe grown by Liquid Phase Epitaxy (LPE) using the HDVIP detector architecture. Molecular beam epitaxy (MBE)-grown Hg1-xCdxTe material are used for the LWIR 10.35 micron to 13.3 micron channels fabricated in Double layer planar heterostructure (DLPH) detectors. This is the same architecture used for the CrIS detectors CrIS detectors are 850 micron diameter detectors with each FPAA consisting of nine photovoltaic detectors arranged in a 3 x 3 pattern. Each detector has an accompanying cold preamplifier. SWIR and MWIR FPAAs operate at 98 K and the LWIR FPAA at 81 K, permitting the use of passive radiators to cool the detectors. D* requirements at peak wavelength are ≥ 5.0E+10 Jones for LWIR, ≥ 9.3E+10 Jones for MWIR and ≥ 3.0E+11 Jones for SWIR. All FPAAs exceeded the D* requirements. Measured mean values for the nine photodiodes in each of the LWIR, MWIR and SWIR FPAAs are D* = 5.3 x 10(exp 10) cm-Hz(exp 1/2)/W at 14.0 micron, 1.0 x 10(exp 11) cm-Hz(exp 1/2)/W at 8.0 micron and 3.1 x 10(exp 11) cm-Hz(exp 1/2)/W at 4.64 micron.

satellite instruments↗
NASA NTRS2016

Relating MBSE to Spacecraft Development: A NASA Pathfinder

The NASA Engineering and Safety Center (NESC) has sponsored a Pathfinder Study to investigate how Model Based Systems Engineering (MBSE) and Model Based Engineering (MBE) techniques can be applied by NASA spacecraft development projects. The objectives of this Pathfinder Study included analyzing both the products of the modeling activity, as well as the process and tool chain through which the spacecraft design activities are executed. Several aspects of MBSE methodology and process were explored. Adoption and consistent use of the MBSE methodology within an existing development environment can be difficult. The Pathfinder Team evaluated the possibility that an "MBSE Template" could be developed as both a teaching tool as well as a baseline from which future NASA projects could leverage. Elements of this template include spacecraft system component libraries, data dictionaries and ontology specifications, as well as software services that do work on the models themselves. The Pathfinder Study also evaluated the tool chain aspects of development. Two chains were considered: 1. The Development tool chain, through which SysML model development was performed and controlled, and 2. The Analysis tool chain, through which both static and dynamic system analysis is performed. Of particular interest was the ability to exchange data between SysML and other engineering tools such as CAD and Dynamic Simulation tools. For this study, the team selected a Mars Lander vehicle as the element to be designed. The paper will discuss what system models were developed, how data was captured and exchanged, and what analyses were conducted.

Othon, Bill↗
NASA NTRS2016

Detectors and Focal Plane Modules for Weather Instruments

Weather satellite instruments require detectors with a variety of wavelengths ranging from the visible to VLWIR. The Cross-track infrared Sounder (CrIS) is a Polar Orbiting interferometric sensor that measures earth radiances at high spectral resolution, using the data to provide pressure, temperature and moisture profiles of the atmosphere. The pressure, temperature and moisture sounding data are used in weather prediction models that track storms, predict levels of precipitation etc. The CrIS instrument contains SWIR (lambda(sub c) (is) approximately 5 micrometers at 98 K), MWIR (lambda(sub c) (is) approximately 9 micrometers at 98 K) and LWIRs (lambda(sub c) (is) approximately 15.4 m at 81 K) bands in three Focal Plane Array Assemblies (FPAAs). CrIS detectors are 850 micrometers diameter detectors with each FPAA consisting of nine photovoltaic detectors arranged in a 3 x 3 pattern. Molecular beam epitaxy (MBE)-grown Hg1-xCdxTe material are used for the detectors fabricated in a modified Double Layer Planar Heterostructure (DLPH) architecture. Each detector has an accompanying cold preamplifier. SWIR and MWIR FPAAs operate at 98 K and the LWIR FPAA at 81 K, permitting the use of passive radiators to cool the detectors. D* requirements at peak 14.01 micrometers wavelength are greater than 5.0E+10 Jones for LWIR, greater than 7.5E+10 Jones at 8.26 micrometers for MWIR and greater than 3.0E+11 Jones at peak 4.64 micrometers wavelength for SWIR. All FPAAs exceeded the D* requirements. Measured mean values for the nine photodiodes in each of the LWIR, MWIR and SWIR FPAAs are D* = 5.3 x 10(exp 10) cm-Hz1/2/W at 14.0 micrometers, 9.6 x 10(exp 10) cm-Hz1/2/W at 8.0 micrometers and 3.4 x 10(exp 11) cm-Hz1/2/W at 4.64 micrometers.

satellite instruments↗
NASA NTRS2017

X-Ray Diffraction (XRD) Characterization Methods for Sigma=3 Twin Defects in Cubic Semiconductor (100) Wafers

An X-ray defraction (XRD) characterization method for sigma=3 twin defects in cubic semiconductor (100) wafers includes a concentration measurement method and a wafer mapping method for any cubic tetrahedral semiconductor wafers including GaAs (100) wafers and Si (100) wafers. The methods use the cubic semiconductor's (004) pole figure in order to detect sigma=3/{111} twin defects. The XRD methods are applicable to any (100) wafers of tetrahedral cubic semiconductors in the diamond structure (Si, Ge, C) and cubic zinc-blend structure (InP, InGaAs, CdTe, ZnSe, and so on) with various growth methods such as Liquid Encapsulated Czochralski (LEC) growth, Molecular Beam Epitaxy (MBE), Organometallic Vapor Phase Epitaxy (OMVPE), Czochralski growth and Metal Organic Chemical Vapor Deposition (MOCVD) growth.

Park, Yeonjoon↗