Deterministic Simulation of First-Order Scattering in a Clinical X-ray Computed Tomography Scanner - Paper 81
In nondestructive testing (NDT) and medical diagnostic x-ray imaging (photon energy<140 keV), scattered x-ray caused by Compton and Rayleigh scattering should be eliminated. Scattered x-ray photons reduce image contrast, increase image noise, and introduce artifact into the reconstructed computed tomography (CT) images. In cone-beam CT, where the coverage of the x-ray beam and the area of the detector are significantly larger than those in fan-beam CT, x-ray photon scatter is one of the major sources of image degradation. The artifacts caused by scattered x-ray photon can be divided into two categories: 1) low spatial frequency scatter profile adds a positive bias to the detected radiation signal, thus reducing the effective attenuation of the imaged object, resulting in a negative bias in the measured linear attenuation coefficient in the image; 2) a high spatial frequency scatter profile causes a differential artifact, such as shading in uniform regions. A real x-ray scan is composed of both low and high frequency scatter profiles. Thus, the key to a successful scatter correction is the ability to accurately capture the scatter profile of a real x-ray imaging scan. The most accurate method for estimating a scatter profile is the Monte Carlo simulation. However, the computation cost of the Monte Carlo method makes it unfeasible for simulating real and complex scan geometries in clinical settings. A practical yet accurate scatter profile estimation method is through ray tracing techniques, where the scatter profiles are computed by tracking rays through the object's volume. The x-ray from the source is tracked when it interacts with the material in the volume. The interaction creates scattered x-rays, in all possible directions. These rays are again either attenuated or scattered, creating cascaded scatter events. In x-ray CT, the first-order scattering (where only one scatter interaction is encountered) accounts for the most severe image artifacts since this first-order scatter contains a high frequency component of the scatter profile. Previous studies have shown that ray tracing techniques are quite effective in simulating the contribution of first-order scattering in radiological images. In this study, a similar ray tracing technique is applied to simulate the scatter profile of a real x-ray computed tomography (CT) scan in clinical settings. A good agreement has been found between the simulated scatter profile and the experimental measurement result. (authors)