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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 145 records · Page 8
All sourcesNASA NTRSDOE OSTI
NASA NTRS2014

Enabling More than Moore: Accelerated Reliability Testing and Risk Analysis for Advanced Electronics Packaging

For five decades, the semiconductor industry has distinguished itself by the rapid pace of improvement in miniaturization of electronics products-Moore's Law. Now, scaling hits a brick wall, a paradigm shift. The industry roadmaps recognized the scaling limitation and project that packaging technologies will meet further miniaturization needs or ak.a "More than Moore". This paper presents packaging technology trends and accelerated reliability testing methods currently being practiced. Then, it presents industry status on key advanced electronic packages, factors affecting accelerated solder joint reliability of area array packages, and IPC/JEDEC/Mil specifications for characterizations of assemblies under accelerated thermal and mechanical loading. Finally, it presents an examples demonstrating how Accelerated Testing and Analysis have been effectively employed in the development of complex spacecraft thereby reducing risk. Quantitative assessments necessarily involve the mathematics of probability and statistics. In addition, accelerated tests need to be designed which consider the desired risk posture and schedule for particular project. Such assessments relieve risks without imposing additional costs. and constraints that are not value added for a particular mission. Furthermore, in the course of development of complex systems, variances and defects will inevitably present themselves and require a decision concerning their disposition, necessitating quantitative assessments. In summary, this paper presents a comprehensive view point, from technology to systems, including the benefits and impact of accelerated testing in offsetting risk.

Ghaffarian, Reza↗
NASA NTRS1977

Accelerated life testing effects on CMOS microcircuit characteristics

Accelerated life tests were performed on CMOS microcircuits to predict their long term reliability. The consistency of the CMOS microcircuit activation energy between the range of 125 C to 200 C and the range 200 C to 250 C was determined. Results indicate CMOS complexity and the amount of moisture detected inside the devices after testing influences time to failure of tested CMOS devices.

Source record↗
DOE OSTI2026

Combined-Accelerated Stress Testing of Photovoltaic Materials

By applying multiple environmental stresses in fieldrepresentative combinations and sequences, combined-accelerated stress testing (CAST) identifies degradation modes and failure mechanisms of photovoltaic (PV) modules and components that are missed by single stress factor accelerated testing.

14 SOLAR ENERGY↗
DOE OSTI2021

Field Accelerated Stress Testing (FAST): Forecasting Plant-specific Failure Modes and Degradation Rates

Photovoltaic plant owners and insurance companies would like to be prepared for the forthcoming material warranty claims (material defects) and power warranty claims (degradation rate). To address the needs of these stakeholders, this presentation aims to introduce a new conceptual approach to perform accelerated testing right at the field of interest and it is called field accelerated stress testing (FAST). The primary goal of this presentation is to present a conceptual approach to forecast the field specific failure modes and degradation rates in advance by a factor of 2 to 5, right at the plant site using a few spare modules available at the plant location itself.

14 SOLAR ENERGY↗
NASA NTRS1980

NWSC nickel cadmium spacecraft cell accelerated life test program data analysis

An analysis of the data leading to a proposed accelerated life test scheme to test a nickel cadmium cell under spacecraft usage conditions is described. The amount and concentration of electrolyte and the amount of precharge in the cell are discussed in relation to the design of the cell and the accelerated test design. A failure analysis of the cell is summarized. The analysis included such environmental test variables as the depth of discharge, the temperature, the amount of recharge and the charge and discharge rate.

Lander, J.↗
DOE OSTI2022

Characterization and Accelerated Life Testing of a New Solid Oxide Electrolysis Cell

The project aims to develop mechanistic degradation models that realistically predict long-term Solid Oxide Electrolysis Cell (SOEC) durability, using input data from accelerated electrochemical life testing combined with quantitative microstructural and microchemical evaluation. A promising SOEC type will be further developed. The understanding achieved by combining experimental results and theory will be used to guide improvements in long-term SOEC durability, and validate that this technology can reach DOE H 2 production cost and durability targets. Planned outcomes include: (1) new experimental accelerated testing data on SOEC degradation at the oxygen electrode, fuel electrode, and electrolyte; (2) predictive theory of degradation developed based on the accelerated test data; (3) new electrode materials and processing methods that minimize degradation rate; (4) determination of the impact of SOEC electrolyte thickness and electrode composition/microstructure on performance and degradation; (5) determination of the operating conditions where degradation is minimized; and (6) validation of degradation models for extrapolating accelerated test data to predict long-term durability.

08 HYDROGEN↗
NASA NTRS1972

Accelerated life testing of spacecraft subsystems

The rationale and requirements for conducting accelerated life tests on electronic subsystems of spacecraft are presented. A method for applying data on the reliability and temperature sensitivity of the parts contained in a sybsystem to the selection of accelerated life test parameters is described. Additional considerations affecting the formulation of test requirements are identified, and practical limitations of accelerated aging are described.

Wiksten, D.↗
NASA NTRS2012

Accelerated Creep Testing of High Strength Aramid Webbing

A series of preliminary accelerated creep tests were performed on four variants of 12K and 24K lbf rated Vectran webbing to help develop an accelerated creep test methodology and analysis capability for high strength aramid webbings. The variants included pristine, aged, folded and stitched samples. This class of webbings is used in the restraint layer of habitable, inflatable space structures, for which the lifetime properties are currently not well characterized. The Stepped Isothermal Method was used to accelerate the creep life of the webbings and a novel stereo photogrammetry system was used to measure the full-field strains. A custom MATLAB code is described, and used to reduce the strain data to produce master creep curves for the test samples. Initial results show good correlation between replicates; however, it is clear that a larger number of samples are needed to build confidence in the consistency of the results. It is noted that local fiber breaks affect the creep response in a similar manner to increasing the load, thus raising the creep rate and reducing the time to creep failure. The stitched webbings produced the highest variance between replicates, due to the combination of higher local stresses and thread-on-fiber damage. Large variability in the strength of the webbings is also shown to have an impact on the range of predicted creep life.

Jones, Thomas C.↗
DOE OSTI2020

Advancing reliability assessments of photovoltaic modules and materials using combined-accelerated stress testing

Previously undiscovered failure modes in photovoltaic (PV) modules continue to emerge in field installations despite passing protocols for design qualification and quality assurance. Failure to detect these modes prior to widespread use could be attributed to the limitations of present-day standard accelerated stress tests (ASTs), which are primarily designed to identify known degradation or failure modes at the time of development by applying simultaneous or sequential stress factors (usually two at most). Here, we introduce an accelerated testing method known as the combined-accelerated stress test (C-AST), which simultaneously combines multiple stress factors of the natural environment. Simultaneous combination of multiple stress factors allows for improved identification of failure modes with better ability to detect modes not known a priori. A demonstration experiment was conducted that reproduced the field-observed cracking of polyamide- (PA-) and polyvinylidene fluoride (PVDF)–based backsheet films, a failure mode that was not detected by current design qualification and quality assurance testing requirements. In this work, a two-phase testing protocol was implemented. The first cycle (“Tropical”) is a predominantly high-humidity and high-temperature test designed to replicate harsh tropical climates. The second cycle (“Multi-season”) was designed to replicate drier and more temperate conditions found in continental or desert climates. Testing was conducted on 2 × 2-cell crystalline-silicon cell miniature modules constructed with both ultraviolet (UV)–transmitting and UV-blocking encapsulants. Cracking failures were observed within a cumulative 120 days of the Tropical condition for one of the PA-based backsheets and after 84 days of Tropical cycle followed by 42 days of the Multi-season cycle for the PVDF-based backsheet, which are both consistent with failures seen in fielded modules. In addition to backsheet cracking, degradation modes were observed including solder/interconnect fatigue, various light-induced degradation modes, backsheet delamination, discoloration, corrosion, and cell cracking. The ability to simultaneously apply multiple stress factors may allow many of the test sequences within the standardized design qualification procedure to be performed using a single test setup.

14 SOLAR ENERGY↗
NASA NTRS2011

Evaluation of an Accelerated ELDRS Test Using Molecular Hydrogen

An accelerated total ionizing dose (TID) hardness assurance test for enhanced low dose rate sensitive (ELDRS) bipolar linear circuits, using high dose rate tests on parts that have been exposed to molecular hydrogen, has been proposed and demonstrated on several ELDRS part types. In this study several radiation-hardened "ELDRS-free" part types have been tested using this same approach to see if the test is overly conservative.

radiation effects↗
DOE OSTI2021

Accelerated reliability tests of n + and p + poly-Si passivated contacts

We report on the stability of encapsulated, low-pressure chemical vapor-deposited phosphorus (n + poly-Si) doped and boron (p + poly-Si) doped poly-Si/SiO x passivated contacts by exposing the samples to three different accelerated tests: damp heat test, thermal cycling and ultraviolet exposure, adhering closely to the IEC 61215 standard. Outdoor testing was also performed by exposing the samples in the outdoor testing field at the National Renewable Energy Laboratory, and preliminary data accumulated for 1000 h from February to April of 2021 is reported. We studied non-metallized, thermally-metallized, and screen-printed n + and p + poly-Si by monitoring the effective minority carrier lifetime at the implied maximum power point using a Sinton lifetime tester, and recorded photoluminescence images before and after the exposure. Furthermore, the samples were found to be stable under all test conditions, which is encouraging for incorporation of these contacts in next-generation industrial silicon solar cells.

14 SOLAR ENERGY↗
NASA NTRS1996

Verification of force and acceleration specifications for random vibration tests of Cassini spacecraft equipment

The use of force limiting in the random vibration testing of the Cassini spacecraft's subsystems is reported on. A verification of the Cassini equipment random vibration test acceleration and force specifications is provided by interface acceleration and force data measured in acoustic tests of the Cassini spacecraft development test model (DTM). Acoustic tests were performed on the DTM structure with different structural and equipment configurations. The acceleration and force spectra at the interface between the equipment items and the spacecraft DTM structure were measured in the acoustic tests and compared with the equipment random vibration test specifications. The spacecraft's apparent masses were measured at the equipment mounting points and used in force limit predictions.

Chang, Kurng Y.↗
NASA NTRS1997

Space Station Cathode Ignition Test Status at 32,000 Cycles

A plasma contactor system has been baselined for the International Space Station for structural potential control. An ignition procedure was developed for the plasma contactor hollow cathode assembly (HCA). To demonstrate the required 99% HCA ignition reliability over 6,000 cycles, an ignition test was conducted. An accelerated test procedure was employed to rapidly accumulate ignition cycles. The test procedure minimized the differences between accelerated and non-accelerated test results. The development HCA used in this test has achieved 32,000 ignitions to date. The HCA has been qualified for cyclic operation, which could reduce xenon consumption and extend the life of the plasma contactor system.

Zakany, James S.↗
NASA NTRS1973

Changes in the direction of sight during parabolic flights and rectilinear accelerations

Tests in which persons were subjected to a negative acceleration in an automobile are reported. The acceleration was obtained by stopping a moving car on the runway of an airport. The acceleration was found to produce a rotational movement of the subject's eyeball proportional to the degree of acceleration. Other investigations were conducted with a jet aircraft and a sports aircraft. G forces of up to 3 G were obtained during pull up of the aircraft, while values in the range from 0 to 1 G could be produced with the aid of a parabolic flight path. The effects of the flight conditions on the subject's direction of sight are discussed.

Von Baumgarten, R.↗
DOE OSTI2023

Accelerated Stress Testing of Perovskite Photovoltaic Modules: Differentiating Degradation Modes with Electroluminescence Imaging

Herein, electroluminescence (EL) and thermal imaging are used to examine p–i–n metal halide perovskite (MHP) photovoltaic (PV) mini-modules (MA0.6FA0.4PbI3, 20 cells, 78 cm2) before and after indoor-accelerated stress testing or outdoor deployment. Distinct spatial patterns in the EL images emerge, which depend on the external stress conditions experienced by the mini-module. Imaging results highlight a distribution of dark speckle features that dominate after UV stress, attributed to widespread interfacial contact degradation. Lateral intensity gradients across cells dominate after thermal cycling (TC) stress, attributed to current crowding near scribe defects. While current–voltage analysis alone does not give full insight on the degradation process, this study shows that distinct degradation modes can be further defined by multimodal electro-optical imaging (i.e., EL combined with photoluminescence and dark lock-in thermography). Neither UV exposure nor TC-accelerated stress testing alone replicates the same degradation signatures observed after outdoor deployment, suggesting that multiple degradation modes occur under concurrent stressors outdoors. Finally, spatial characterization of degradation modes in MHP PV mini-modules before and after accelerated stress testing lays the groundwork for developing targeted accelerated stress testing procedures through comparison with outdoor aging.

14 SOLAR ENERGY↗
NASA NTRS1976

Accelerated life testing effects on CMOS microcircuit characteristics, phase 1

An accelerated life test of sufficient duration to generate a minimum of 50% cumulative failures in lots of CMOS devices was conducted to provide a basis for determining the consistency of activation energy at 250 C. An investigation was made to determine whether any thresholds were exceeded during the high temperature testing, which could trigger failure mechanisms unique to that temperature. The usefulness of the 250 C temperature test as a predictor of long term reliability was evaluated.

Maximow, B.↗
DOE OSTI2020

Calibration of CDM-Based Creep Constitutive Model Using Accelerated Creep Test (ACT) Data

In conventional creep testing (CCT) a specimen is subject to constant load and temperature for a long-duration until creep rupture occurs. Conventional testing can be costly when considering the number of experiments needed to characterize the creep response of a material over a range of stress and temperature. To predict long-term creep-rupture properties, the time-temperature-stress superposition principle (TTSSP) approach has been employed where stress and/or temperature is applied at an elevated level; the result of which are extrapolated down to low stress and/or temperature conditions. These methods have been successful in predicting minimum-creep-strain-rate (MCSR) and stress-rupture (SR) but suffer from an inability to predict the creep deformation curve or account for changes in deformation mechanisms or aging that occurs at long-duration. An accelerated technique, termed the Stepped isostress method (SSM) allows the accelerated testing of materials to determine their creep deformation response. Unlike TTSSP tests, the SSM test employs a single specimen where the stress is periodically step increased until rupture. The SSM creep deformation curve is processed (time and strain shifted) to produce an accelerated creep deformation curve that represent the creep deformation curve at the initial stress level in SSM. A processing procedure for metals has yet to be developed. The research objective of this study is to develop a processing procedure for SSM test data using a creep-damage constitutive model. Triplicate SSM tests were conducted on Ni-based superalloy Inconel 718 at 650°C with stress being periodically increased until rupture. Triplicate CCT tests were conducted at the initial stress level of the SSM tests. The Sine-hyperbolic (Sinh) creep-damage model was employed in this study. The Sinh creep-damage constitutive model is based on coupled creep strain rate and damage evolution equations; where both rates are dependent on the current state of damage. Calibration is two-step: analytical and numerical optimization. Each stepped creep deformation curve is tackled quasi-analytically to determine MCSR and SR related material constants and accumulated damage. The damage accumulated at the end of each step was then passed onto subsequent steps to calibrate the MCSR, rupture prediction, and damage evolution. Numerical optimization was applied to optimize model constants involved in the creep strain constitutive equations in order to generate best-fitted Sinh creep deformation curves. The Sinh model predictions were compared to the SSM and CCT data. The Sinh model satisfactorily predicts the SSM data and thus the calibrated material constants provides a good estimate of rupture found in the CCT data. Calibration using SSM data reduces the number of tests needed to calibrate a model; significantly reducing costs. A single SSM test replaces numerous creep tests at different stresses.

36 MATERIALS SCIENCE↗
NASA NTRS1985

Accelerated stress testing of amorphous silicon solar cells

A technique for performing accelerated stress tests of large-area thin a-Si solar cells is presented. A computer-controlled short-interval test system employing low-cost ac-powered ELH illumination and a simulated a-Si reference cell (seven individually bandpass-filtered zero-biased crystalline PIN photodiodes) calibrated to the response of an a-Si control cell is described and illustrated with flow diagrams, drawings, and graphs. Preliminary results indicate that while most tests of a program developed for c-Si cells are applicable to a-Si cells, spurious degradation may appear in a-Si cells tested at temperatures above 130 C.

Stoddard, W. G.↗