Probabilistic Asteroid Impact Risk Assessment 2023 PDC Hypothetical Impact Exercise Scenario Epoch 1: Initial Discovery
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This presentation summarizes impact risk assessment results for Epoch 3 of the 2023 PDC hypothetical asteroid impact scenario. Epoch 3 represents the assessment phase after data is received from a fast fly-by reconnaissance mission, which refines direct size estimates, asteroid type, and impact location range.
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The prediction of large fluctuations in the ground magnetic field (dB/dt) is essential for preventing damage from Geomagnetically Induced Currents. Directly forecasting these fluctuations has proven difficult, but accurately determining the risk of extreme events can allow for the worst of the damage to be prevented. Here we trained Convolutional Neural Network models for eight mid-latitude magnetometers to predict the probability that dB/dt will exceed the 99th percentile threshold 30–60 min in the future. Two model frameworks were compared, a model trained using solar wind data from the Advanced Composition Explorer (ACE) satellite, and another model trained on both ACE and SuperMAG ground magnetometer data. The models were compared to examine if the addition of current ground magnetometer data significantly improved the forecasts of dB/dt in the future prediction window. A bootstrapping method was employed using a random split of the training and validation data to provide a measure of uncertainty in model predictions. The models were evaluated on the ground truth data during eight geomagnetic storms and a suite of evaluation metrics are presented. The models were also compared to a persistence model to ensure that the model using both datasets did not over-rely on dB/dt values in making its predictions. Overall, we find that the models using both the solar wind and ground magnetometer data had better metric scores than the solar wind only and persistence models, and was able to capture more spatially localized variations in the dB/dt threshold crossings.
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The rapid evolution of electronics has heralded countless benefits to humanity, enabling increases in computing power while decreasing costs. However, the constantly changing semiconductor device landscape proves to be an immense challenge for the reliability community, especially for those concerned with radiation effects on microelectronics. Changes in device manufacturing, from device structure to processing steps, may and often do change the way the device responds to radiation. While radiation hardened parts are not as much of a reliability concern, they also lag behind commercial off-the-shelf, or COTS, parts in terms of computing capabilities, some by over a decade. Many missions may have no choice but to utilize COTS. As such, these missions need to ensure their parts are reliable in the face of total ionizing dose (TID). However, part and testing facility costs limit the amount of testing possible.
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Calibration of computational models in the presence of uncertainty is often cast as a Bayesian inference problem and solved via sampling methods, e.g., Markov chain Monte Carlo. When the computational model is expensive, this task becomes intractable due to the large number of samples required to accurately estimate the posterior distribution of the calibration parameters. A popular solution to this problem is to use machine learning to develop a faster-to-evaluate, lower-fidelity substitute for the original model to serve as a surrogate while solving the inference problem. Although considered an offline cost, generating training data to construct this surrogate model can still be an expensive task in practice. An active learning algorithm is presented that focuses training on improving surrogate accuracy specifically in and around the bulk of the posterior distribution, as this is where the model is exercised during calibration. Candidate samples are drawn from families of distributions related to an approximation of the posterior. The sample maximizing predictive variance is then selected for evaluation by the original computational model, yielding a label for the training point. Iterating this approach increases efficiency relative to space filling designs (e.g., Latin hypercube sampling) by avoiding low probability points. Practical considerations are discussed, including the benefits of using a sequential Monte Carlo sampling approach, convergence heuristics, and the importance of both exploration and exploitation given that the true posterior is unknown a priori.
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