Engineering Papers⌕ Search

SEARCH · Engineering Papers

Results for “INTERFEROMETER”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

Quote a phrase for an exact phrase match. Source license links do not imply unrestricted reuse.

At least 1,387 records · Page 77
All sourcesNASA NTRSDOE OSTI
DOE OSTI2022

Magnetometer based on spin wave interferometer

A magnetic field detector and associated methods are shown. One example of a magnetic field detector uses spin wave interference to detect information about an external magnetic field.

Khitun, Alexander↗
NASA NTRS2000

Quantum Interferometry

Recently, several researchers, including yours truly, have been able to demonstrate theoretically that quantum photon entanglement has the potential to also revolutionize the entire field of optical interferometry, by providing many orders of magnitude improvement in interferometer sensitivity. The quantum entangled photon interferometer approach is very general and applies to many types of interferometers. In particular, without nonlocal entanglement, a generic classical interferometer has a statistical-sampling shot-noise limited sensitivity that scales like 1/Sqrt[N], where N is the number of particles (photons, electrons, atoms, neutrons) passing through the interferometer per unit time. However, if carefully prepared quantum correlations are engineered between the particles, then the interferometer sensitivity improves by a factor of Sqrt[N] (square root of N) to scale like 1/N, which is the limit imposed by the Heisenberg Uncertainty Principle. For optical (laser) interferometers operating at milliwatts of optical power, this quantum sensitivity boost corresponds to an eight-order-of-magnitude improvement of signal to noise. Applications are to tests of General Relativity such as ground and orbiting optical interferometers for gravity wave detection, Laser Interferometer Gravity Observatory (LIGO) and the European Laser Interferometer Space Antenna (LISA), respectively.

Dowling, Jonathan P.↗
NASA NTRS2003

The Micro-Arcsecond Metrology Testbed

The Micro-Arcsecond Metrology (MAM) testbed is a ground-based system of optical and electronic equipment for testing components, systems, and engineering concepts for the Space Interferometer Mission (SIM) and similar future missions, in which optical interferometers will be operated in outer space. In addition, the MAM testbed is of interest in its own right as a highly precise metrological system. The designs of the SIM interferometer and the MAM testbed reflect a requirement to measure both the position of the starlight central fringe and the change in the internal optical path of the interferometer with sufficient spatial resolution to generate astrometric data with angular resolution at the microarcsecond level. The internal path is to be measured by use of a small metrological laser beam of 1,319-nm wavelength, whereas the position of the starlight fringe is to be estimated by use of a charge-coupled-device (CCD) image detector sampling a large concentric annular beam. For the SIM to succeed, the optical path length determined from the interferometer fringes must be tracked by the metrological subsystem to within tens of picometers, through all operational motions of an interferometer delay line and siderostats. The purpose of the experiments performed on the MAM testbed is to demonstrate this agreement in a large-scale simulation that includes a substantial portion of the system in the planned configuration for operation in outer space. A major challenge in this endeavor is to align the metrological beam with the starlight beam in order to maintain consistency between the metrological and starlight subsystems at the system level. The MAM testbed includes an optical interferometer with a white light source, all major optical components of a stellar interferometer, and heterodyne metrological sensors. The aforementioned subsystems are installed in a large vacuum chamber in order to suppress atmospheric and thermal disturbances. The MAM is divided into two distinct subsystems: the test article (TA), which is the interferometer proper, and the inverse interferometer pseudo-star (IIPS), which synthesizes the light coming from a distant target star by providing spatially coherent wavefronts out of two mirrors, separated by the MAM baseline, that feed directly into two siderostats that are parts of the TA. The two feed mirrors of the IIPS are articulated (in translation and tilt) in order to simulate stars located at different orientations in space, while still illuminating the TA siderostats. The spectrum of the simulated starlight of the IIPS corresponds to that of a blackbody at a temperature of about 3,100 K.

Goullioud, Renaud↗
NASA NTRS2000

Phase-Shifting Liquid Crystal Point-Diffraction Interferometry

Microgravity fluid physics experiments frequently measure concentration and temperature. Interferometers such as the Twyman Green illustrated have performed full-field measurement of these quantities. As with most such devices, this interferometer uses a reference path that is not common with the path through the test section. Recombination of the test and reference wavefronts produces interference fringes. Unfortunately, in order to obtain stable fringes, the alignment of both the test and reference paths must be maintained to within a fraction of the wavelength of the light being used for the measurement. Otherwise, the fringes will shift and may disappear. Because these interferometers are extremely sensitive to bumping, jarring and transmitted vibration, they are typically mounted on optical isolation tables. Schlieren deflectometers or the more recent Shack-Hartmann wavefront sensors also measure concentration and temperature in laboratory fluid flows. Ray optics describe the operation of both devices. In a schlieren system, an expanded, collimated beam passes through a test section where refractive index gradients deflect rays. A lens focuses the beam to a filter placed in the rear focal plane of the decollimating lens. In a quantitative color schlieren system, gradients in the index of refraction appear as colors in the field of view due to the action of the color filter. Since sensitivity is a function of the focal length of the decollimating lens, these systems are rather long and filter fabrication and calibration is rather difficult. A Shack-Hartmann wavefront sensor is an array of small lenslets. Typical diameters are on the order of a few hundred microns. Since these lenslets divide the test section into resolution elements, the spatial resolution can be no smaller than an individual lenslet. Such a device was recently used to perform high-speed tomography of heated air exiting a 1.27 cm diameter nozzle. While these wavefront sensors are very compact, the limited spatial resolution and the methods required for data reduction suggest that a more useful instrument needs to be developed. The category of interferometers known as common path interferometers can eliminate much of the vibration sensitivity associated with traditional interferometry as described above. In these devices, division of the amplitude of the wavefront following the test section produces the reference beam. Examples of these instruments include shearing and point diffraction interferometers. In the latter case, shown schematically, a lens focuses light passing through the test section onto a small diffracting object. Such objects are typically either a circle of material on a high quality glass plate or a small sphere in a glass cell. The size of the focused spot is several times larger than the object so that the light not intercepted by the diffracting object forms the test beam while the diffracted light generates a spherical reference beam. While this configuration is mechanically stable, phase shifting one beam with respect to the other is difficult due to the common path. Phase shifting enables extremely accurate measurements of the phase of the interferogram using only gray scale intensity measurements and is the de facto standard of industry. Mercer and Creath 2 demonstrated phase shifting in a point diffraction interferometer using a spherical spacer in a liquid crystal cell as the diffracting object. By changing the voltage across the cell, they were able to shift the phase of the undiffracted beam relative to the reference beam generated by diffraction from the sphere. While they applied this technology to fluid measurements, the device shifted phase so slowly that it was not useful for studying transient phenomena. We have identified several technical problems that precluded operation of the device at video frame rates and intend to solve them to produce a phase-shifting liquid crystal point-diffraction interferometer operating at video frame rates. The first task is to produce high contrast fringes. Since the diffracted beam is much weaker than the transmitted beam, interferograms have poor contrast unless a dye is added to the liquid crystal to reduce the intensity of the undiffracted light. Dyes previously used were not rigorously characterized and suffered from hysteresis in both the initial alignment state of the device and the electro-optic switching characteristics. Hence, our initial effort will identify and characterize dyes that do not suffer from these difficulties and are readily soluble in the liquid crystal host. Since the ultimate goal of this research is to produce interferometers capable of phase shifting at video frame rates, we will quantify the difference in switching times between ferroelectric and nematic liquid crystals. While we have more experience with nematic crystals, they typically switch more slowly than ferroelectric cells. As part of that effort, we will investigate the difference in the modulation of the interferograms as a function of the type of liquid crystal in the cell. Because the temporal switching response of a liquid crystal cell is directly related its thickness, we intend to explore techniques required to produce cells that are as thin as possible. However, the cells must still produce a total phase shift of two pi radians.

Griffin, DeVon W.↗
NASA NTRS2005

Precision Cryogenic Dilatometer

A dilatometer based on a laser interferometer is being developed to measure mechanical creep and coefficients of thermal expansion (CTEs) of materials at temperatures ranging from ambient down to 15 K. This cryogenic dilatometer has been designed to minimize systematic errors that limit the best previously available dilatometers. At its prototype stage of development, this cryogenic dilatometer yields a strain measurement error of 35 ppb or 1.7 ppb/K CTE measurement error for a 20-K thermal load, for low-expansion materials in the temperature range from 310 down to 30 K. Planned further design refinements that include a provision for stabilization of the laser and addition of a high-precision sample-holding jig are expected to reduce the measurement error to 5-ppb strain error or 0.3-ppb/K CTE error for a 20-K thermal load. The dilatometer (see figure) includes a common-path, differential, heterodyne interferometer; a dual-frequency, stabilized source bench that serves as the light source for the interferometer; a cryogenic chamber in which one places the material sample to be studied; a cryogenic system for cooling the interior of the chamber to the measurement temperature; an ultra-stable alignment stage for positioning the chamber so that the sample is properly positioned with respect to the interferometer; and a data-acquisition and control system. The cryogenic chamber and the interferometer portion of the dilatometer are housed in a vacuum chamber on top of a vibration isolating optical table in a cleanroom. The sample consists of two pieces a pillar on a base both made of the same material. Using reflections of the interferometer beams from the base and the top of the pillar, what is measured is the change in length of the pillar as the temperature in the chamber is changed. In their fundamental optical and electronic principles of operation, the laser light source and the interferometer are similar to those described in Common-Path Heterodyne Interferometers (NPO-20786), NASA Tech Briefs, Vol. 25, No. 7 (July 2001), page 12a, and Interferometer for Measuring Displacement to Within 20 pm (NPO- 21221), NASA Tech Briefs, Vol. 27, No. 7 (July 2003), page 8a. However, the present designs incorporate a number of special geometric, optical, and mechanical features to minimize optical and thermal-expansion effects that contribute to measurement errors. These features include the use of low-thermal expansion materials for structural components, kinematic mounting and symmetrical placement of optical components, and several measures taken to minimize spurious reflections of laser beams.

Dudik, Matthew↗
DOE OSTI2017

Porosity detection in electron beam-melted Ti-6Al-4V using high-resolution neutron imaging and grating-based interferometry

A high-resolution neutron tomography system and a grating-based interferometer are used to explore electron beam-melted titanium test objects. The high-resolution neutron tomography system (attenuation-based imaging) has a pixel size of 6.4 µm, appropriate for detecting voids near 25 µm over a (1.5 cm) 3 volume. The neutron interferometer provides dark-field (small-angle scattering) images with a pixel size of 30 µm. Moreover, the interferometer can be tuned to a scattering length, in this case, 1.97 µm, with a field-of-view of (6 cm)3. The combination of high-resolution imaging with grating-based interferometry provides a way for nondestructive testing of defective titanium samples. A chimney-like pore structure was discovered in the attenuation and dark-field images along one face of an electron beam-melted (EBM) Ti-6Al-4V cube. Tomographic reconstructions of the titanium samples are utilized as a source for a binary volume and for skeletonization of the pores. As a result, the dark-field volume shows features with dimensions near and smaller than the interferometer auto-correlation scattering length.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗