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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 1,279 records · Page 71
All sourcesNASA NTRSDOE OSTI
DOE OSTI2024

Ground-motions site and event specificity: Insights from assessing a suite of simulated ground motions in the San Francisco Bay Area

This article presents the results of a research that is part of a larger collaborative effort between the Lawrence Berkeley National Laboratory and the Pacific Earthquake Engineering Research Center, funded by the US Department of Energy Office of Cybersecurity, Energy Security and Emergency Response. The main objective of this study is to assess a suite of near and far-field simulated ground motions obtained from 20 realizations of an M7 Hayward Fault earthquake in the San Francisco Bay Area, California USA, and inform the selection of rupture simulation parameters leading to strong motions. To this aim, comparisons are conducted with NGA-W2 and directivity ground-motion models and a selected population of records. An archetypal steel moment-resisting frame is utilized to assess infrastructure response distributions. The analyses carried out for each simulated event and subdomain with consistent properties in terms of shallow shear-wave velocity proved to be instrumental for better interpreting the differences between simulated motions and empirical models. The main reasons identified for variances between simulations and empirical relationships included (1) directivity effects fully captured by the simulations across the full breadth of rupture models; (2) site vicinity to ruptures that incorporate large-slip patches, particularly if these are in the forward-directivity direction; and (3) presence of geologic structures that can “trap” seismic waves and produce ground motions with large amplitude and long signal duration. The analyses carried out in this work provide a path for interpreting ground-motion site and event specificity obtained from a suite of physics-based simulations, differing only in the rupture model characterization, to inform the selection of simulation scenarios for site-specific engineering analyses under strong excitations. Evidence from this work points to the possibility that current hazard models may underestimate ground-motion intensities in areas where the combined effect of directivity and site conditions results in large ground-motion amplitudes.

58 GEOSCIENCES↗
DOE OSTI2021

Supporting Co-Design of Extreme-Scale Systems with In Situ Visual Analysis of Event-Driven Simulations (Final Report)

Extreme-scale systems for compute- and data-centric science are pushing the boundaries of system architectures in order to achieve ambitious goals in terms of computing capability, resilience, and power efficiency. Future systems necessitate emerging designs that incorporate new technologies, system organizations, and computer science techniques, and these changes are not yet well understood. Discrete-event-driven simulation of computing system architectures and subsystems has emerged as a productive and cost-effective means to evaluating potential designs, along with capabilities for executing these simulations of extreme-scale systems. However, techniques for analyzing the behavior of these simulations have not kept pace with our ability to perform the simulations, preventing us from extracting the most value from this promising approach. The objective of this project is to support the codesign of extreme-scale system architectures for compute and data-centric science through research and development of novel methods for analysis and visualization of large-scale event-driven simulations.

97 MATHEMATICS AND COMPUTING↗
DOE OSTI2021

Feasibility Study of Developing Alternative Common-Cause Failure Model for Event Assessment

This report is a revision of the original report, INL/LTD-14-33376. The original report, which was a limited distribution to the Nuclear Regulatory Commission (NRC) only and not available to the public, was revised as this report for public distribution. The report presents the feasibility study of alternative common-cause failure (CCF) models that could be used for event assessment in the Standardized Plant Analysis Risk (SPAR) models. The current CCF model used by the SPAR models is the alpha factor model. The proposed alternative CCF models are the partial alpha factor model and general dependency model. These alternative CCF models are reviewed and compared to the current alpha factor model, with the partial alpha factor model being identified as the preferred CCF model that could be used for event assessment in the SPAR models.

21 SPECIFIC NUCLEAR REACTORS AND ASSOCIATED PLANTS↗
NASA NTRS2002

Single event upset susceptibility testing of the Xilinx Virtex II FPGA

Heavy ion testing of the Xilinx Virtex IZ was conducted on the configuration, block RAM and user flip flop cells to determine their single event upset susceptibility using LETs of 1.2 to 60 MeVcm^2/mg. A software program specifically designed to count errors in the FPGA is used to reveal L1/e values and single-event-functional interrupt failures.

FPGA Xilinx Virtex static test single event upset↗
NASA NTRS2012

Survival of Flux Transfer Event (FTE) Flux Ropes Far Along the Tail Magnetopause

During intervals of southward IMF, magnetic reconnection can result in the formation of flux transfer events (FTEs) on the dayside magnetopause which travel along the magnetopause in the anti-sunward direction. Of particular interest is their fate and the role they play transporting solar wind plasma into the magnetosphere. We present the discovery of FTEs far along the distant tail magnetopause (x = 67 Earth radii) using data from ARTEMIS on the dusk flank magnetopause under southward/duskward IMF conditions. The identification of several events is further supported by excellent fits to a force-free flux rope model. The axis of each structure is principally north-south, i.e., perpendicular to the Sun-Earth line. Simultaneous observations by THEMIS on the dayside magnetopause indicate that FTEs are being produced there, although perhaps 2-4 times smaller in size. The convection time from the dayside magnetopause to ARTEMIS is 30 min, and the FTEs have a flux content comparable to those typically observed on the dayside magnetopause, indicating that these features are in quasi-equilibrium as they are convected downtail. By considering the relative orientations of the FTEs observed by THEMIS and ARTEMIS, the magnetic field geometry is consistent with the FTEs being produced on the dayside magnetopause along an extended X-line in the presence of IMF By and bending as they are convected to the flanks.

ARTEMIS↗
NASA NTRS2014

Criticality of Low-Energy Protons in Single-Event Effects Testing of Highly-Scaled Technologies

We report low-energy proton and low-energy alpha particle single-event effects (SEE) data on a 32 nm silicon-on-insulator (SOI) complementary metal oxide semiconductor (CMOS) latches and static random access memory (SRAM) that demonstrates the criticality of using low-energy protons for SEE testing of highly-scaled technologies. Low-energy protons produced a significantly higher fraction of multi-bit upsets relative to single-bit upsets when compared to similar alpha particle data. This difference highlights the importance of performing hardness assurance testing with protons that include energy distribution components below 2 megaelectron-volt. The importance of low-energy protons to system-level single-event performance is based on the technology under investigation as well as the target radiation environment.

random access memory↗
NASA NTRS2014

Analysis of Inter-Moss Loops in the Solar Region with IRIS and SDO AIA: Automatic Event Detection and Characterization

The Interface Region Imaging Spectrograph (IRIS), launched in the summer of 2013, is designed specifically to observe and investigate the transition region and adjacent layers of the solar atmosphere, obtaining images in high spatial, temporal, and spectral resolution. Our particular work is focused on the evolution of inter-moss loops, which have been detected in the lower corona by the Atmospheric Imaging Assembly (AIA) and the High-Resolution Coronal Imager (Hi- C), but are known to have foot points below the transition region. With the high-resolution capabilities of IRIS and its Si IV pass band, which measures activity in the upper chromosphere, we can study these magnetic loops in detail and compare their characteristic length and time scales to those obtained from several AIA image sets, particularly the 171, 193, and 211 pass bands. By comparing the results between these four data sets, one can potentially establish a measure of the ionization equilibrium for the location in question. To explore this idea, we found a large, sit-and-stare observation within the IRIS database that fit our specifications. This data set contained a number of well-defined inter-moss loops (by visual inspection) with a cadence less than or equal to that of AIA (approximately 12 seconds). This particular data set was recorded on October 23, 2013 at 07:09:30, lasting for 3219 seconds with a field of view of 120.6 by 128.1 arcseconds, centered on -53.9 by 59.1 arcseconds from disk center. For ease of comparison, the AIA data has been interpolated to match the IRIS cadence and resolution. In the main portion of the poster, we demonstrate the detection of events, the information collected, and the immediate results to the right, showing the progress of an event with green as the start, blue as the peak, and red as the end. Below here, we demonstrate how pixels are combined to form groups. The 3D results are shown to the right.

event detection↗
NASA NTRS2012

Single Event Rates for Devices Sensitive to Particle Energy

Single event rates (SER) can include contributions from low-energy particles such that the linear energy transfer (LET) is not constant. Previous work found that the environmental description that is most relevant to the low-energy contribution to the rate is a "stopping rate per unit volume" even when the physical mechanisms for a single-event effect do not require an ion to stop in some device region. Stopping rate tables are presented for four heavy-ion environments that are commonly used to assess device suitability for space applications. A conservative rate estimate utilizing limited test data is derived, and the example of SEGR rate in a power MOSFET is presented.

conservative rate↗
NASA NTRS2011

Improving Single Event Effects Testing Through Software

Radiation encountered in space environments can be damaging to microelectronics and potentially cause spacecraft failure. Single event effects (SEE) are a type of radiation effect that occur when an ion strikes a device. Single event gate rupture (SEGR) is a type of SEE that can cause failure in power transistors. Unlike other SEE rates in which a constant linear energy transfer (LET) can be used, SEGR rates sometimes require a non-uniform LET to be used to be accurate. A recent analysis shows that SEGR rates are most easily calculated when the environment is described as a stopping rate per unit volume for each ion species. Stopping rates in silicon for pertinent ions were calculated using the Stopping and Range of Ions in Matter (SRIM) software and CREME-MC software. A reference table was generated and can be used by others to calculate SEGR rates for a candidate device. Additionally, lasers can be used to simulate SEEs, providing more control and information at lower cost than heavy ion testing. The electron/hole pair generation rate from a laser pulse in a semiconductor can be related to the LET of an ion. MATLAB was used to generate a plot to easily make this comparison.

generation equation↗
NASA NTRS2015

Test Standard Revision Update: JESD57, "Procedures for the Measurement of Single-Event Effects in Semiconductor Devices from Heavy-Ion Irradiation"

The JEDEC JESD57 test standard, Procedures for the Measurement of Single-Event Effects in Semiconductor Devices from Heavy-Ion Irradiation, is undergoing its first revision since 1996. In this talk, we place this test standard into context with other relevant radiation test standards to show its importance for single-event effect radiation testing for space applications. We show the range of industry, government, and end-user party involvement in the revision. Finally, we highlight some of the key changes being made and discuss the trade-space in which setting standards must be made to be both useful and broadly adopted.

heavy ion↗
NASA NTRS2015

Application of Data Cubes for Improving Detection of Water Cycle Extreme Events

As part of an ongoing NASA-funded project to remove a longstanding barrier to accessing NASA data (i.e., accessing archived time-step array data as point-time series), for the hydrology and other point-time series-oriented communities, "data cubes" are created from which time series files (aka "data rods") are generated on-the-fly and made available as Web services from the Goddard Earth Sciences Data and Information Services Center (GES DISC). Data cubes are data as archived rearranged into spatio-temporal matrices, which allow for easy access to the data, both spatially and temporally. A data cube is a specific case of the general optimal strategy of reorganizing data to match the desired means of access. The gain from such reorganization is greater the larger the data set. As a use case of our project, we are leveraging existing software to explore the application of the data cubes concept to machine learning, for the purpose of detecting water cycle extreme events, a specific case of anomaly detection, requiring time series data. We investigate the use of support vector machines (SVM) for anomaly classification. We show an example of detection of water cycle extreme events, using data from the Tropical Rainfall Measuring Mission (TRMM).

water cycle extreme events↗
NASA NTRS2016

Single-Event Latchup Testing of the Micrel MIC4424 Dual Power MOSFET Driver

We conducted 47 exposures of four different MIC4424 devices and did not observe any SEL or high-current events. This included worst-case conditions with a LET of 81 MeV-sq cm/mg, applied voltage of 18.5 V, a case temperature greater than 120 C, and a final fluence of 1x10(exp 7)/sq cm. We also monitored both the outputs for the presence of SETs. While the period of the 1 MHz square wave was slightly altered in some cases, no pulses were added or deleted. 1. Purpose: The purpose of this testing is to characterize the BiCMOS/DMOS Micrel MIC4424 dual, non-inverting MOSFET driver for single-event latchup (SEL) susceptibility. These data will be used for flight lot evaluation purposes. 2. Devices Tested: The MIC4423/4424/4425 family are highly reliable BiCMOS/DMOS buffer/driver MOSFET drivers. They are higher output current versions of the MIC4426/4427/4428. They can survive up to 5V of noise spiking, of either polarity, on the ground pin. They can accept, without either damage or logic upset, up to half an amp of reverse current (either polarity) forced back into their outputs. Primarily intended for driving power MOSFETs, the MIC4423/4424/4425 drivers are suitable for driving other loads (capacitive, resistive, or inductive) which require low-impedance, high peak currents, and fast switching times. Heavily loaded clock lines, coaxial cables, or piezoelectric transducers are some examples. The only known limitation on loading is that total power dissipated in the driver must be kept within the maximum power dissipation limits of the package. Five (5) parts were provided for SEL testing. We prepared four parts for irradiation and reserved one piece as an un-irradiated control. More information about the devices can be found in Table 1. The parts were prepared for testing by removing the lid from the CDIP package to expose the target die. The parts were then soldered to small copper circuit adapter boards for easy handling. These parts are fabricated in a bulk BiCMOS/DMOS technology. Since we do not know the number of overlayers used in the fabrication processes, linear energy transfer calculations are determined based on the top-surface incident ion species and kinetic energy.

Power MOSFET↗
NASA NTRS2014

Single-Event Effect Testing of the Cree C4D40120D Commercial 1200V Silicon Carbide Schottky Diode

This study was undertaken to determine the single event effect (SEE) susceptibility of the commercial silicon carbide 1200V Schottky diode manufactured by Cree, Inc. Heavy-ion testing was conducted at the Texas A&M University Cyclotron Single Event Effects Test Facility (TAMU). Its purpose was to evaluate this device as a candidate for use in the Solar-Electric Propulsion flight project.

silicon carbide (SiC)↗
NASA NTRS2017

Binary Source Microlensing Event OGLE-2016-BLG-0733: Interpretation of a Long-Term Asymmetric Perturbation

In the process of analyzing an observed light curve, one often confronts various scenarios that can mimic the planetary signals causing difficulties in the accurate interpretation of the lens system. In this paper, we present the analysis of the microlensing event OGLE-2016-BLG-0733. The light curve of the event shows a long-term asymmetric perturbation that would appear to be due to a planet. From the detailed modeling of the lensing light curve, however, we find that the perturbation originates from the binarity of the source rather than the lens. This result demonstrates that binary sources with roughly equal-luminosity components can mimic long-term perturbations induced by planets with projected separations near the Einstein ring. The result also represents the importance of the consideration of various interpretations in planet-like perturbations and of high-cadence observations for ensuring the unambiguous detection of the planet.

microlensing event OGLE-2016-BLG-0733↗
NASA NTRS2018

NASA Electronic Parts and Packaging (NEPP) Field Programmable Gate Array (FPGA) Single Event Effects (SEE) Test Guideline Update

The following are updated or new subjects added to the FPGA SEE Test Guidelines manual: academic versus mission specific device evaluation, single event latch-up (SEL) test and analysis, SEE response visibility enhancement during radiation testing, mitigation evaluation (embedded and user-implemented), unreliable design and its affects to SEE Data, testing flushable architectures versus non-flushable architectures, intellectual property core (IP Core) test and evaluation (addresses embedded and user-inserted), heavy-ion energy and linear energy transfer (LET) selection, proton versus heavy-ion testing, fault injection, mean fluence to failure analysis, and mission specific system-level single event upset (SEU) response prediction. Most sections within the guidelines manual provide information regarding best practices for test structure and test system development. The scope of this manual addresses academic versus mission specific device evaluation and visibility enhancement in IP Core testing.

Test guidelines↗