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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.
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Brazing process employs an aluminum-silicon filler alloy for diffusion bonding of aluminum parts in a vacuum or inert gas atmosphere. This process is carried out at temperatures substantially below those required in conventional process and produces bonds of greater strength and reliability.
Chemical milling process aids the production of 6.5 percent silicon-iron soft magnetic-alloy sheets to very thin gages. Following conventional rolling to safe gage limits, the material is chemically reduced to the desired gage.
45 MeV electron radiation effect on electrical properties and isochronal annealing behavior of N-type silicon
Isochronal annealing from 80 to 360 degrees K of defects induced by 45-mev electrons in floating zone and pulled n-type silicon
Light activated low level switch consisting of electroluminescent GaAs p-n diode and double emitter silicon transistor
Gallium arsenide and silicon solar cells under proton irradiation, noting decrease of short circuit current and open circuit voltage
Partial phase diagram of titanium chromium iron silicon boron system
Partial phase diagram of titanium aluminum chromium iron silicon boron system
Phase composition of alloys of titanium aluminum chromium iron silicon system
Balanced filters evaluated for performance in X-ray fluorescence analysis of lunar and planetary surface materials
Subthreshold electron irradiation effects on surface recombination properties of n- and p-type germanium and silicon crystals
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Thermoelectric properties as function of time and temperature for phosphorous doped n-type silicon-germanium alloy
Thermal feedback theory for silicon junction FET operating at low temperatures
Elastic and inelastic scattering of proton beams from magnesium and silicon isotopes, using optical model
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Oxidation of nickel alloys determined by X ray diffraction, weight and thickness change measurements, and electron microprobe analysis
Infrared spectroscopic and photoconductivity determinations of electron irradiation effects in Li-doped floating zone and crucible grown silicon