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At least 127 records · Page 7
All sourcesNASA NTRSDOE OSTI
DOE OSTI2023

The effect of current and lambda on white-etch-crack failures

White etching cracks (WECs) have been associated with premature failure of wind turbine roller bearings. Various drivers for the generation of WECs have been identified such as loading conditions, slip, steel quality, lubrication, hydrogen embrittlement, corrosion fatigue cracking, and stray electrical currents passing through the surface. Here, in this work, a benchtop test rig utilizing a three-ring-on-roller test configuration was used to investigate the effect of electrical current and operation in different lubricating regimes, defined by lambda (λ), on high-quality bearing steel samples tested in a commercially available power transmission EP gear lubricant. It was observed that there is an inverse correlation between the magnitude of electric current applied to the ring/ roller system and time-to-failure. Higher current magnitudes lead to shorter time-to-failure than lower current magnitudes, with macropitting as the main failure mode. Sub-surface investigation revealed the presence of WECs in all cases. For the same current magnitude, tests conducted in boundary and mixed lubrication regimes showed that time-to-failure increased as lambda increased, and the tests resulted in WEC related macropits, whereas tests conducted in near-hydrodynamic regime resulted in surface damage with no macropit. It was also noted that a shift toward near-hydrodynamic lubrication resulted in a distinct surface distress on the roller surface. Furthermore, there seems to be a transition in the mixed regime during which the surface distress occurred. The damage on the surface of the test samples resembled non-spatially, periodic, groove-like corrugations and, in some cases, crater-like depressions. Sub-surface imaging, performed by sequential sectioning, revealed the presence of WECs in all cases, and broad, branching cracks that were more prevalent under the more severe boundary conditions.

17 WIND ENERGY↗
NASA NTRS2001

Dynamic Fatigue of ULE Glass

Ultra Low Expansion (ULE) glass is used in a number of applications which require a low thermal expansion coefficient. One such application is telescope mirror elements. An allowable stress can be calculated for this material based upon modulus of rupture data; however, this does not take into account the problem of delayed failure. Delayed failure, due to stress corrosion can significantly shorten the lifetime of a glass article. Knowledge of the factors governing the rate of subcritical flaw growth in a given environment enables the development of relations between lifetime, applied stress and failure probability for the material under study. Dynamic fatigue is one method of obtaining the necessary information to develop these relationships. In this study, the dynamic fatigue method was used to construct time-to-failure diagrams for both 230/270 ground and optically polished samples. The grinding and polishing process reduces the surface flaw size and subsurface damage, and relieves residual stress by removing materials with successively smaller grinding media. This resulted in an increase in the strength of the optic during the grinding and polishing sequence. There was also an increase in the lifetime due to grinding and polishing. It was found that using the fatigue parameters determined from the 230/270 grit surface are not significantly different from the optically polished values. Although the lower bound of the polished samples is more conservative, neither time-to-failure curves lie beyond the upper or lower bound of the confidence limits. Therefore, designers preferring conservative limits could use samples without residual stress present (polished samples) to determine the fatigue parameters and inert Weibull parameters from samples with the service condition surface, to determine time-to-failure of the optical element.

Tucker, Dennis S.↗
NASA NTRS1985

The (RH+t) aging correlation. Electrical resistivity of PVB at various temperatures and relative humidities

Electrical products having organic materials functioning as pottants, encapsulants, and insulation coatings are commonly exposed to elevated conditions of temperature and humidity. In order to assess service life potential from this method of accelerated aging, it was empirically observed that service life seems proportional to an aging correlation which is the sum of temperature in degrees Celsius (t), and the relative humidity (RH) expressed in percent. Specifically, the correlation involves a plot of time-to-failure on a log scale versus the variable RH + T plotted on a linear scale. A theoretical foundation is provided for this empirically observed correlation by pointing out that the correlation actually involves a relationship between the electrical resistivity (or conductivity) of the organic material, and the variable RH + t. If time-to-failure is a result of total number of coulombs conducted through the organic material, then the correlation of resistivity versus RH + t is synonymous with the empirical correlation of time-to-failure versus RH + t.

Cuddihy, E. F.↗
NASA NTRS2003

Lifetime Predictions of a Titanium Silicate Glass with Machined Flaws

A dynamic fatigue study was performed on a Titanium Silicate glass to assess its susceptibility to delayed failure and to compare the results with those of a previous study. Fracture mechanics techniques were used to analyze the results for the purpose of making lifetime predictions. The material strength and lifetime was seen to increase due to the removal of residual stress through grinding and polishing. Influence on time-to-failure is addressed for the case with and without residual stress present. Titanium silicate glass otherwise known as ultra-low expansion (ULE)* glass is a candidate for use in applications requiring low thermal expansion characteristics such as telescope mirrors. The Hubble Space Telescope s primary mirror was manufactured from ULE glass. ULE contains 7.5% titanium dioxide which in combination with silica results in a homogenous glass with a linear expansion coefficient near zero. delayed failure . This previous study was based on a 230/270 grit surface. The grinding and polishing process reduces the surface flaw size and subsurface damage, and relieves residual stress by removing the material with successively smaller grinding media. This results in an increase in strength of the optic during the grinding and polishing sequence. Thus, a second study was undertaken using samples with a surface finish typically achieved for mirror elements, to observe the effects of surface finishing on the time-to-failure predictions. An allowable stress can be calculated for this material based upon modulus of rupture data; however, this does not take into account the problem of delayed failure, most likely due to stress corrosion, which can significantly shorten lifetime. Fortunately, a theory based on fracture mechanics has been developed enabling lifetime predictions to be made for brittle materials susceptible to delayed failure. Knowledge of the factors governing the rate of subcritical flaw growth in a given environment enables the development of relations between lifetime, applied stress and failure probability for the material under study. Dynamic fatigue is one method of obtaining the necessary information to develop these relationships. In this study, the dynamic fatigue method was used to construct a time-to-failure diagram for polished ULE glass.

Tucker, Dennis S.↗
NASA NTRS1992

Availability analysis of the traveling-wave maser amplifiers in the deep space network. Part 1: The 70-meter antennas

The results of the reliability and availability analyses of the individual S- and X-band traveling-wave maser (TWM) assemblies and their operational configurations in the 70-meter antennas of NASA's Deep Space Network (DSN) are described. For the period 1990 through 1991, the TWM availability parameters for the Telemetry Data System are: mean time between failures (MTBF), 930 hr; mean time to restore services (MTTRS), 1.4 hr; and the average availability, 99.85 percent. In previously published articles, the performance analysis of the TWM assemblies was confined to the determination of the parameters specified above. However, as the mean down time (MDT) for the repair of TWM's increases, the levels of the TWM operational availabilities and MTTRS are adversely affected. A more comprehensive TWM availability analysis is presented to permit evaluation of both MTBF and MDT effects. Performance analysis of the TWM assemblies, based on their station monthly failure reports, indicates that the TWM's required MTBF and MDT levels of 3000 hr and 36 to 48 hr, respectively, have been achieved by the TWM's only at the Canberra Deep Space Station (DSS 43). The Markov Process technique is employed to develop suitable availability measures for the S- and X-band TWM configurations when each is operated in a two-assembly standby mode. The derived stochastic expressions allow for the evaluation of those configurations' simultaneous availability for the Antenna Microwave Subsystem. The application of these expressions to demonstrate the impact of various levels of TWM maintainability (or MDT) on their configurations' operational availabilities is presented for each of the 70-m antenna stations.

Issa, T. N.↗
NASA NTRS2015

Insulation Resistance Degradation in Ni-BaTiO3 Multilayer Ceramic Capacitors

Insulation resistance (IR) degradation in Ni-BaTiO3 multilayer ceramic capacitors has been characterized by the measurement of both time to failure and direct-current (DC) leakage current as a function of stress time under highly accelerated life test conditions. The measured leakage current-time dependence data fit well to an exponential form, and a characteristic growth time SD can be determined. A greater value of tau(sub SD) represents a slower IR degradation process. Oxygen vacancy migration and localization at the grain boundary region results in the reduction of the Schottky barrier height and has been found to be the main reason for IR degradation in Ni-BaTiO3 capacitors. The reduction of barrier height as a function of time follows an exponential relation of phi (𝑡)=phi (0)e(exp -2Κt), where the degradation rate constant 𝐾=𝐾o𝑒(𝐸𝑘/𝑘𝑇) is inversely proportional to the mean time to failure (MTTF) and can be determined using an Arrhenius plot. For oxygen vacancy electromigration, a lower barrier height phi(0) will favor a slow IR degradation process, but a lower phi(0) will also promote electronic carrier conduction across the barrier and decrease the insulation resistance. As a result, a moderate barrier height phi(0) (and therefore a moderate IR value) with a longer MTTF (smaller degradation rate constant 𝐾) will result in a minimized IR degradation process and the most improved reliability in Ni-BaTiO3 multilayer ceramic capacitors.

dielectric degradation↗
NASA NTRS1979

IC Ku-band Impatt Amplifier

High efficiency GaAs low-high-low IMPATTs were investigated. Theoretical analyses were employed to establish a design window for the material parameters to maximize microwave performance. Single mesa devices yielded typically 2 to 3 W with 16 to 23% efficiency in waveguide oscillator test circuits. IMPATTs with high reliability Pt/TiW/Pt/Au metallizations were subjected to temperature stress, non-rf bias-temperature stress, and rf bias-temperature stress. Assuming that temperature is the driving force behind the dominant failure mechanism, a mean-time-to-failure considerably greater than 500,000 hours is indicated by the stress tests. A 15 GHz, 4W, 56 dB gain microstrip amplifier was realized using GaAs FETs and IMPATTs. Power combining using a 3 db Lange coupler is employed in the power output stage having an intrinsic power-added efficiency of 15.7%. Overall dc-to-rf efficiency of the amplifier is 10.8%. The amplifier has greater than a 250 MHz, 1 db bandwidth; operates over the 0 deg to 50 C (base plate) temperature range with less than 0.5 db change in the power output; weighs 444 grams; and has a volume of 220 cu cm.

Sokolov, V.↗
NASA NTRS1993

Comparative analysis of different configurations of PLC-based safety systems from reliability point of view

The study of a comparative analysis of distinct multiplex and fault-tolerant configurations for a PLC-based safety system from a reliability point of view is presented. It considers simplex, duplex and fault-tolerant triple redundancy configurations. The standby unit in case of a duplex configuration has a failure rate which is k times the failure rate of the standby unit, the value of k varying from 0 to 1. For distinct values of MTTR and MTTF of the main unit, MTBF and availability for these configurations are calculated. The effect of duplexing only the PLC module or only the sensors and the actuators module, on the MTBF of the configuration, is also presented. The results are summarized and merits and demerits of various configurations under distinct environments are discussed.

Tapia, Moiez A.↗
NASA NTRS2014

Time-Dependent Behavior of High-Strength Kevlar and Vectran Webbing

High-strength Kevlar and Vectran webbings are currently being used by both NASA and industry as the primary load-bearing structure in inflatable space habitation modules. The time-dependent behavior of high-strength webbing architectures is a vital area of research that is providing critical material data to guide a more robust design process for this class of structures. This paper details the results of a series of time-dependent tests on 1-inch wide webbing including an initial set of comparative tests between specimens that underwent realtime and accelerated creep at 65 and 70% of their ultimate tensile strength. Variability in the ultimate tensile strength of the webbings is investigated and compared with variability in the creep life response. Additional testing studied the effects of load and displacement rate, specimen length and the time-dependent effects of preconditioning the webbings. The creep test facilities, instrumentation and test procedures are also detailed. The accelerated creep tests display consistently longer times to failure than their real-time counterparts; however, several factors were identified that may contribute to the observed disparity. Test setup and instrumentation, grip type, loading scheme, thermal environment and accelerated test postprocessing along with material variability are among these factors. Their effects are discussed and future work is detailed for the exploration and elimination of some of these factors in order to achieve a higher fidelity comparison.

Jones, Thomas C.↗
DOE OSTI2021

Summary of Previous Mechanical Test Data on ODS Alloys 14YWT and OFRAC up to 1000ºC

The Nanostructured Ferritic Alloys (NFA) 14YWT and OFRAC were developed for future fission and fusion nuclear energy reactors requiring high-temperature mechanical properties that are tolerant to extreme neutron irradiation environments. The NFA contain a high concentration of Ti-, Y- and O-enriched nanoclusters (NC) and ultra-fine grains to achieve high temperature strength and creep properties and high sink strength for trapping irradiation induced point defects to minimize hardening and swelling and transmutated He atoms to form intragranular nano-size bubbles that prevent formation of coarse bubbles on grain boundaries that cause embrittlement. The mechanical properties of 14YWT and OFRAC have been acquired from tensile and creep tests conducted in the past at Oak Ridge National Laboratory. The development of 14YWT started in 2000, resulting in the production of numerous heats. Tensile properties were obtained from eleven heats of 14YWT from room temperature to 800ºC. Tensile data for the SM10 heat of 14YWT was extended to 1,000ºC. Initial development of OFRAC occurred in 2016. Tensile tests conducted from room temperature to 800ºC revealed similar properties of OFRAC with those obtained from the newer generation of 14YWT heats. The creep properties of 14YWT-SM10 evaluated using constant stress tensile and load time-to-failure tests at 800ºC showed low minimum creep rates with stresses of 200 and 100 MPa. The single time-to-failure test of 14YWT-SM10 at 800ºC and 100 MPa was terminated after 20,357 hours with no specimen failure and a low creep strain of ~0.24 %. The creep properties of OFRAC determined from strain-rate jump tests at were similar those of 14YWT-SM10. The stress exponent for 14YWT and OFRAC at 800ºC are similar and are consistent with threshold stress behavior. Since both 14YWT and OFRAC are candidates for fuel cladding in future fast reactors, several fabrication studies were recently conducted and have successfully demonstrated that thin wall tubes can be fabricated from 14YWT and OFRAC by cold pilger rolling and high precision tube rolling. The high temperature mechanical properties and feasibility of fabricating thin wall tubes make 14YWT and OFRAC candidates for application as heat pipes in advanced micro-reactors. The purpose of this report is to summarize the previously obtained tensile and creep data at temperatures up to 1000ºC for NFA 14YWT and OFRAC that have been acquired over the past 20 years at ORNL.

22 GENERAL STUDIES OF NUCLEAR REACTORS↗
DOE OSTI2021

Resiliency in numerical algorithm design for extreme scale simulations

Here this work is based on the seminar titled ‘Resiliency in Numerical Algorithm Design for Extreme Scale Simulations’ held March 1–6, 2020, at Schloss Dagstuhl, that was attended by all the authors. Advanced supercomputing is characterized by very high computation speeds at the cost of involving an enormous amount of resources and costs. A typical large-scale computation running for 48 h on a system consuming 20 MW, as predicted for exascale systems, would consume a million kWh, corresponding to about 100k Euro in energy cost for executing 10 23 floating-point operations. It is clearly unacceptable to lose the whole computation if any of the several million parallel processes fails during the execution. Moreover, if a single operation suffers from a bit-flip error, should the whole computation be declared invalid? What about the notion of reproducibility itself: should this core paradigm of science be revised and refined for results that are obtained by large-scale simulation? Naive versions of conventional resilience techniques will not scale to the exascale regime: with a main memory footprint of tens of Petabytes, synchronously writing checkpoint data all the way to background storage at frequent intervals will create intolerable overheads in runtime and energy consumption. Forecasts show that the mean time between failures could be lower than the time to recover from such a checkpoint, so that large calculations at scale might not make any progress if robust alternatives are not investigated. More advanced resilience techniques must be devised. The key may lie in exploiting both advanced system features as well as specific application knowledge. Research will face two essential questions: (1) what are the reliability requirements for a particular computation and (2) how do we best design the algorithms and software to meet these requirements? While the analysis of use cases can help understand the particular reliability requirements, the construction of remedies is currently wide open. One avenue would be to refine and improve on system- or application-level checkpointing and rollback strategies in the case an error is detected. Developers might use fault notification interfaces and flexible runtime systems to respond to node failures in an application-dependent fashion. Novel numerical algorithms or more stochastic computational approaches may be required to meet accuracy requirements in the face of undetectable soft errors. These ideas constituted an essential topic of the seminar. The goal of this Dagstuhl Seminar was to bring together a diverse group of scientists with expertise in exascale computing to discuss novel ways to make applications resilient against detected and undetected faults. In particular, participants explored the role that algorithms and applications play in the holistic approach needed to tackle this challenge. This article gathers a broad range of perspectives on the role of algorithms, applications and systems in achieving resilience for extreme scale simulations. The ultimate goal is to spark novel ideas and encourage the development of concrete solutions for achieving such resilience holistically.

79 ASTRONOMY AND ASTROPHYSICS↗
DOE OSTI2023

OLCF Summit Supercomputer GPU Snapshots During Double-Bit Errors and Normal Operations

As we move into the exascale era, the power and energy footprints of high-performance computing (HPC) systems have grown significantly larger. Due to the harsh power and thermal conditions the system, components are exposed to extreme operating conditions. Operation of such modern HPC systems requires deep insights into long term system behavior to maintain its efficiency as well as its longevity. To help the HPC community to gain such insights, we provide double-bit errors using system telemetry data and logs collected from the Summit supercomputer, equipped with 27,648 Tesla V100 GPUs with 2nd-generation high-bandwidth memory (HBM2). The dataset relies on Nvidia XID records internally collected by GPU firmware at the time of failure occurrence, on the reboot-time logs of each Summit node, on node-level job scheduler records collected after each job termination, and on a 1Hz data rate from the baseboard management controllers (BMCs) of each Summit compute node using the OpenBMC event subscription protocol. Technical details can be found in the paper Oles et. al “Understanding GPU Memory Corruption at Extreme Scale: The Summit Case Study” ICS’24 (https://doi.org/10.1145/3650200.3656615).

97 MATHEMATICS AND COMPUTING↗
NASA NTRS1980

Study of intermittent field hardware failure data in digital electronics

The collection and analysis of data concerning intermittent dailures in digital devices was performed using data from a computer design for shipboard usage. The failure data consisted of actual field failures classified by failure mechanisms and their likelihood of having been intermittent, potentially intermittent, or hard. Each class was studies with respect to computer operation in the ranges of 0 to 2,000 hours, 0 to 5, hours, and 0 to 10,000 hours. The study was done at the computer level as well as the microcircuit level. Results indicate that as age increases, the quasi-intermittent failure rate increases and the mean time to failure descreases.

Oneill, E. J.↗
NASA NTRS1983

Cleanroom certification model

The Cleanroom software development methodology is designed to take the gamble out of product releases for both suppliers and receivers of the software. The ingredients of this procedure are a life cycle of executable product increments, representative statistical testing, and a standard estimate of the MTTF (Mean Time To Failure) of the product at the time of its release. A statistical approach to software product testing using randomly selected samples of test cases is considered. A statistical model is defined for the certification process which uses the timing data recorded during test. A reasonableness argument for this model is provided that uses previously published data on software product execution. Also included is a derivation of the certification model estimators and a comparison of the proposed least squares technique with the more commonly used maximum likelihood estimators.

Currit, P. A.↗
NASA NTRS1994

Hidden Markov Models for Fault Detection in Dynamic Systems

Continuous monitoring of complex dynamic systems is an increasingly important issue in diverse areas such as nuclear plant safety, production line reliability, and medical health monitoring systems. Recent advances in both sensor technology and computational capabilities have made on-line permanent monitoring much more feasible than it was in the past. In this paper it is shown that a pattern recognition system combined with a finite-state hidden Markov model provides a particularly useful method for modelling temporal context in continuous monitoring. The parameters of the Markov model are derived from gross failure statistics such as the mean time between failures. The model is validated on a real-world fault diagnosis problem and it is shown that Markov modelling in this context offers significant practical benefits.

Smyth, Padhraic↗
NASA NTRS2008

Scintillation Breakdowns in Chip Tantalum Capacitors

Scintillations in solid tantalum capacitors are momentarily local breakdowns terminated by a self-healing or conversion to a high-resistive state of the manganese oxide cathode. This conversion effectively caps the defective area of the tantalum pentoxide dielectric and prevents short-circuit failures. Typically, this type of breakdown has no immediate catastrophic consequences and is often considered as nuisance rather than a failure. Scintillation breakdowns likely do not affect failures of parts under surge current conditions, and so-called "proofing" of tantalum chip capacitors, which is a controllable exposure of the part after soldering to voltages slightly higher than the operating voltage to verify that possible scintillations are self-healed, has been shown to improve the quality of the parts. However, no in-depth studies of the effect of scintillations on reliability of tantalum capacitors have been performed so far. KEMET is using scintillation breakdown testing as a tool for assessing process improvements and to compare quality of different manufacturing lots. Nevertheless, the relationship between failures and scintillation breakdowns is not clear, and this test is not considered as suitable for lot acceptance testing. In this work, scintillation breakdowns in different military-graded and commercial tantalum capacitors were characterized and related to the rated voltages and to life test failures. A model for assessment of times to failure, based on distributions of breakdown voltages, and accelerating factors of life testing are discussed.

Teverovsky, Alexander↗
DOE OSTI2022

A High-Voltage High-Reliability Scalable Architecture for Electric Vehicle Power Electronics (Final Report)

This project developed and demonstrated new composite converter technologies that lead to high power density (> 20 kW/L) at power levels of 10s of kW, 100s of kW, or possibly higher, with fundamental advances in converter efficiency and Q that lead to substantial increases in mean time to failure (MTTF). These advantages were realized through development of new composite converter topologies that perform buck, boost, or other conversion functions and that are scalable to higher voltage and power levels through sharing of voltage and current stresses among multiple dissimilar partial-power converter modules. The project led to experimental demonstration of a125 kW multifunction electric vehicle power conversion system having in-creased dc bus voltage (950 V nominal, 1200 V peak) that interfaces a 200 V to 400 V battery pack, and that includes integrated level 2 wired charging and wireless charging functions. The project incorporated SiC MOSFET modules having switching frequencies in excess of 100 kHz, planar magnetics, a hierarchical control architecture that enables scaling to higher voltages and powers with additional converter modules, and a high-power density in excess of 20 kW/L. The research demonstrated how a more complex converter approach can increase mean-time-to-failure, even though the number of elements is increased. This is achieved through significant reduction of temperature rise through fundamentally superior converter circuit topologies. The research also demonstrated new high power planar magnetics that increase power density. The technology is appropriate to a variety of applications including EV power trains, EV charging, PV inverters, battery storage, and similar areas. These systems potentially can be manufactured in the U.S.

33 ADVANCED PROPULSION SYSTEMS↗
DOE OSTI2022

Photovoltaic System Health-State Architecture for Data-Driven Failure Detection

The timely detection of photovoltaic (PV) system failures is important for maintaining optimal performance and lifetime reliability. A main challenge remains the lack of a unified health-state architecture for the uninterrupted monitoring and predictive performance of PV systems. To this end, existing failure detection models are strongly dependent on the availability and quality of site-specific historic data. The scope of this work is to address these fundamental challenges by presenting a health-state architecture for advanced PV system monitoring. The proposed architecture comprises of a machine learning model for PV performance modeling and accurate failure diagnosis. The predictive model is optimally trained on low amounts of on-site data using minimal features and coupled to functional routines for data quality verification, whereas the classifier is trained under an enhanced supervised learning regime. The results demonstrated high accuracies for the implemented predictive model, exhibiting normalized root mean square errors lower than 3.40% even when trained with low data shares. The classification results provided evidence that fault conditions can be detected with a sensitivity of 83.91% for synthetic power-loss events (power reduction of 5%) and of 97.99% for field-emulated failures in the test-bench PV system. Finally, this work provides insights on how to construct an accurate PV system with predictive and classification models for the timely detection of faults and uninterrupted monitoring of PV systems, regardless of historic data availability and quality. Such guidelines and insights on the development of accurate health-state architectures for PV plants can have positive implications in operation and maintenance and monitoring strategies, thus improving the system’s performance.

photovoltaics↗