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At least 127 records · Page 7

Vacuum stability testing of Apollo 15 Scientific Instrument Module (SIM) non-metallic materials and reversion of silicone rubber in a motor switch

Vacuum stability screening tests were performed on the Apollo 15 Scientific Instrument Module (SIM) bay nonmetallic materials in accordance with the NASA document SP-R-0022. The testing was necessary to support the evaluation to determine the effect material outgassing contamination would have on the SIM bay optical lenses and sensing devices. The Apollo 15 SIM experiments were highly successful, therefore, it is assumed that contamination due to the outgassing of nonmetallic materials did not affect equipment operation. A related problem, the reversion of a silicone rubber grommet which affected an electrical motor switch operation is also reported.

Clancy, H. M.↗

SIMS analysis of extended impact features on LDEF experiment

Discussed here are the first Secondary Ion Mass Spectroscopy (SIMS) analysis of projectile material deposited in extended impact features on Ge wafers from the trailing edge. Although most capture cells lost their plastic film covers, they contain extended impact features that apparently were produced by high velocity impacts when the plastic foils were still intact. Detailed optical scanning of all bare capture cells from the trailing edge revealed more than 100 impacts. Fifty-eight were selected by scanning electron microscope (SEM) inspection as prime candidates for SIMS analysis. Preliminary SIMS measurements were made on 15 impacts. More than half showed substantial enhancements of Mg, Al, Si, Ca, and Fe in the impact region, indicating micrometeorites as the projectiles.

Amari, S.↗

SIMS chemical and isotopic analysis of impact features from LDEF experiments AO187-1 and AO187-2

Previous secondary ion mass spectrometry (SIMS) studies of extended impact features from LDEF capture cell experiment AO187-2 showed that it is possible to distinguish natural and man-made particle impacts based on the chemical composition of projectile residues. The same measurement technique has now been applied to specially prepared gold target impacts from experiment AO187-1 in order to identify the origins of projectiles that left deposits too thin to be analyzed by conventional energy-dispersive x-ray (EDX) spectroscopy. The results indicate that SIMS may be the method of choice for the analysis of impact deposits on a variety of sample surfaces. SIMS was also used to determine the isotopic compositions of impact residues from several natural projectiles. Within the precision of the measurements all analyzed residues show isotopically normal compositions.

Stadermann, Frank J.↗

Error Modeling of Multi-baseline Optical Truss: Application to SIM Metrology Truss Field Dependent Error - Part II

The current design of the Space Interferometry Mission (SIM) employs a 19 laser-metrology-beam system (also called L19 external metrology truss) to monitor changes of distances between the fiducials of the flight system's multiple baselines. The function of the external metrology truss is to aid in the determination of the time-variations of the interferometer baseline. The largest contributor to truss error occurs in SIM wide-angle observations when the articulation of the siderostat mirrors (in order to gather starlight from different sky coordinates) brings to light systematic errors due to offsets at levels of instrument components (which include comer cube retro-reflectors, etc.). This error is labeled external metrology wide-angle field-dependent error. Physics-based model of field-dependent error at single metrology gauge level is developed and linearly propagated to errors in interferometer delay. In this manner delay error sensitivity to various error parameters or their combination can be studied using eigenvalue/eigenvector analysis. Also validation of physics-based field-dependent model on SIM testbed lends support to the present approach. As a first example, dihedral error model is developed for the comer cubes (CC) attached to the siderostat mirrors. Then the delay errors due to this effect can be characterized using the eigenvectors of composite CC dihedral error. The essence of the linear error model is contained in an error-mapping matrix. A corresponding Zernike component matrix approach is developed in parallel, first for convenience of describing the RMS of errors across the field-of-regard (FOR), and second for convenience of combining with additional models. Average and worst case residual errors are computed when various orders of field-dependent terms are removed from the delay error. Results of the residual errors are important in arriving at external metrology system component requirements. Double CCs with ideally co-incident vertices reside with the siderostat. The non-common vertex error (NCVE) is treated as a second example. Finally combination of models, and various other errors are discussed.

comer cube retro-reflector↗

SIM PlanetQuest Key Project Precursor Observations to Detect Gas Giant Planets Around Young Stars

We present a review of precursor observing programs for the SIM PlanetQuest Key project devoted to detecting Jupiter mass planets around young stars. In order to ensure that the stars in the sample are free of various sources of astrometric noise that might impede the detection of planets, we have initiated programs to collect photometry, high contrast images, interferometric data and radial velocities for stars in both the Northern and Southern hemispheres. We have completed a high contrast imaging survey of target stars in Taurus and the Pleiades and found no definitive common proper motion companions within one arcsecond (140 AU) of the SIM targets. Our radial velocity surveys have shown that many of the target stars in Sco-Cen are fast rotators and a few stars in Taurus and the Pleiades may have sub-stellar companions. Interferometric data of a few stars in Taurus show no signs of stellar or sub-stellar companions with separations of <5 mas. The photometric survey suggests that approximately half of the stars initially selected for this program are variable to a degree (1(sigma) >0.1 mag) that would degrade the astrometric accuracy achievable for that star. While the precursor programs are still a work in progress, we provide a comprehensive list of all targets ranked according to their viability as a result of the observations taken to date. By far, the observable that removes the most targets from the SIM-YSO program is photometric variability.

astrophysics↗

Star Confusion Effect on SIM PlanetQuest Astrometric Performance

SIM PlanetQuest will measure star positions to an accuracy of a few microarcseconds using precise white light fringe measurements. One challenge for SIM observation scenario is "star confusion," where multiple stars are present in the instrument field of view. This is especially relevant for observing dim science targets because the density of number of stars increases rapidly with star magnitude. We study the effect of star confusion on the SIM astrometric performance due to systematic fringe errors caused by the extra photons from the confusion star(s}. Since star confusion from multiple stars may be analyzed as a linear superposition of the effect from single star confusion, we quantify the astrometric errors due to single star confusion surveying over many spectral types, including AOV, FOV, K5III, and MOV, and for various visual magnitude differences. To the leading order, the star confusion effect is characterized by the magnitude difference, spectral difference, and the angular separation between the target and confusion stars.Strategies for dealing with star confusion are presented. For example, since the presence of additional sources in the field of view leads to inconsistent delay estimates from different channels, with sufficient signal to noise ratio, the star confusion can be detected using chi-square statistics of fringe measurements from multiple spectral channels. An interesting result is that the star confusion can be detected even though the interferometer cannot resolve the separation between the target and confusion stars when their spectra are sufficiently different. Other strategies for mitigating the star confusion effect are also discussed.

crowded field↗

Testing of a Methane Cryogenic Heat Pipe with a Liquid Trap Turn-Off Feature for use on Space Interferometer Mission (SIM)

Camera cooling for SIM presents three thermal control challenges; stable operation at 163K (110 C), decontamination heating to +20 C, and a long span from the cameras to the radiator. A novel cryogenic cooling system based on a methane heat pipe meets these challenges. The SIM thermal team, with the help of heat pipe vendor ATK, designed and tested a complete, low temperature, cooling system. The system accommodates the two SIM cameras with a double-ended conduction bar, a single methane heat pipe, independent turn-off devices, and a flight-like radiator. The turn ]off devices consist of a liquid trap, for removing the methane from the pipe, and an electrical heater to raise the methane temperature above the critical point thus preventing two-phase operation. This is the first time a cryogenic heat pipe has been tested at JPL and is also the first heat pipe to incorporate the turn-off features. Operation at 163K with a methane heat pipe is an important new thermal control capability for the lab. In addition, the two turn-off technologies enhance the "bag of tricks" available to the JPL thermal community. The successful test program brings this heat pipe to a high level of technology readiness.

cyrogenic heat pipe↗

SIM-Lite Mission Spectral Calibration Sensitivities and Refinements

SIM-Lite missions will perform astrometry at microarcsecond accuracy using star light interferometry. For typical baselines that are shorter than 10 meters, this requires to measure optical path difference (OPD) accurate to tens of picometers calling for highly accurate calibration. A major challenge is to calibrate the star spectral dependency in fringe measurements -- the spectral calibration. Previously, we have developed a spectral calibration and estimation scheme achieving picometer level accuracy. In this paper, we present the improvements regarding the application of this scheme from sensitivity studies. Data from the SIM Spectral Calibration Development Unit (SCDU) test facility shows that the fringe OPD is very sensitive to pointings of both beams from the two arms of the interferometer. This sensitivity coupled with a systematic pointing error provides a mechanism to explain the bias changes in 2007. Improving system alignment can effectively reduce this sensitivity and thus errors due to pointing errors. Modeling this sensitivity can lead to further improvement in data processing. We then investigate the sensitivity to a model parameter, the bandwidth used in the fringe model, which presents an interesting trade between systematic and random errors. Finally we show the mitigation of calibration errors due to system drifts by interpolating instrument calibrations. These improvements enable us to use SCDU data to demonstrate that SIM-Lite missions can meet the 1pm noise floor requirement for detecting earth-like exoplanets.

wave front aberration↗

SIM testbed 3 real-time control software

SIM System Testbed 3 (STB3) features three optical interferometers sharing a common baseline, as a dynamic representation of the SIM instrument. An artificial star feeding the interferometers is installed on a separate optics bench. All three interferometers use photons captured by avalanche photo diodes (APDs) to measure the position and quality of fringes, and additional pointing precision is achieved by fast steering mirrors (FSMs) that keep the star images centered on the beam combining optics using a CCD camera. Each interferometer uses internal metrology to measure changes in its optical pathlength. External metrology beams measure changes in the baseline vector. This system acquires and tracks white light fringes with one interferometer, while the other two acquire and track laser light fringes representing the bright guide stars that will be used by SIM. The white light source represents a dim star that cannot supply enough photons for the Science interferometer to lock onto fringes in closed-loop mode; instead it operates open-loop, using pathlength corrections fed to it from the two guide interferometers and the external metrology subsystem to reject disturbances and maintain the fringes. This tracking mode is known as Pathlength Feed Forward (PFF). The precise real-time behavior required to achieve this result is implemented by a complex set of interacting software control loops. This paper describes how these loops take advantage of the benefits of the RTC Core architecture, and how they work together to accomplish STB3's objectives.

interferometry↗

Model validation of SIM external metrology at the sub-nanometer level

In order to achieve micro-arcsecond astrometry, SIM must make measurements of various optical path lengths at the picometer level. In this regime of precision, nearly every simplifying assumption in optics must be reexamined as a potential source of systematic error. SIM makes extensive use of physics-based models to predict the form and level of systematic errors affecting instrument performance. Since many of the modeling areas represent new frontiers in optical modeling, the validation of these physical models is a significant challenge that SIM must meet. In the case of the external metrology truss, the model must account for the imperfections in the corner cubes as well as the distance measuring interferometers ("beam launchers"). This model is being validated using the Kite testbed, a 2-D metrology truss with picometer-level accuracy in displacement measurements. We present the model and the results of the model validation tests on the Kite testbed.

Kuan, Gary M.↗

Combining ToF‐SIMS and Multivariate Analysis to Resolve Active Sites on Ni‐Based HER Catalysts

Unambiguous identification of active sites in heterogeneous catalysis remains a major challenge, particularly for materials with ultrathin, chemically mixed surface layers. Here, we demonstrate a generalizable approach that combines time-of-flight secondary ion mass spectrometry (ToF-SIMS) with multivariate statistical analysis (principal component analysis [PCA] and multivariate curve resolution [MCR]) to resolve catalytically relevant motifs at the nanoscale. Using Ni electrodes as a model system, PCA distinguished hydroxide-enriched domains from oxide- and metal-rich regions, while MCR decomposed depth profiles and 3D images into hydroxide, oxide, and metallic layers with nanometer resolution. A unique secondary-ion fragment, NiO 3 H 3 − (m/z 108.94), emerged as a marker of hydroxide-rich environments and correlated with hydrogen evolution reaction (HER) activity across a series of Ni electrodes. Complementary density functional theory (DFT) calculations revealed that Ni(OH) 2 clusters adjacent to metallic Ni offer the most favorable water dissociation energetics, establishing the structural origin of the marker. While illustrated here for Ni-based HER, this workflow provides a broadly applicable framework to isolate and rank near-surface patterns that govern catalytic activity, thereby extending ToF-SIMS from a qualitative probe to a predictive tool for active site identification.

HER active sites↗

ToF-SIMS in material research: A view from nanoscale hydrogen detection

Hydrogen in materials has attracted tremendous interest as its incorporation leads to significant alterations in nanoscale structure, composition, and chemistry, impacting functional properties. It has also been integral to nuclear fusion reactors and is considered a future clean energy source. However, nanoscale characterization and manipulation of hydrogen in materials are challenging as only a selected few analytical techniques can readily detect hydrogen, among which time-of-flight secondary ion mass spectrometry (ToF-SIMS) is a unique and powerful one due to its excellent detection limit along with decent depth and lateral resolutions. Here, in this review, we discuss, using selected examples, how to detect and quantify hydrogen in materials by ToF-SIMS and its impact on revealing the hydrogenation/protonation-induced novel functional states in different classes of materials. In addition, we present our protocols on sample preparation and experimental conditions optimization, allowing us to achieve the best possible results. Finally, we highlight future research directions that can lead to the discovery of novel functional states and ultimately provide a deeper understanding of scientific questions in materials science.

36 MATERIALS SCIENCE↗

Study of cluster ions produced from ToF-SIMS analysis of a U-6%Nb target

Cluster ions have been previously observed during time-of-flight secondary ion mass spectrometry (ToF-SIMS) analysis of metals and metal oxides. Furthermore, we have used ToF-SIMS to investigate cluster ions formed from the hydrocarbon-containing overlayer, the mixed U and Nb surface oxide, and underlying metal of a U-6 %Nb (U6Nb) target. In the overlayer, we observe U x O y + oxides and U-species likely containing hydrocarbons. In the surface oxide, we observe UO 2 +, U 2 O 2 +, U 3 O 5 +, and U 4 O 6 + as the most intense ions for each family of oxide ions containing x U atoms. Nb oxides for NbO 1-2 - were only observed in negative polarity. In contrast to the oxide, analysis of the underlying U6Nb alloy resulted in repeating units of U n +, U n (Nb)+, and U n (Nb 2 ) + ions for n = 3–11 as the highest intensity ions for each family of ions containing n U atoms. Nb n + clusters were not observed. U n +, U n (Nb)+, and U n (Nb 2 )+ clusters containing C- and O-species were observed and were likely produced from soluble C or O species or precipitates known to be present in U6Nb.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗

Molecular Determination of Organic Adsorption Sites on Smectite during Fe Redox Processes Using ToF-SIMS Analysis

Turnover of soil organic carbon (SOC) is strongly affected by a balance between mineral protection and microbial degradation. However, the mechanisms controlling the heterogeneous and preferential adsorption of different types of SOC remain elusive, especially for humic substrates (HSs) and microbial carbon (MC), two hotly-debated forms of SOC prevalent in soils. In this work, the heterogeneous adsorption of HSs and MC on a clay mineral (nontronite NAu-2) during microbial-mediated Fe redox cycling was determined with the use of time-of-flight secondary ion mass spectrometry (ToF-SIMS). The results revealed that HSs pre-adsorbed on NAu-2 would partially inhibit the microbial Fe(III) reduction and structural modification of NAu-2, thus retarding the subsequent adsorption of MC. In contrast, NAu-2 without pre-coated HSs was adsorbed by a significant amount of MC from microbial polysaccharides as a result of Fe(III) reduction. This was attributed to the deposition of a thin Al-rich layer on clay surface, which provided active sites for MC adsorption. This study provides direct and detailed molecular evidence for the first time to explain the preferential adsorption of MC over HSs on the surface of clay minerals in the iron redox processes, which could be critical for the preservation of MC in soil. The results also indicate that ToF-SIMS is a unique tool for understanding complex organic-mineral-microbe interactions.

54 ENVIRONMENTAL SCIENCES↗

Liquid ToF-SIMS revealing the oil, water, and surfactant interface evolution

Bilge water from ships is regarded as a major pollutant in the marine environment. Bilge water exists in a stable oil-in-water (O/W) emulsion form. However, little is known about the O/W liquid–liquid (l–l) interface. Traditional bulk characterization approaches are not capable of capturing the chemical changes at the O/W l–l interface. Although surfactants are deemed essential in droplet formation, their roles in bilge water stabilization have not been fully revealed. We have utilized novel in situ chemical imaging tools including in situ scanning electron microscopy (SEM) and in situ time-of-flight secondary ion mass spectrometry (ToF-SIMS) to study the evolving O/W interface using a NAVY bilge model for the first time. The droplet size distribution (DSD) does not change significantly without the addition of X-100 surfactants under static or rocking conditions. Both the oil components and the water clusters are shown to evolve over time at the O/W droplet interface by in situ liquid SIMS imaging. Of particular interest to droplet stabilization, the contribution of surfactants to the aged bilge droplets becomes more significant as the droplet size increases. The higher mass surfactant component does not appear on the droplet surface immediately while many lower mass surfactants are solvated inside the droplet. We have provided the first three-dimensional images of the evolving O/W interface and demonstrated that in situ surface chemical mapping is powerful enough to reveal the complex and dynamic l–l interface in the liquid state. Our observational insights suggest that surfactants are important in mediating droplet growth and facilitating effective separation of bilge water emulsion.

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CH↗

A Novel Method to Investigate Stoichiometry and Performance of Buried Passivated Contacts Utilizing Time-of-Flight SIMS

We report on methods using time-of-flight secondary-ion mass spectrometry (TOF-SIMS) to elucidate critical information about the buried interfaces in interdigitated back-contact silicon solar cells. We examined the stoichiometry of the tunneling oxide with TOF-SIMS and X-ray photoelectron spectroscopy (XPS). Interestingly, the data indicates that the stoichiometry of the tunneling oxide moves away from SiO 2 towards lower stoichiometry (SiO x ) upon the crystallization annealing treatment, and towards SiO 2 again upon Al 2 O 3 deposition and a subsequent forming gas anneal. We also report on an important artifact for samples with an Al 2 O 3 passivation layer related to the oxygen content of the matrix.

14 SOLAR ENERGY↗

Understanding Chemical Inhomogeneities and Cation Gradients in Perovskite Photovoltaics with TOF-SIMS

Time-of-flight secondary-ion mass spectrometry (TOF-SIMS) is one of the few techniques that can obtain chemical information from all components of hybrid organic-inorganic perovskite photovoltaics in up to three dimensions. This can yield critical insight into the uniformity of the cations through the thickness of the film (with sub-nm resolution), as well as laterally (with 100nm resolution) We have been using a TOF-SIMS to analyze perovskite photovoltaics at NREL for more than four years and have found many tricks and best practices, summarized here, to get around known artifacts when depth profiling and imaging.

14 SOLAR ENERGY↗

Insights into Na + Diffusion in Silicon Modules under Operating Conditions: Measuring Low Concentrations by D-SIMS

Sodium induced shunting under an electric field is a challenging reliability issue in crystalline Si solar modules. The source of this Potential-Induced Degradation of the Shunting type (PID-s) is well understood and its influence on power loss has been intensively studied based on phenomenological models on cell or module level relating the experimental power-loss to stressing parameters (time, temperature, voltage). However, little is known about the Na ion migration kinetics, responsible for PID on a microscopic level, and its quantitative relation to the efficiency degradation. In this paper we present our investigations of sodium ion migration in Ethylene-Vinyl Acetate (EVA) and silicon through Dynamic Secondary Ion Mass Spectroscopy (D-SIMS). Each sample was annealed at field relevant temperatures from 60-90 °C to address typical migration mechanisms of common PV installations. Analysis of the SIMS migration profiles revealed a diffusivity constant D 0,EVA = 0.09 ± 0.14 cm 2 /s and an activation energy E A,EVA = 0.85 ± .04 eV for Na in EVA and diffusivities higher than extrapolated literature values in silicon (D 0,Si = (3.03 ± 2.42)x10 -5 cm 2 /s, and E A,Si = 0.98 ± 0.02 eV). The new insight will be included in a drift-diffusion based degradation model accounting for the partition coefficient across all relevant interfaces. This model can assist in predicting PID-failure in the field based on the given model stack and the diffusion of Na + through each material. Furthermore, this tool can be used for process optimization as well as material selection significantly reducing the cost and time to validate a technology.

14 SOLAR ENERGY↗