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Results for “SECONDARY EMISSION”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 127 records · Page 7
All sourcesNASA NTRSDOE OSTI
NASA NTRS1972

System efficiency of a microwave power tube with a multistage depressed collector

The efficiencies of a microwave power tube with a multistage depressed collector and of the power supply driving the tube are computed. An analytical expression for the collector efficiency, which includes the effect of secondary emission and the radial component of velocity, is derived for a hypothetical current probability distribution function. In addition, collector efficiency is calculated with the aid of a digital computer for a specific current distribution. The efficiency of the power supply required to operate the tube in a space environment is estimated by using a simple parallel inverter system.

Dayton, J. A., Jr.↗
NASA NTRS1973

Absolute rate constant for the O plus NO chemiluminescence in the near infrared

Infrared chemiluminescence from the process O + NO (+M) NO2 + hv (+M) has been studied between 1.3 and 4.1 micrometer. The wavelength dependence of the continuum between 1.3 and 3.3 micrometer is in fair agreement with previous studies and the measured radiative rate constant at 1.51 micrometer establishes the NO-O glow in this spectral range as a secondary emission standard. Comparison with previous studies of the visible region of the glow implies that the overall radiative rate constant lies in the range (9.4 to 11.2) x 10 to the minus 17 power cu cm sec/1. In the region 3.3 to 4.1 micrometer, the previously observed broad band, peaking at 3.7 micrometer, shows a complex kinetic dependence on O and M.

Golde, M. F.↗
NASA NTRS1976

Noise limitations of multiplier phototubes in the radiation environment of space

The contributions of Cerenkov emission, luminescence, secondary electron emission, and bremsstrahlung to radiation-induced data current and noise of multiplier phototubes were analyzed quantitatively. Fluorescence and Cerenkov emission in the tube window are the major contributors and can quantitatively account for dark count levels observed in orbit. Radiation-induced noise can be minimized by shielding, tube selection, and mode of operation. Optical decoupling of windows and cathode (side-window tubes) leads to further reduction of radiation-induced dark counts, as does reducing the window thickness and effective cathode area, and selection of window/cathode combinations of low fluorescence efficiency. In trapped radiation-free regions of near-earth orbits and in free space, Cerenkov emission by relativistic particles contributes predominantly to the photoelectron yield per event. Operating multiplier phototubes in the photon (pulse) counting mode will discriminate against these large pulses and substantially reduce the dark count and noise to levels determined by fluorescence.

Viehmann, W.↗
NASA NTRS1976

Testing of typical spacecraft materials in a simulated substorm environment

An investigation to determine spacecraft materials characteristics under charging conditions was conducted at the Lewis Research Center substorm simulation facility. The test specimens were spacecraft paints, silvered Teflon, thermal blankets and solar array segments. The samples, ranging in size from 300 to 1,000 sq cm were exposed to monoenergetic electron energies from 2 to 20 keV at a current density of 1 nA sq cm. The samples generally behaved as capacitors with strong voltage gradients at their edges. The charging characteristics of the silvered Teflon, Kapton, and solar cell covers were controlled by the secondary emission characteristics. Insulators that did not discharge were the spacecraft paints and the quartz fiber cloth thermal blanket sample. All other samples did experience discharges when the surface voltage reached -8 to -16 kV. The discharges were photographed. The breakdown voltage for each sample was determined and the average energy lost in the discharge was computed.

Stephens, N. J.↗
NASA NTRS1977

Application of the SEM to the measurement of solar cell parameters

Techniques are described which make use of the SEM to measure the minority carrier diffusion length and the metallurgical junction depth in silicon solar cells. The former technique permits the measurement of the true bulk diffusion length through the application of highly doped field layers to the back surfaces of the cells being investigated. It is shown that the secondary emission contrast observed in the SEM on a reverse-biased diode can depict the location of the metallurgical junction if the diode has been prepared with the proper beveled geometry. The SEM provides the required contrast and the option of high magnification, permitting the measurement of extremely shallow junction depths.

Weizer, V. G.↗
NASA NTRS1976

Multiplicity dependence of transverse momentum in hadronic collisions

The process of secondary-particle emission in hadron-hadron collisions is analytically studied using a simple model of hadron structure. The model neglects the 'size' of the hadron constituents, considering a hadron as a continuous distribution of matter according to a step function of radius R. A version of the eikonal approximation is applied to derive the relative probability for interaction and emission of secondaries when the impact parameter b is smaller than 2R. On the basis of these assumptions, and using the uncertainty relation, an empirical parameterization is obtained for the dependence of the transverse momentum of charged secondaries on their multiplicity in the case of high-energy proton-proton collisions. Comparison with experimental data at 28 GeV/c yields agreement to within about 3%. The analysis shows that at a fixed beam momentum, the transverse momentum decreases with increasing multiplicity, and that for a given multiplicity, the transverse momentum exhibits a slow increase with beam momentum.

Saint Amand, J.↗
NASA NTRS1977

Application of the SEM to the measurement of solar cell parameters

A pair of techniques are described which make use of the SEM to measure, respectively, the minority carrier diffusion length and the metallurgical junction depth in silicon solar cells. The former technique permits the measurement of the true bulk diffusion length through the application of highly doped field layers to the back surfaces of the cells being investigated. The technique yields an absolute value of the diffusion length from a knowledge of the collected fraction of the injected carriers and the cell thickness. It is shown that the secondary emission contrast observed in the SEM on a reverse-biased diode can depict the location of the metallurgical junction if the diode has been prepared with the proper beveled geometry. The SEM provides the required contrast and the option of high magnification, permitting the measurement of extremely shallow junction depths.

Weizer, V. G.↗
NASA NTRS1977

Testing of typical spacecraft materials in a simulated substorm environment

The test specimens were spacecraft paints, silvered Teflon, thermal blankets, and solar array segments. The samples, ranging in size from 300 to 1000 sq cm were exposed to monoenergetic electron energies from 2 to 20 keV at a current density of 1 NA/sq cm. The samples generally behaved as capacitors with strong voltage gradient at their edges. The charging characteristics of the silvered Teflon, Kapton, and solar cell covers were controlled by the secondary emission characteristics. Insulators that did not discharge were the spacecraft paints and the quartz fiber cloth thermal blanket sample. All other samples did experience discharges when the surface voltage reached -8 to -16kV. The discharges were photographed. The breakdown voltage for each sample was determined and the average energy lost in the discharge was computed.

Stevens, N. J.↗
NASA NTRS1977

Conductive spacecraft materials development program

The objectives of this program are to provide design criteria, techniques, materials, and test methods to ensure control of absolute and differential charging of spacecraft surfaces. The control of absolute and differential charging of spacecraft cannot be effected without the development of new and improved or modified materials or techniques that will provide electrical continuity over the surface of the spacecraft. The materials' photoemission, secondary emission, thermooptical, physical, and electrical properties in the space vacuum environment both in the presence and absence of electrical stress and ultraviolet, electron, and particulate radiation, are important to the achievement of charge control. The materials must be stable or have predictable response to exposure to the space environment for long periods of time. The materials of interest include conductive polymers, paints, transparent films and coatings as well as fabric coating interweaves.

Lehn, W. L.↗
NASA NTRS1977

Materials and techniques for spacecraft static charge control

An overview of the design, development, fabrication, and testing of transparent conductive coatings and conductive lattices deposited or formed on high resistivity spacecraft dielectric materials to obtain control static charge buildup on spacecraft external surfaces is presented. Fabrication techniques for the deposition of indium/tin oxide coatings and copper grid networks on Kapton and FEP Teflon films and special frit coatings for OSR and solar cell cover glasses are discussed. The techniques include sputtering, photoetching, silkscreening, and mechanical processes. A facility designed and built to simulate the electron plasma at geosynchronous altitudes is described along with test procedures. The results of material characterizations as well as electron irradiation aging effects in this facility for spacecraft polymers treated to control static charge are presented. The data presents results for electron beam energies up to 30 kV and electron current densities of 30 nA/cm squared. Parameters measured include secondary emission, surface leakage, and through the sample currents as a function of primary beam energy and voltage.

Amore, L. J.↗
NASA NTRS1977

NASCAP, a three-dimensional Charging Analyzer Program for complex spacecraft

A computer code, NASCAP (NASA Charging Analyzer Program), has been developed by Systems, Science and Software under contract to NASA-LeRC to simulate the charging of a complex spacecraft in geosynchronous orbit. The capabilities of the NASCAP code include a fully three-dimensional solution of Poisson's equation about an object having considerable geometrical and material complexity, particle tracking, shadowing in sunlight, calculation of secondary emission, backscatter and photoemission, and graphical output. A model calculation shows how the NASCAP code may be used to improve our understanding of the spacecraft-plasma interaction.

Katz, I.↗
NASA NTRS1979

Status of materials characterization studies

In the context of the spacecraft charging technology investigation, studies were made to characterize the response of typical spacecraft surface materials to the charging environment. The objective is to obtain an understanding of the charging and discharging behavior of such materials for the reliable prediction of spacecraft response to charging environments and as a guide for the design of future spacecraft. Materials were characterized in terms of such basic properties as resistivity and secondary emission and in terms of charging and discharging behavior in simulated charging environments.

Purvis, C. K.↗
NASA NTRS1979

Effects of bulk and surface conductivity on the potential developed by dielectrics exposed to electron beams

The charging and discharging of a dielectric material which has bulk and surface conductivities is discussed. Two model problems are solved. In the first problem, a semi-infinite dielectric plane, attached to an infinite grounded conducting substrate and exposed to a monoenergetic electron beam, is analyzed. Bulk and surface conductivities and secondary emission characteristics are taken into account as parameters. In the second problem the dielectric is charged but the electron beam is shut off so only the bulk and surface conductivities enter the calculation. The principal result of the latter calculation is to show that steep tangential gradients develop in the presence of a surface conductivity during decay, and that for asymptotic times the temporal behavior, for a fixed position, is proportional to the square root of t rather than exponential, as expected in the presence of a bulk conductivity.

Rotenberg, M.↗
NASA NTRS1981

Neutralizing charged-up spacecraft

The problem of spacecraft charging is examined. The mechanism by which a spacecraft acquires a charge with respect to the ambient space environment is discussed. Methods used to avoid spacecraft dysfunction due to charging, including the use of electron and ion emitters, adequately conducting surfaces, and dielectric materials with high secondary-emission coefficients, are described. Special attention is given to the development, in the context of the Scatha program, of a computerized model which will allow the calculation of spacecraft potential for a given set of conditions.

Garrett, H. B.↗
NASA NTRS1981

Experimental validation of a numerical model predicting the charging characteristics of Teflon and Kapton under electron beam irradiation

The effect differential charging of spacecraft thermal control surfaces is assessed by studying the dynamics of the charging process. A program to experimentally validate a computer model of the charging process was established. Time resolved measurements of the surface potential were obtained for samples of Kapton and Teflon irradiated with a monoenergetic electron beam. Results indicate that the computer model and experimental measurements agree well and that for Teflon, secondary emission is the governing factor. Experimental data indicate that bulk conductivities play a significant role in the charging of Kapton.

Hazelton, R. C.↗
NASA NTRS1981

Electrostatic discharging behaviour of Kapton irradiated with electrons

The electrostatic charging and discharging of Kapton when irradiated with monoenergetic electrons of 5 to 30 keV energy were studied. The leakage currents and rates of discharging always increased with the incident electron energy and flux, whereas the surface voltage showed a more complex behavior depending on the thickness of the material: for the thinner films it exhibited a maximum and then fell at higher energies. The surface voltage, the rate of discharging, and the peak current and total charge flow during a discharge were enhanced as the temperature was decreased from 70 C to -180 C, and were accompanied by a decreasing leakage current. Visible light or the presence of an aluminum coating on the irradiated surface caused reductions in the surface voltage and changes in the discharging characteristics. The results are discussed in terms of the leakage currents and the secondary emission of electrons. Photomicrographs taken after irradiation, and photographs of samples during irradiation, show good correlations between the positions of light flashes and of pinholes produced by the discharge arcs.

Verdin, D.↗
NASA NTRS1982

Mapping of electrical potential distributions with charged particle beams

Methods for measuring electrostatic potentials on and near dielectric surfaces charged to several kilovolts are studied. Secondary emission from those charged dielectrics is measured. Candidates for potential measurement include the induced charge, from which potential is calculated; the trajectory endpoints of either high or low energy particles traversing the region near the surface; trajectory impact on the surface; and creating ions at points of interest near the surface. Some of the methods require computer simulations and iterative calculation if potential maps are to be generated. Several approaches are described and compared. A method using a half-cylinder as a test chamber and low-energy probing beams is adapted for the measurement of seconary emission.

Robinson, J. W.↗
NASA NTRS1981

'Bootstrap' charging of surfaces composed of multiple materials

The paper examines the charging of a checkerboard array of two materials, only one of which tends to acquire a negative potential alone, using the NASA Charging Analyzer Program (NASCAP). The influence of the charging material's field causes the otherwise 'non-charging' material to acquire a negative potential due to the suppression of its secondary emission ('bootstrap' charging). The NASCAP predictions for the equilibrium potential difference between the two materials are compared to results based on an analytical model.

Stannard, P. R.↗