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At least 127 records · Page 7
All sourcesNASA NTRSDOE OSTI
DOE OSTI2018

13 TeV pp collisions, Exotics type, MADGRAPH/PY8 generator: tev13pp_mg5_chaHT_tbeta_tb

Production of charged Higgs (H-) (with different masses) associated with t (top) using MG5_aMC_v2_6_1 at LO QCD. PYTHI8 is used for H+ decays, PS and hadronisation. Charged higgs decay to t plus b-quark (done in Pythia8) in 100% cases. The cross sections are for tan(beta)=1-7. NNPDF23_LO used for PDF. It uses 5 flavour number scheme (b-quark is a part of proton PDF). Pythia8 is used for showering and hadronisation and deacys. H+ masses ranged from 500 GeV to 8000 GeV (included to the names of files as *_m[MASS]). Cross section for each file depends on generated masses. 5,000 events per file. LHE events from MG5 are in "tev13_mg5_HT5F.tgz" Samples are created with the help of Xiaoping Wang and Carlos E.M. Wagner. Decays: Decays of H+ are handled by PYTHIA8. Events are created assuming charged Higgs to decay to b-quark and to-quarks with 100% branching ratio. No specific decay of top quarks was used. To create realistic cross sections, you should multiply the obtained cross sections by the branching ratio [H- to b-t~]. Slimming: Particle records are slimmed (all stable with pT>0.3 GeV) and (PID=5 || PID=6) or PID>22 && PID<38) or PID>10 && PID<17).

72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS↗
DOE OSTI2018

13 TeV pp collisions, Exotics type, MADGRAPH/PY8 generator: tev13pp_mg5_chaHT_tbeta_hw

Production of charged Higgs (H-) (with different masses) associated with t (top) using MG5_aMC_v2_6_1 at LO QCD. PYTHI8 is used for H+ decays, parton shower and hadronisation. The cross sections are for tan(beta)=1-7. NNPDF23_LO used for PDF. It uses 5 flavour number scheme (b-quark is a part of proton PDF). Pythia8 is used for showering and hadronisation. H+ masses ranged from 500 GeV to 8000 GeV (included to the names of files as *_m[MASS]). Cross section for each file depends on generated masses. 5,000 events per file. LHE events from MG5 are in "tev13_mg5_HT5F.tgz" Samples are created with the help of Xiaoping Wang and Carlos E.M. Wagner. Decays: Decays of H+ are performed by PYTHIA8. Events are created assuming charged Higgs decay to SM Higgs and W+/- in 100% cases. SM Higgs decays to bbbar. To create realistic cross sections, you should multiply the obtained cross sections by the branching ratio of [H+ -> H0W], and multiply by the SM Higgs branching of 0.584 for [H0 -> bbar]. Slimming: Particle records are slimmed (all stable with pT>0.3 GeV) and (PID=5 || PID=6) or PID>22 && PID<38) or PID>10 && PID<17).

72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS↗
DOE OSTI2018

13 TeV pp collisions, SM type, PYTHIA8 generator: tev13pp_qcd_pythia8_proio_tests

This entry is used for testing different ProIO models for events with large number of particles. Do not use it for physics. This sample corresponds to one file from tev13pp_qcd_pythia8_weighted. The files contain Inclusive dijet events for pT>50 GeV. (PhaseSpace:pTHatMin=50 GeV). 20,000 events per file. PDF: LHAPDF6:NNPDF23_lo_as_0130_qed. The sample was created using the Pythia8 tune Tune:pp = 14, similar to ATLAS. This sample is created for testing ProIO data format. How to use: This is weighted events to obtain good statistics up to very large pT. This feature is set via PhaseSpace:bias2Selection and PhaseSpace:bias2SelectionPow = 5.0. Use event weights to obtain correct pT distribution. Particle records are slimmed (all stable with pT>0.3 GeV) and (PID=5 || PID=6) or PID>22 && PID<38) or PID>10 && PID<17).

72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS↗
DOE OSTI2018

13 TeV pp collisions, SM type, PYTHIA8 generator: tev13pp_pythia8_qcd_em

Filtered QCD multijet events (2->2 process) using a electron and muon filters. PDF: LHAPDF6:NNPDF23_lo_as_0130_qed. The sample was created using the Pythia8 tune Tune:pp = 14, similar to ATLAS. The sample was created for ATLAS studies of dijet+lepton event topologies. EM filters: Events contain at least one final state electron or muon from QCD dijet events. The leptons are isolated to make sure there is no hadronic activity around. This was done by using a cone of 0.2 around the lepton, and by requiring that the lepton carries at least 90% of energy of the 0.2 cone in eta and phi. In addition, fake lepton and muon rates were simulated. It is assumed that an antiKT4 jet with less than 10 numbers of constituents have 10% chance to be electron, and 1% chance to be a muon. Such fake leptons were put at the end of the event records. The particles that were used for fake leptons were subtracted from the original event record. How to use weights: This is weighted events to obtain good statistics up to very large pT. This feature is set via PhaseSpace:bias2Selection and PhaseSpace:bias2SelectionPow = 5.0. Use event weights to obtain correct pT distribution. Slimmed as: Particle records are slimmed (all stable with pT>0.3 GeV) and (PID=5 || PID=6) or PID>22 && PID<38) or PID>10 && PID<17). Note: Created for ATLAS BSM analysis

72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS↗
DOE OSTI2018

14 TeV pp collisions, SM type, PYTHIA8 generator: tev14pp_pythia8_gammajet_weighted

Inclusive direct photon (gamma) production for pT>15 GeV. PDF: LHAPDF6:NNPDF23_lo_as_0130_qed and Tune:pp = 14 (Monash 2013 Tune). 10,000 events per file. How to use: The events are weighted to obtain good statistics up to large pT. This feature is set via PhaseSpace:bias2Selection and PhaseSpace:bias2SelectionPow = 5.0. Use the event weights to obtain the correct pT distribution. Slimmed as: Particle records are slimmed (all stable with pT>0.3 GeV) and (PID=5 || PID=6) or PID>22 && PID<38) or PID>10 && PID<17).

72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS↗
NASA NTRS2013

Demonstrating the Effect of Particle Impact Dampers on the Random Vibration Response and Fatigue Life of Printed Wiring Assemblies

In a recent experimental study, small Particle Impact Dampers (PID) were bonded directly to the surface of printed circuit board (PCB) or printed wiring assemblies (PWA), reducing the random vibration response and increasing the fatigue life. This study provides data verifying practicality of this approach. The measured peak strain and acceleration response of the fundamental out of plane bending mode was significantly attenuated by adding a PID device. Attenuation of this mode is most relevant to the fatigue life of a PWA because the local relative displacements between the board and the supported components, which ultimately cause fatigue failures of the electrical leads of the board-mounted components are dominated by this mode. Applying PID damping at the board-level of assembly provides mitigation with a very small mass impact, especially as compared to isolation at an avionics box or shelf level of assembly. When compared with other mitigation techniques at the PWA level (board thickness, stiffeners, constrained layer damping), a compact PID device has the additional advantage of not needing to be an integral part of the design. A PID can simply be bonded to heritage or commercial off the shelf (COTS) hardware to facilitate its use in environments beyond which it was originally qualified. Finite element analysis and test results show that the beneficial effect is not localized and that the attenuation is not due to the simple addition of mass. No significant, detrimental reduction in frequency was observed. Side-by-side life testing of damped and un-damped boards at two different thicknesses (0.070" and 0.090") has shown that the addition of a PID was much more significant to the fatigue life than increasing the thickness. High speed video, accelerometer, and strain measurements have been collected to correlate with analytical results.

Knight, Brent↗
DOE OSTI2018

Potential-Induced Degradation-Delamination Mode in Crystalline Silicon Modules: Preprint

A test sequence producing potential-induced degradation-delamination (PID-d) in crystalline silicon modules has been tested and found comparable under visual inspection to cell/encapsulant delamination seen in some fielded modules. Four commercial modules were put through this sequence, 85 degrees C, 85%, 1000 h damp heat, followed by an intensive PID stress sequence of 72 degrees C, 95% RH, and -1000 V, with the module face grounded using a metal foil. The 60 cell c-Si modules exhibiting the highest current transfer (4.4 center dot 10-4 A) exhibited PID-d at the first inspection after 156 h of PID stress. Effects promoting PID-d are reduced adhesion caused by damp heat, sodium migration further reducing adhesion to the cells, and gaseous products of electrochemical reactions driven by the applied system voltage. A new work item proposal for an IEC test standard to evaluate for PID-d is anticipated.

14 SOLAR ENERGY↗
DOE OSTI2019

In-situ Microscopy Characterization of Cu(In,Ga)Se2 Potential-Induced Degradation: Preprint

We report on the role of sodium in potential-induced degradation (PWe report on the role of sodium in potential-induced degradation (PID) of Cu(In, Ga)Se2 (CIGS) solar cells. In-situ microscopy characterizations on AFM platform were performed on two stressed CIGS device under room temperature (RT) and high temperature (HT) at 85 degrees C. During PID stressing we observed depletion region gets wider as Na migrates, p-n junction becomes leaky at RT for over a month; and similar junction evolution was observed for HT-stressed sample, eventually the junction collapsed after 18 hours. The diode behaviors were confirmed by dark I-V measurement. Time-of-Flight secondary-ion mass spectrometry reveals that the Na accumulates on ZnO and CdS side, as well as the upper layer of CIGS layer. The results indicate that Na drifted by the voltage applied on the soda-lime glass, then diffuse through the whole device. And the sodium profiles have different points of evolution due to the temperature differences between the two stressed samples. The consistent results unambiguously show how Na from substrate glass causes PID in CIGS solar cells.ID) of Cu(In, Ga)Se2 (CIGS) solar cells. In-situ microscopy characterizations on AFM platform were performed on two stressed CIGS device under room temperature (RT) and high temperature (HT) at 85 degrees C. During PID stressing we observed depletion region gets wider as Na migrates, p-n junction becomes leaky at RT for over a month; and similar junction evolution was observed for HT-stressed sample, eventually the junction collapsed after 18 hours. The diode behaviors were confirmed by dark I-V measurement. Time-of-Flight secondary-ion mass spectrometry reveals that the Na accumulates on ZnO and CdS side, as well as the upper layer of CIGS layer. The results indicate that Na drifted by the voltage applied on the soda-lime glass, then diffuse through the whole device. And the sodium profiles have different points of evolution due to the temperature differences between the two stressed samples. The consistent results unambiguously show how Na from substrate glass causes PID in CIGS solar cells.

14 SOLAR ENERGY↗
DOE OSTI2022

Evaluation of bifacial module technologies with combined–accelerated stress testing

In view of the increasing interest and market share of bifacial cells and modules, suitable substrates such as glass and transparent backsheets along with ethylene vinyl acetate (EVA) and polyolefin elastomer (POE) encapsulants were examined in combined-accelerated stress testing (C-AST) to evaluate and compare degradation modes. Testing with both monofacial and bifacial cells, we found glass-glass modules with monofacial cells led to greater grid finger breakage than those with polymeric backsheets. Furthermore, this is attributed to previous X-ray topography and modeling work showing higher stress in cells and interconnections in glass-glass modules than glass-backsheet modules. Consistent with the objectives of C-AST, which stresses modules at levels corresponding to the limits seen in the natural environment, we observed the UV-fluorescence signatures of modules tested in C-AST (considering the degradation associated with developing chromophores, moisture penetration and photobleaching effects) to be like those in fielded modules, more so than other chamber stress testing implemented for comparison. We found light-induced degradation (LID) in module types with regenerated (inactive) cells with C-AST, suggesting the possibility of LID destabilization in some field conditions. We could also distinguish potential-induced degradation (PID) on the back of the bifacial passivated emitter and rear cells (PERC) in C-AST. Confirming with ex-situ tests, we found polarization-type PID most prevalent in glass-glass modules with EVA as would be anticipated considering the greater leakage current through such module encapsulation. Unlike PID tests performed in the dark, which can lead to false positive PID test results, field-representative illumination is experienced by the modules on the front and back side while –1200 V system voltage is applied in C-AST, supporting the conclusion that this module type with glass-glass construction would be susceptible to PID in the field.

14 SOLAR ENERGY↗
DOE OSTI2025

Nuclear microreactor transient and load-following control with deep reinforcement learning

The economic feasibility of nuclear microreactors will depend on minimizing operating costs through advancements in autonomous control, especially when these microreactors are operating alongside other types of energy systems (e.g., renewable energy). This study explores the application of deep reinforcement learning (RL) for real-time drum control in microreactors, exploring performance in regard to load-following scenarios. By leveraging a point kinetics model with thermal and xenon feedback, we first establish a baseline using a single-output RL agent, then compare it against a traditional proportional–integral–derivative (PID) controller. This study demonstrates that RL controllers, including both single- and multi-agent RL (MARL) frameworks, can achieve similar or even superior load-following performance as traditional PID control across a range of load-following scenarios. In short transients, the RL agent was able to reduce the tracking error rate in comparison to PID by one half to one third. Over extended 300-minute load-following scenarios in which xenon feedback becomes a dominant factor, PID maintained better accuracy, but RL still remained within a 1% error margin despite being trained only on short-duration scenarios. This highlights RL’s strong ability to generalize and extrapolate to longer, more complex transients, affording substantial reductions in training costs and reduced overfitting. Furthermore, when control was extended to multiple drums, MARL enabled independent drum control as well as maintained reactor symmetry constraints without sacrificing performance---an objective that standard single-agent RL could not learn. We also found that, as increasing levels of Gaussian noise were added to the power measurements, the RL controllers were able to maintain lower error rates than PID, and to do so with at least 10% and upwards of 150% less control effort. These findings illustrate RL's potential for autonomous nuclear reactor control, laying the groundwork for future integration into high-fidelity simulations and experimental validation efforts.

22 - GENERAL STUDIES OF NUCLEAR REACTORS↗
DOE OSTI2013

Highly efficient photoinduced desorption of N{sub 2}O and CO from porous silicon

Photoinduced desorption (PID) of N{sub 2}O and CO from porous silicon (PSi) samples is reported. Both adsorbates exhibit unusually large cross sections for PID at 193 nm, up to 10{sup -15} cm{sup 2}, 2-3 orders of magnitude larger than the literature values for similar processes on flat Si. Under this UV irradiation, N{sub 2}O molecules undergo photodissociation (a competing process leading to surface oxidation) with a cross section that is 2 orders of magnitude smaller than photodesorption. In the case of CO desorption is the exclusive photodepletion mechanism. PID efficiency decreases with increasing CO coverage suggesting PID hindrance by interactions among the desorbing CO molecules leading to re-adsorption at higher coverage. The wavelength and fluence dependence measurements exclude the possibility of laser induced thermal desorption for both adsorbates. The proposed mechanism for this phenomenon is desorption induced by hot electron transfer from the substrate to the adsorbate. Enhanced lifetime of transient negative adsorbate due to stabilization by localized holes on PSi nanotips can explain the observed abnormally large PID efficiency on top of porous silicon.

36 MATERIALS SCIENCE↗
DOE OSTI2024

Managing photon flux in a miniaturized photoionization detector

Miniaturized photoionization detectors (PIDs) are used in conjunction with gas chromatography systems to detect volatile compounds in gases by collecting the current from the photoionized gas analytes. PIDs should be inexpensive and compatible with a wide range of analyte species. One such PID is based on the formation of a He plasma in a dielectric barrier discharge (DBD), which generates vacuum UV (VUV) photons from excited states of He to photoionize gas analytes. There are several design parameters that can be leveraged to increase the ionizing photon flux to gas analytes to increase the sensitivity of the PID. To that end, the methods to maximize the photon flux from a pulsed He plasma in a DBD-PID were investigated using a two-dimensional plasma hydrodynamics model. The ionizing photon flux originated from the resonance states of helium, He(3P) and He(2 1 P), and from the dimer excimer He 2 *. While the photon flux from the resonant states was modulated over the voltage pulse, the photon flux from He 2 * persisted long after the voltage pulse passed. Several geometrical optimizations were investigated, such as using an array of pointed electrodes. However, increasing the capacitance of the dielectric enclosing the plasma chamber had the largest effect on increasing the VUV photon fluence to gas analytes.

70 PLASMA PHYSICS AND FUSION TECHNOLOGY↗
DOE OSTI2022

Advanced Thin Film Core Technology: CIGS Final Technical Report (FTR)

Cu(In,Ga)Se 2 (CIGS) thin-film photovoltaics are a high-efficiency and reliable technology. This project completed research in two important areas and was designed to work collaboratively with industrial partners. Task 1: Alkali Science focused on alkali post-deposition treatments (PDT). PDTs have been instrumental in the dramatic voltage improvements that have moved CIGS device efficiencies from 20% to 23.35% [1]. Based on a survey of CIGS companies at the beginning of the project, the single biggest breakthrough for the CIGS community would be a mechanistic understanding of the role of alkalis in the material system. Significant accomplishments of Task 1: Alkali Science: 1) KF post-deposition treatments were shown to improve lifetime, open-circuit voltage (VOC), and efficiency of industrial partner samples, even when done as a later step, separate from the original CIGS deposition. 2) KF boosted efficiency when incorporated at the end of the third stage of NREL CIGS growth. 3) XPS characterization of CIGS surfaces with and without PDTs led to a proposed mechanism whereby K drives structural transformation at 350 degrees C that is locked in at room temperature even after K is rinsed away. 4) Published recipes for KF and RbF PDTs. Literature to date did not provide enough detail to quickly reproduce experimental results. 5) Identified most important parameters (RbF cell temperature and lamp setpoint temperature) and set boundaries for successful RbF PDTs. The purpose of Task 2: Cell-level Reliability was to overcome the largest challenges to investor confidence and long product lifetime in CIGS-based photovoltaic products: metastability, shading-induced hot spots, and potential-induced degradation (PID). Key findings were made in each of these areas by studying CIGS reliability at the cell level: 1) Published NREL's cell-level reliability testing procedures along with challenges that were encountered while developing them. These were also distributed to the community through an MRS conference presentation. 2) Decreased metastability by adding a CdS hole-injection layer between the CIGS and Zn(O,S) in the device stack. It also improved device performance. Materials other than CdS can be used for the same purpose. 3) Reduced front-glass PID by replacing soda-lime glass with low-Na borosilicate glass. 4) Found that PID depends on leakage current and light/electrical bias. This will help labs avoid test-specific degradation. 5) Discovered that CIGS can suffer from two different types of PID with different mechanisms. Front is slower and leads to shunting ZnO. Back is faster and degrades the p-n junction. 6) Holding cells at open circuit slows PID compared to short circuit. This affects testing protocols for glass/glass modules.

14 SOLAR ENERGY↗
NASA NTRS2010

Station Keeping of Small Outboard-Powered Boats

Three station keeping controllers have been developed which work to minimize displacement of a small outboard-powered vessel from a desired location. Each of these three controllers has a common initial layer that uses fixed-gain feedback control to calculate the desired heading of the vessel. A second control layer uses a common fixed-gain feedback controller to calculate the net forward thrust, one of two algorithms for controlling engine angle (Fixed-Gain Proportional-integral-derivative (PID) or PID with Adaptively Augmented Gains), and one of two algorithms for differential throttle control (Fixed-Gain PID and PID with Adaptive Differential Throttle gains), which work together to eliminate heading error. The three selected controllers are evaluated using a numerical simulation of a 33-foot center console vessel with twin outboards that is subject to wave, wind, and current disturbances. Each controller is tested for its ability to maintain position in the presence of three sets of environmental disturbances. These algorithms were tested with current velocity of 1.5 m/s, significant wave height of 0.5 m, and wind speeds of 2, 5, and 10 m/s. These values were chosen to model conditions a small vessel may experience in the Gulf Stream off of Fort Lauderdale. The Fixed-gain PID controller progressively got worse as wind speeds increased, while the controllers using adaptive methodologies showed consistent performance over all weather conditions and decreased heading error by as much as 20%. Thus, enhanced robustness to environmental changes has been gained by using an adaptive algorithm.

Fisher, A. D.↗
DOE OSTI2022

Evaluation of Bifacial Modules and PV Technologies with Combined-Accelerated Stress Testing

In view of the increasing interest and market share of bifacial cells and modules, suitable substrates such as glass and transparent backsheets along with ethylene vinyl acetate (EVA) and polyolefin elastomer (POE) encapsulants were examined in combined-accelerated stress testing (C-AST) to evaluate and compare degradation modes. Testing with both monofacial and bifacial cells, we found glass-glass modules with monofacial cells led to greater grid finger breakage than those with polymeric backsheets. This is attributed to previous x-ray topography work showing higher stress in cells in glass-glass modules than glass backsheet modules. Consistent with the objectives of C-AST, which stresses modules at levels corresponding to the limits seen in the natural environment, we observed the UV-fluorescence signatures of modules tested in C-AST (considering the degradation associated with developing chromophores, moisture penetration and photobleaching effects) to be like those in fielded modules, more so than other chamber stress testing implemented for comparison. Finally, among multiple cell degradation modes that we observed such as light-induced degradation (LID), we differentiated susceptibility to potential-induced degradation (PID) on the back of the bifacial Passivated Emitter Back Cells (PERC) in C-AST. Confirming with ex-situ tests, we found polarization-type PID most prevalent in glass/glass modules with EVA as would be anticipated considering the greater leakage current through such module encapsulation. Unlike PID tests performed in the dark, which can lead to false positive PID test results, field-representative illumination is experienced by the modules on the front and back side while -1200 V system voltage is applied in C-AST, supporting the conclusion that this module type would be susceptible to PID in the field.

bifacial modules↗
DOE OSTI2018

Prediction of Potential-Induced Degradation Rate of Thin-Film Modules in the Field Based on Coulombs Transferred

We validated the use of coulombs transferred between the active cell circuit and ground as an index for quantitatively predicting degradation rate in the field for two thin-film module types undergoing potential-induced degradation (PID). The dependence was determined by comparing the degradation rate and leakage current in the field (Cocoa, Florida) to accelerated tests (85 degrees C, 85% relative humidity), both with the application of -1,000 V bias to the cell circuit. The two module types, which degraded about 4% and 11% in power after application of 96 h of bias in chamber, degraded 5% in the field by PID within 200 days and 6 days, respectively. The signatures of PID in the thin-film modules by electroluminescence, photoluminescence, and thermography are shown so that PID in fielded thin-film modules can be identified.

14 SOLAR ENERGY↗
DOE OSTI2025

Comparing Outdoor to Indoor Performance for Bifacial Modules Affected by Polarization-Type Potential-Induced Degradation

Bifacial photovoltaic (PV) modules have the advantage of using light reflected off of the ground to contribute to power production. Predicting the energy gain is challenging and requires complex models to do so accurately. Often, module degradation over time is neglected in models for the sake of simplicity or is underestimated. Comparing outdoor and indoor current–voltage (I–V) performance for bifacial modules is more challenging than for monofacial modules, as there are additional variables to consider such as rear albedo non-uniformity, cell mismatch, and their effects on temperature. This challenge is compounded when heterogeneous degradation modes occur, such as polarization-type potential-induced degradation (PID-p). To examine the effects of PID-p on I–V predictions using an empirical data-driven approach, 16 bifacial PERC modules are installed outdoors on racks with different albedo conditions. A subset is exposed to high-voltage biases of −1500 V or +1500 V. Outdoor data are traced at irradiance ranges of 150–250 W/m 2 , 500–600 W/m 2 , and 900–1000 W/m 2 . These curves are corrected using control module temperature, wire resistivity, and module resistance measured indoors. We examine several methods to transform indoor I–V curves to accurately, and more simply than existing methods, approximate outdoor performance for bifacial modules without and with varying levels of PID-p degradation. This way, bifacial performance modeling can be more accessible and informed by fielded, degraded modules. Distributions of percent errors between indoor and outdoor performance parameters and Mean Absolute Percent Errors (MAPEs) are used to assess method quality. Results including low-irradiance data (150–250 W/m 2 ) are discussed but are filtered for quantifying method quality as these data introduce substantial errors. The method with the most optimal tradeoff between low MAPE and analysis simplicity involves measuring the front side of a module indoors at an irradiance equal to plane-of-array irradiance plus the product of module bifaciality and albedo irradiance. This method gives MAPE values of 1–6.5% for non-degraded and 1.6–5.9% for PID-p degraded module performance.

14 SOLAR ENERGY↗