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At least 127 records · Page 7

Harnessing on-machine metrology data for prints with a surrogate model for laser powder directed energy deposition

In this study, we leverage the massive amount of multi-modal on-machine metrology data generated from Laser Powder Directed Energy Deposition (LP-DED) to construct a comprehensive surrogate model of the 3D printing process. By employing Dynamic Mode Decomposition with Control (DMDc), a data-driven technique, we capture the complex physics inherent in this extensive dataset. This physics-based surrogate model emphasizes thermodynamically significant quantities, enabling us to accurately predict key process outcomes. The model ingests 21 process parameters, including laser power, scan rate, and position, while providing outputs such as melt pool temperature, melt pool size, and other essential observables. Furthermore, it incorporates uncertainty quantification to provide bounds on these predictions, enhancing reliability and confidence in the results. We then deploy the surrogate model on a new, unseen part and monitor the printing process as validation of the method. Our experimental results demonstrate that the predictions align with actual measurements with high accuracy, confirming the effectiveness of our approach. Furthermore, this methodology not only facilitates real-time predictions but also operates at process-relevant speeds, establishing a basis for implementing feedback control in LP-DED.

Digital twins↗

Metrology for femtosecond pulsed x-ray heating in diamond anvil cell experiments at the European XFEL: Revisiting the iron phase diagram up to 150 GPa

The development of pulsed intense x-ray sources, such as free electron laser, offers new avenues for high pressure experiments. Here, we study the feasibility and metrology of x-ray heating in diamond anvil cells at the European x-ray free electron laser. This method enables one to volumetrically heat the sample while inhibiting chemical migration and probing the crystallographic structure of the sample throughout the heating with a high repetition rate. We focus our study on iron, whose phase diagram is well established up to 100 GPa, to explore the possibilities and limitations of this technique. We volumetrically heat iron samples at starting pressures ranging from 10 to 138 GPa, using the x-ray beam pulsed at 4.5 MHz in a serial pump-and-probe experimental design. Experimental challenges arise from temperature gradients within the sample, changes in temperature at the 100 ns timescale, the difficulty of direct temperature estimates, the effect of thermal pressure, and the presence of metastable crystallites due to rapid cycles of heating and cooling. Hence, we develop a multi-crystal-like data processing method that allows us to account for sample heterogeneity in probed conditions. We then calibrate our measurements using known physical properties of iron under pressure. Thermal pressure in our experiments increases from 4% of the isochoric prediction at 10 GPa to 23% at 138 GPa, and we show that our data are in agreement with most previous observations of iron in this pressure range. The method can now be implemented at higher pressures and temperatures and on materials with unknown phase diagrams.

Materials science↗

Nuclear spin metrology with nitrogen vacancy center in diamond for axion dark matter detection

We present a method to directly detect the axion dark matter using nitrogen vacancy centers in diamonds. In particular, we use metrology leveraging the nuclear spin of nitrogen to detect axion-nucleus couplings. This is achieved through protocols designed for dark matter searches, which introduce a novel approach of quantum sensing techniques based on the nitrogen vacancy center. Although the coupling strength of the magnetic fields with nuclear spins is three orders of magnitude smaller than that with electron spins for conventional magnetometry, the axion interaction strength with nuclear spins is the same order of magnitude as that with electron spins. Furthermore, we can take advantage of the long coherence time by using the nuclear spins for the axion dark matter detection. Our method has the potential to be sensitive to a broad frequency range ≲ 100 Hz corresponding to the axion mass m a ≲ 4 × 10 − 13 eV . We present the detection limit of our method for both the axion-neutron and the axion-proton couplings and discuss its significance in comparison with other proposed ideas. We also show that the sensitivities of the NV center sensor to various spin species will open up new directions for constructing protocols that can mitigate magnetic noise effects. Published by the American Physical Society 2025

Chigusa, So (ORCID:0000000160054447)↗

Quantum metrology of low-frequency electromagnetic modes with frequency upconverters

We present the RF Quantum Upconverter (RQU) and describe its application to quantum metrology of electromagnetic modes between dc and the very high frequency band (VHF) ( ≲ 300 MHz). The RQU uses a Josephson interferometer made up of superconducting loops and Josephson junctions to implement a parametric interaction between a low-frequency electromagnetic mode (between dc and VHF) and a mode in the microwave C Band ( ∼ 5 GHz), analogous to the radiation pressure interaction between electromagnetic and mechanical modes in cavity optomechanics. We analyze RQU performance with quantum amplifier theory and show that the RQU can operate as a quantum-limited op-amp in this frequency range. It can also use nonclassical measurement protocols equivalent to those used in cavity optomechanics, including back-action evading (BAE) measurements, sideband cooling, and two-mode squeezing. These protocols enable experiments using dc VHF electromagnetic modes as quantum sensors with sensitivity better than the standard quantum limit (SQL). We demonstrate signal upconversion from low frequencies to the microwave C band using an RQU and show a phase-sensitive gain (extinction ratio) of 46.9 dB , which is a necessary step towards the realization of full BAE. Published by the American Physical Society 2025

Kuenstner, Stephen E. (ORCID:0000000346128846)↗

WFSUITE: A PYTHON SOFTWARE SUITE FOR X-RAY WAVEFRONT SENDING AND AT-WAVELENGTH METROLOGY

SF-26-025 WFSuite is a graphical and command-line toolkit for coded-mask-based X-ray wavefront sensing and phase reconstruction at synchrotron beamlines. It integrates analysis tools for both relative and absolute speckle-based measurements. In the relative metrology module, WFSuite implements Wavelet-transform-based X-ray Speckle Tracking (WXST) and Wavelet-transform-based Speckle Vector Tracking (WSVT) methods to retrieve differential phase and wavefront distortions by comparing speckle patterns recorded with and without the test sample. In the absolute phase module, WFSuite uses coded-mask speckle patterns and replaces the measured reference with a numerically simulated one, enablingsingle-shot wavefront reconstruction using either WXST or a neural-network-based method (SPINNet).

Rebuffi, Luca [Argonne National Laboratory (ANL), ↗

NASA Lyndon B. Johnson Space Center's Metrology Program

Since the establishment in 1962 of the NASA-JSC Metrology Program, the Reference Standards Laboratory has successfully accomplished its goal and objectives. An on-going laboratory surveillance program, established for insuring a continuing validation of the measurements required at the center, is shown to remain at the forefront of modern technology through its involvement in activities such as the NBS sponsored Measurement Assurance Programs and the utilization of an Automatic Calibration System.

Suraci, J. M.↗

Precision machining technology and metrology for AXAF study

The optical surfaces for the Advanced X-ray Astrophysical Facility (AXAF), was studied. The applicability of precision machining technology to the manufacture of the AXAF objective mirrors and the proposed and alternative methods for manufacturing and testing; (1) the AXAF technology mirrors and (2) the AXAF high resolution mirror assembly were reviewed. Surface shape and smoothness metrology for grazing incidence X-ray surfaces and the feasibility of applying heterodyne surface profilometry to nonflat surfaces were investigated. Three sets of scattering flats with known surface profiles and microtopographic character produced by precision machining and polished precision machine surfaces were analyzed.

Sanger, G. M.↗

Advanced flow-polishing and surface metrology of the SO56 X Ray Telescope

The surface finishing of X ray grazing incidence optics is a most demanding area of optical processing, both in terms of metrology and application of optical finishing techniques. An existing optical mirror was processed using a new removal technique that uses a jet of finely dispersed and extremely small particles that impact a surface, which under the correct conditions, produces an ultrasmooth surface, especially on aspheric curvatures. The surfaces of the SO56 mirror are tapered conical shapes that have a continuously changing radius with the primary mirror having a parabolic shape and the secondary mirror a hyperbolic shape. An optical ray trace that was conducted of a telescope used the measured parameters from the existing substrates to set up the prescription for the optical layout. The optimization indicated a wavefront performance of 0.10 A at 0.633 micron.

Source record↗

Metrology: Measurement Assurance Program Guidelines

The 5300.4 series of NASA Handbooks for Reliability and Quality Assurance Programs have provisions for the establishment and utilization of a documented metrology system to control measurement processes and to provide objective evidence of quality conformance. The intent of these provisions is to assure consistency and conformance to specifications and tolerances of equipment, systems, materials, and processes procured and/or used by NASA, its international partners, contractors, subcontractors, and suppliers. This Measurement Assurance Program (MAP) guideline has the specific objectives to: (1) ensure the quality of measurements made within NASA programs; (2) establish realistic measurement process uncertainties; (3) maintain continuous control over the measurement processes; and (4) ensure measurement compatibility among NASA facilities. The publication addresses MAP methods as applied within and among NASA installations and serves as a guide to: control measurement processes at the local level (one facility); conduct measurement assurance programs in which a number of field installations are joint participants; and conduct measurement integrity (round robin) experiments in which a number of field installations participate to assess the overall quality of particular measurement processes at a point in time.

Eicke, W. G.↗

Optical Metrology for the Filter Set for the Hubble Space Telescope (HST) Advanced Camera for Surveys (ACS)

The Hubble Space Telescope (HST) Advanced Camera for Surveys (ACS) will employ a wide variety of spectral filtration components including narrow band, medium band, wide band, and far ultraviolet (FUV) long pass filters, spatially- variable filters (ramp filters), VIS/IR polarizers, NUV polarizers, FUV prisms, and a grism. These components are spread across ACS's Wide Field, High Resolution, and Solar Blind channels which provide diffraction-limited imaging of astronomical targets using aberration-correcting optics which remove most aberrations from HST's Optical Telescope Assembly (OTA). In order for ACS to be truly advanced, these filters must push the state-of-the-art in performance in a number of key areas at the same time. Important requirements which these filters must meet include outstanding transmitted wavefront, high transmittance, uniform transmittance across each filter, spectrally structure-free bandpasses, exceptionally high out of band rejection, and a high degree of parfocality. These constitute a very stringent set of requirements indeed, especially for filters which are up to 90 mm in diameter. The development of optical metrology stations used to demonstrate that each ACS filter will meet its design specifications is discussed. Of particular note are specially-designed spectral transmissometers and interferometers.

Leviton, Douglas B.↗

NGST OTA Optical Metrology Instrumentation and Conceptual Approaches

An Integrated Product Team (IPT) was formed to develop a detailed concept for optical test methodology for testing of the NGST individual primary, secondary and tertiary mirrors and the full telescope system on the ground. Optical testing is a significant cost driver therefore the testing has to understood in detailed fashion early. A brief summary of the preliminary metrology test plan at the mirror component and telescope system level is presented.

Keski-Kuha, R.↗

Metrology and Alignment of Light Weight Grazing Incidence X-Ray Mirrors

Metrology and alignment of light weight X-ray optics have been a challenge for two reasons: (1) that the intrinsic mirror quality and distortions caused by handling can not be easily separated, and (2) the diffraction limits of the visible light become a severe problem at the order of one arc-minute. Traditional methods of using a normal incident pencil or small parallel beam which monitors a tiny fraction of the mirror in question at a given time can not adequately monitor those distortions. We are developing a normal incidence setup that monitors a large fraction, if not the whole, of the mirror at any given time. It will allow us to align thin X-ray mirrors to-an accuracy of a few arc seconds or to a limit dominated by the mirror intrinsic quality.

Zhang, William↗

Radius of Curvature Measurements: An Independent Look at Accuracy Using Novel Optical Metrology

The AMSD (Advanced Mirror System Demonstrator) program mirror specifications include the ability to manufacture the mirror to a radius of curvature of 10 m +/- 1 mm and to control its radius at 30K to the same specification. Therefore, it is necessary for the Government Team to be able to measure mirror radius of curvature to an accuracy of better than 0.5 mm. This presentation discusses a novel optical metrology system for measuring radius of curvature.

Taylor, Bryon↗

Fabrication and Metrology of High-Precision Foil Mirror Mounting Elements

During the period of this Cooperative Agreement, MIT (Massachusetts Institute of Technology) developed advanced methods for applying silicon microstructures for the precision assembly of foil x-ray optics in support of the Constellation-X Spectroscopy X-ray Telescope (SXT) development effort at Goddard Space Flight Center (GSFC). MIT developed improved methods for fabricating and characterizing the precision silicon micro-combs. MIT also developed and characterized assembly tools and several types of metrology tools in order to characterize and reduce the errors associated with precision assembly of foil optics. Results of this effort were published and presented to the scientific community and the GSFC SXT team. A bibliography of papers and presentations is offered.

Schattenburg, Mark L.↗

A Precision Metrology System for the Hubble Space Telescope Wide Field Camera 3 Instrument

The Wide Field Camera 3 (WFC3) instrument for the Hubble Space Telescope (HST) will replace the current Wide Field and Planetary Camera 2 (WFPC2). By providing higher throughput and sensitivity than WFPC2, and operating from the near-IR to the near-UV, WFC3 will once again bring the performance of HST above that from ground-based observatories. Crucial to the integration of the WFC3 optical bench is a pair of 2-axis cathetometers used to view targets which cannot be seen by other means when the bench is loaded into its enclosure. The setup and calibration of these cathetometers is described, along with results from a comparison of the cathetometer system with other metrology techniques.

Toland, Ronald W.↗