SEARCH · Engineering Papers
Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.
Quote a phrase for an exact phrase match. Source license links do not imply unrestricted reuse.
This presentation includes NASA Electronic Parts and Packaging (NEPP) Program future approaches, Radiation Hardness Assurance (RHA) examples.
The space radiation environment can lead to extremely harsh operating conditions for spacecraft electronic systems. A hardness assurance methodology must be followed to assure that the space radiation environment does not compromise the functionality and performance of space-based systems during the mission lifetime. The methodology includes a definition of the radiation environment, assessment of the radiation sensitivity of parts, worst-case analysis of the impact of radiation effects, and part acceptance decisions which are likely to include mitigation measures.
The use of complex single and multicore processors with significant cache memory, on-chip peripherals, memory controllers, and high speed input/output (IO) that integrate many of the parts of a traditional computer system is becoming more common in space applications. Such devices are often referred to as system on a chip devices (SOCs), even though the term is used somewhat inaccurately due to the lack of analog and mixed signal subcircuits. These devices are complex combinations of single- or multi-core processors with memory controllers, high-speed input/output (IO), and other peripheral structures that formerly would have been handled by off-chip resources. In the past the processors were tested for single event effects (SEE) separately, and the peripherals were often put into custom application-specific integrated circuits (ASICs) along with other resources required by the user. Performance and cost pressures have pushed commercial devices to incorporate many of the functional blocks into a single chip, an SOC. The NASA Electronic Parts and Packaging Program (NEPP) has been examining ways to perform SEE radiation hardness assurance (RHA) testing of these processor-centric SOCs to achieve reasonable understanding of their performance in space missions.
We present a brief overview of select NASA radiation hardness assurance guideline update activities as well as cross-agency workforce development efforts.
Dr. Jean-Marie Lauenstein, NASA Goddard Space Flight Center, will present the radiation challenges of adopting wide-bandgap semiconductors for space applications. Wide-bandgap devices are attractive for space applications due to improved performance such as faster switching speeds, lower power losses, and their ability to operate at higher temperature as compared with their silicon counterparts. Their tolerance to total ionizing dose levels (> 100 krad(Si)) further enhances the desirability of these technologies. This short course will focus on silicon carbide and gallium nitride power rectifying, switching, and RF devices as these technologies are now readily available commercially. The radiation hardness assurance issues presented by the heavy-ion radiation environment will be discussed.
Recent enhanced low dose rate sensitivity (ELDRS) investigations carried out by RLP Research, Crane, Arizona State University (ASU), and Jet Propulsion Laboratory (JPL) have shown significant differences in the degradation of bipolar microcircuits with total dose in the presence of molecular hydrogen (H2) in packages. This has a significant impact on radiation hardness assurance and opens up opportunity to improve device performance. The objectives of this program are 1) to investigate and confirm the causal relationship between packaging recipes, hydrogen contamination, and total dose response of linear bipolar microcircuits; and 2) to develop a guideline that will take into account these effects at the radiation level for future NASA space missions. This program is geared to benefit all future NASA space missions using bipolar or BiCMOS linear devices.
Total dose tests of six different low dropout voltage regulators show sensitivity to both dose rate and bias during exposure. All devices tested exhibited Enhanced Low Dose Rate Sensitivity (ELDRS) and performed worse for the unbiased irradiation condition. Behavior of critical parameters in different dose rate and bias conditions is compared and the impact to hardness assurance methodology is discussed.
Radiation effects in electrical, electronic, electro-motive, and electro-optical (EEEE) hardware encompass a complex variety of interactions, processes, environments, and an evolving landscape of relevant hardware. Appropriately mitigating the effects of radiation in sensors, data acquisition, and control hardware is among the most significant challenges associated with deploying space nuclear power and propulsion systems. The expertise within EEEE radiation effects disciplines require working knowledge that is at least as complex and diverse as the problem itself, but that should not dissuade stakeholders and engineers in adjacent disciplines from attempting to understand the general principles associated with the problem at hand. This brief overview seeks to bring to the foreground a set of relevant topics that are of special importance for space nuclear propulsion applications that involve high rates of neutron and gamma radiation. The unique set of environments and design requirements for space nuclear systems mean that the experience and utility for methods applied to typical spaceflight hardware or terrestrial nuclear systems must not be applied naively. Forward consideration on the applicability of testing methods applied to either existing or bespoke hardware is likely to drive early decisions on system-wide radiation effects mitigation strategies, and will influence procurement requirements for providers of radiation tolerant hardware who are unlikely to have experience in this unique set of environments. Radiation hardness assurance (RHA) guidance should be adapted and emphasize the importance of hardware testing in the relevant environment. These must consider the combined effects of temperature, total ionizing dose (TID), non-ionizing/displacement damage (TNID/DD), and single event effects (SEE), and should consider the impacts of flux (rate) in addition to cumulative effects.
In this paper, we irradiate a number of silicon power Schottky diodes from a variety of manufacturers. The tested diodes represent a wide assortment of reverse voltages and forward currents. Additionally, we review correlations between single-event failures in Schottky diodes and device electrical parameters. The spatial locations of failures in the diode are discussed, as well as a possible explanation for why the failures occur. Based on these correlations to date, we propose a derating scheme for Schottky diodes flown in a heavy ion environment and suggest screening procedures for decreasing the risks of such failures.
In this paper, we use high- and low-magnification optical microscope images, thermal infrared camera images, and scanning electron microscope images to identify failure locations in heavy-ion-irradiated Schottky diodes. After failures have been identified, the parts were cross-sectioned to describe the structure of the failures and energy dispersive x-ray spectroscopy was used to characterize the materials in the failure structures.
Overview of agency-level electronic parts management, the NASA Electronic Parts and Packaging (NEPP) Program, and NEPP Program Fiscal Year 2019 task investment areas.
Explore the source record for details and available documents.
Explore the source record for details and available documents.
This document, the JSC Engineering Directorate Avionics Ionizing Radiation Effects Standard (AIRES), provides design, test, and analysis requirements to ensure electronic hardware meets functional, performance and reliability requirements in the mission ionizing radiation environment. This suite of activities is referred to as Radiation Hardening Assurance (RHA) and is an integral part of the hardware design process.
Explore the source record for details and available documents.
A number of activities within NASA and the space community, as well as growing technology needs and supply chain changes have accelerated the need to expand the use of COTS parts within NASA. While the use of COTS has been formally institutionalized and deemed acceptable for Class D space missions and those with greater tolerance for risk, there is still a lack of understanding of how to most effectively use COTS in such high risk-tolerance missions, and no apparent path towards broad use in missions with much less tolerance for risk. However, the reality is that the fundamental limitations of technology associated with the military specification system combined with the need to fly newer technologies in upcoming flagship robotic missions and human space flight missions will ultimately demand a more expansive use of COTS. The infinite nature of COTS gives rise to numerous challenges in the selection, acceptance, testing, and usage of COTS when reliable operation is essential. This presentation will highlight some of the results of a NASA Engineering and Safety Center (NESC) study on the use of COTS parts, as well as many of the historical through current facts about parts assurance within Agency to provide a path forward for reliable use of COTS for a range of space applications and risk postures. In addition this presentation will dispel the myth that expanded use of COTS parts causes a new set of radiation threats to missions.
A number of activities within NASA and the space community, as well as growing technology needs and supply chain changes have accelerated the need to expand the use of COTS parts within NASA. While the use of COTS has been formally institutionalized and deemed acceptable for Class D space missions and those with greater tolerance for risk, there is still a lack of understanding of how to most effectively use COTS in such high risk-tolerance missions, and no apparent path towards broad use in missions with much less tolerance for risk. However, the reality is that the fundamental limitations of technology associated with the military specification system combined with the need to fly newer technologies in upcoming flagship robotic missions and human space flight missions will ultimately demand a more expansive use of COTS. The infinite nature of COTS gives rise to numerous challenges in the selection, acceptance, testing, and usage of COTS when reliable operation is essential. This presentation will highlight some of the results of a NASA Engineering and Safety Center (NESC) study on the use of COTS parts, as well as many of the historical through current facts about parts assurance within Agency to provide a path forward for reliable use of COTS for a range of space applications and risk postures. In addition this presentation will dispel the myth that expanded use of COTS parts causes a new set of radiation threats to missions.
The purpose of the membrane water deaerator program was to develop data on a breadboard hollow fiber membrane unit that removes both dissolved and evolved gas from a water transfer system in order to: (1) assure a hard fill of the EVLSS expendable water tank; (2) prevent flow blockage by gas bubbles in circulating systems; and (3) prevent pump cavitation.