Saturn integrated circuit reliability test program Quarterly progress report, Jan. - Mar. 1967
Reliability and failure mode prevention tests for Saturn integrated circuits
SATURN LAUNCH VEHICLE↗
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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.
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Adaptation of models for minority-carrier devices to integrated circuits
Adaptation of models for minority carrier devices, and applicability in computer design evaluation studies of integrated circuits
ELECTRONIC EQUIPMENT TESTING↗
Computer-oriented modelling of integrated circuits - Algorithms for the dichotomous presentation of active networks
Computer oriented modeling of integrated circuits - algorithms for dichotomous presentation of active networks
INTEGRATED CIRCUIT↗
The integrated-circuit control and timing system of the high-altitude rocket-radar project
Integrated circuit control and timing system of high altitude rocket radar
TIMING APPARATUS↗
Power integrated circuits in the Saturn system
Saturn launch vehicle power integrated circuits and static inverter
STATIC INVERTER↗
Investigating the potential reliability of integrated circuits from parameter distributions
Distribution plots of electrical parameters as means of investigating potential reliability of integrated circuits
CURRENT DISTRIBUTION↗
A high reliability specification for digital integrated circuits
High reliability specification for digital integrated circuits
INTEGRATED CIRCUIT↗
Calculation of a sawtooth-voltage-oscillation shaping circuit
Calculation of sawtooth voltage oscillations of triangular shape for pulse width modulation pulse shaping circuit
VOLTAGE↗
Computer-aided circuit analysis Annual report, 15 May 1966 - 15 Aug. 1967
Numerical methods, programs, and mathematical models for use in digital computer-aided circuit analysis and design
COMPUTER PROGRAMMING↗
Proton irradiation effects in MOS and junction field-effect transistors and integrated circuits
Proton irradiation effects in MOS and junction field effect transistors and integrated circuits
INTEGRATED CIRCUIT↗
Some variations of tunnel diode pulse generator circuits
Variations of tunnel diode pulse generator circuits
LOGIC CIRCUIT↗
A transistor-circuit realization of the inductance.
Transistor circuit realization of inductance with three transistors and one power supply
INDUCTANCE↗
Encoders and decoders with integrated circuits.
Encoding and decoding techniques using integrated circuits and applicable to binary digitizing of electrical analog information
ANALOG-TO-DIGITAL CONVERTER↗
CIRCAL - On-line circuit design.
On-line nonlinear circuit design, discussing computer program for evaluating performance resulting from modifications
COMPUTER METHOD↗
High Performance Low Cost Power Conversion and Control Using Smart Power Electronic Circuits
New power control technologies, such as smart power (SP) and power integrated circuits (PICs), are being developed to decrease cost and increase performance of photovoltaic power arrays.
photovoltaic power power control smart power power↗
A Parallel Discrete Surface Integral Equation Method For the Analysis of Three-Dimensional Microwave Circuit Devices with Planar Symmetry
It has been found that the Discrete Integral Equation (DSI)technique is a highly effective technique for the analysis of microwave circuits and devices [1,2]. The DSI is much more robust than the traditional Finite Difference Time Domain (FDTD) method in a number of ways.
Microwave Circuits Algorithm DSI↗
Thermoelectric Devices and Diamond Films for Temperature Control of High Density Electronic Circuits
The increased speeds of integrated circuits is accompanied by increased power levels and the need to package the IC chips very close together.
high power densities IC chips thermal management m↗
Enhanced Low Dose Rate Effects in Bipolar Circuits: A New Hardness Assurance Problem for NASA
Many bipolar integrated circuits are much more susceptible to ionizing radiation at low dose rates than they are at high dose rates typically used for radiation parts testing. Since the low dose rate is equivalent to that seen in space, the standard lab test no longer can be considered conservative and has caused the Air Force to issue an alert. Although a reliable radiation hardness assurance test has not yet been designed, possible mechanisms for low dose rate enhancement and hardness assurance tests are discussed.
bipolar integrated circuits↗