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At least 1,171 records · Page 65

Understanding TRISO Coated Particle Neutron Irradiation Behavior:Evolution of Advanced Micro Analysis and Electron Microscopy Approaches

Objectives and motivation• Provide data for fuel qualification in support of reactor licensing• Establish a domestic commercial TRISO fuel fabrication capability Approach • Focus is on developing and testing UCO TRISO fuel –Develop fuel fabrication and QC measurement methods, first at lab scale and then at industrial scale –Perform irradiation testingover a range of conditions (burnup, temperature, fast neutron fluence) –Perform post-irradiation examination and safety testingto demonstrate and understand performance during irradiation and during accident conditions –Develop fuel performance modelsto better predict fuel behavior –Perform fission product transport experiments to improve understanding and refine models of fission product transport

11 NUCLEAR FUEL CYCLE AND FUEL MATERIALS↗

Tuned oscillator atomic force microscopy methods and apparatus

Techniques for operating an atomic force microscope, the atomic force microscope comprising a cantilever and configured to image a surface of a sample using a probe tip coupled to the cantilever, the techniques comprising using a controller to perform: obtaining, based on at least one intrinsic parameter of the cantilever, a first quality factor and a first free oscillation amplitude, wherein the cantilever exhibits only one stable oscillation state when oscillating at the first free oscillation amplitude and operating at the first quality factor; and controlling the cantilever to exhibit the only one stable oscillation state by controlling the cantilever to oscillate at a fixed frequency at or near a resonance frequency of the cantilever, oscillate at the first free oscillation amplitude, and operate at the first quality factor.

Schwarz, Udo↗

Microscopy imaging device with advanced imaging properties

Systems, methods and devices are implemented for microscope imaging solutions. One embodiment of the present disclosure is directed toward an epifluorescence microscope. The microscope includes an image capture circuit including an array of optical sensor. An optical arrangement is configured to direct excitation light of less than about 1 mW to a target object in a field of view of that is at least 0.5 mm2 and to direct epi-fluorescence emission caused by the excitation light to the array of optical sensors. The optical arrangement and array of optical sensors are each sufficiently close to the target object to provide at least 2.5 μm resolution for an image of the field of view.

Ghosh, Kunal↗

Pan-sharpening for microscopy

Techniques for generating full-spatial resolution, full spectral resolution image(s) from a 3D spectral-data cube for any spectral value within a given spectral range are provided without requiring the acquisition of all full-spatial resolution, full spectral resolution data by an instrument. The 3D spectral-data cube is generated from a limited number of full-spatial resolution, sparse spectral resolution data and a sparse-spatial resolution, full-spectral resolution data of the same area of the sample. The use of the 3D spectral-data cube reduces the data acquisition time.

Ovchinnikova, Olga S.↗

Systems and methods for interferometric multifocus microscopy

A system to generate image representations includes a first objective that receives a first light beam emitted from a sample and a second objective that receives a second light beam emitted from the sample, where the first light beam and the second light beam have conjugate phase. The system also includes a first diffractive element to receive the first light beam and separate it into a first plurality of diffractive light beams that are spatially distinct, and a second diffractive element to receive the second light beam and separate it into a second plurality of diffractive light beams that are spatially distinct. The system further includes a detector that receives the first and second plurality of diffractive light beams. The first plurality of diffractive light beams and the second plurality of diffractive light beams are simultaneously directed and focused onto different portions of an image plane of the detector.

He, Kuan↗