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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.
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Monitoring device detects and indicates directly the amount of contamination deposited on a surface. It uses an optical system in conjunction with a reliable collimated light source and associated electronics. Change in its output signal is proportional to change in the optical absorption characteristics of the sample plate surface.
Silicon carbide, insensitive to visible light, is used in photodetectors. System contamination can be monitored during the normal operation without interference to the operator, and without shielding from ambient light.
Cell culture method of screening contaminants which may appear in manned spacecraft
Electromagnetic absorption and scattering by contaminants from Apollo spacecraft
Trace contaminant identification using microwave double resonance spectroscopy
Methodology of measuring internal contamination in spacecraft hardware
Contaminant controls and cleaning procedures in SNAP-8 simulation loop of liquid metals
Techniques for sterilization of planetary probes and landers to prevent contamination of exobiological instrumentation, tests, and planetary biospheres
Surveyor 5 landing site contamination from solid aluminum oxide particles in main retro exhaust
Systems approach for establishing cohesive contamination control techniques
Design and development of prototype contaminant sensor for manned space missions
Ultraviolet measurements of oil contamination in optical mirrors
Survival of microorganisms on covered stainless steel initially contaminated by handling and aerial fallout
Conference on instrumentation, automation, and test methods in contamination control
Automatic contamination sensors and monitors for aerospace fluid systems
Conductivity of liquids as monitor for surface contamination
Contamination effects and controls in Saturn launch vehicle hydraulic systems
Radioactive contamination monitoring methods and instrumentation