Thermal stability of partially ordered Fe{sub 16}N{sub 2} film on non-magnetic Ag under layer
Partially ordered Fe{sub 16}N{sub 2} thin film with (001) texture is successfully grown on a Ag under layer using a facing target sputtering system. Fe{sub 16}N{sub 2} phase is formed after post-annealing, which is detected by X-ray diffraction (XRD). High saturation magnetization (M{sub s}) of Fe{sub 16}N{sub 2} thin films is observed by vibrating sample magnetometry. It is found that Fe{sub 16}N{sub 2} phase can be stable up to 225 °C, which is demonstrated by the Fe{sub 16}N{sub 2} finger print peak (002) in XRD. After heating to 250 °C, the Fe{sub 16}N{sub 2} phase decomposes, which leads to low M{sub s} and soft magnetic behavior. To further study Fe{sub 16}N{sub 2} decomposition, X-ray photoelectron spectroscopy is performed to detect the binding energy of nitrogen atoms. Differences of binding energy corresponding to before and after heat treatment show the variation of nitrogen atom in electronic state with surrounding Fe atoms, indicating nitrogen atomic migration during heat treatment.