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Reliable solid-state circuits Semiannual report, 1 Dec. 1964 - 31 May 1965
Circuit concepts for realization of highly reliable and efficient electronic subsystems and microminiaturization application - switching amplifier analysis
Redundancy techniques to improve the reliability of two level and three level logic circuits
Redundancy techniques in two and three level logic circuits - reliability improvement
Computer aids for worst case electronic circuit design
Computer aids for worst case electronic circuit design
Study of solid-state integrated microwave circuits Scientific report no. 1, 15 Sep. - 14 Dec. 1965
Solid state microwave devices applied to integrated circuits
The development of a standard for multilayer printed circuit boards by means of research, development, and testing Final report
Environmental testing and material characteristics of multilayer printed circuit boards
Study of solid-state integrated microwave circuits Scientific report no. 2, 15 Dec. 1965 - 14 Mar. 1966
Frequency-modulation telemetry transmitter configurations for use in 1-GHZ to 2-GHZ FREQUENCY range - solid state integrated microwave circuits
Process techniques study of integrated circuits Quarterly report no. 3
Processing techniques of integrated circuits
Process techniques study of integrated circuits Quarterly report no. 4
Processing techniques of integrated circuits
Micropower logic circuits.
Complementary symmetry flip-flop and similar transistor micropower digital logic circuit design
Digital devices development - Integrated circuits-delay line interface circuitry
Interfacing ultrasonic delay lines in digital systems using integrated circuit logic
High reliability screening of semiconductor and integrated circuit devices Final report
High reliability screening of semiconductor and integrated circuit devices
Building Blocks for Large-scale Integration of Logic Circuits
Large scale integration of logic circuits
Saturn integrated circuit reliability test program Quarterly progress report, Jul. - Sep. 1966
Saturn integrated circuit reliability tests performed to improve failure mode screening
Topographic simulation as an aid to printed circuit board design
Topographic simulation scheme used to program path layout of conductors in printed circuit board design
High reliability screening of semiconductor and integrated circuit devices
Destructive and nondestructive testing, results, and specifications for reliability of integrated circuit and semiconductor devices
Improved micropower logic circuits
Micropower transistor logic circuits designed to operate from power supply voltages which vary with temperature