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At least 109 records · Page 6

Impact of atmospheric refraction: how deeply can we probe exo-earth's atmospheres during primary eclipse observations?

Most models used to predict or fit exoplanet transmission spectra do not include all the effects of atmospheric refraction. Namely, the angular size of the star with respect to the planet can limit the lowest altitude, or highest density and pressure, probed during primary eclipses as no rays passing below this critical altitude can reach the observer. We discuss this geometrical effect of refraction for all exoplanets and tabulate the critical altitude, density, and pressure for an exoplanet identical to Earth with a 1 bar N{sub 2}/O{sub 2} atmosphere as a function of both the incident stellar flux (Venus, Earth, and Mars-like) at the top of the atmosphere and the spectral type (O5-M9) of the host star. We show that such a habitable exo-Earth can be probed to a surface pressure of 1 bar only around the coolest stars. We present 0.4-5.0 μm model transmission spectra of Earth's atmosphere viewed as a transiting exoplanet, and show how atmospheric refraction modifies the transmission spectrum depending on the spectral type of the host star. We demonstrate that refraction is another phenomenon that can potentially explain flat transmission spectra over some spectral regions.

79 ASTRONOMY AND ASTROPHYSICS↗

CONTRIBUTION OF VELOCITY VORTICES AND FAST SHOCK REFLECTION AND REFRACTION TO THE FORMATION OF EUV WAVES IN SOLAR ERUPTIONS

We numerically study the detailed evolutionary features of the wave-like disturbance and its propagation in the eruption. This work is a follow-up to Wang et al., using significantly upgraded new simulations. We focus on the contribution of the velocity vortices and the fast shock reflection and refraction in the solar corona to the formation of the EUV waves. Following the loss of equilibrium in the coronal magnetic structure, the flux rope exhibits rapid motions and invokes the fast-mode shock at the front of the rope, which then produces a type II radio burst. The expansion of the fast shock, which is associated with outward motion, takes place in various directions, and the downward expansion shows the reflection and the refraction as a result of the non-uniform background plasma. The reflected component of the fast shock propagates upward and the refracted component propagates downward. As the refracted component reaches the boundary surface, a weak echo is excited. The Moreton wave is invoked as the fast shock touches the bottom boundary, so the Moreton wave lags the type II burst. A secondary echo occurs in the area where reflection of the fast shock encounters the slow-mode shock, and the nearby magnetic field lines are further distorted because of the interaction between the secondary echo and the velocity vortices. Our results indicate that the EUV wave may arise from various processes that are revealed in the new simulations.

79 ASTRONOMY AND ASTROPHYSICS↗

Initial growth, refractive index, and crystallinity of thermal and plasma-enhanced atomic layer deposition AlN films

The authors have studied and compared the initial growth and properties of AlN films deposited on Si(111) by thermal and plasma-enhanced atomic layer deposition (ALD) using trimethylaluminum and either ammonia or a N{sub 2}-H{sub 2} mixture as precursors. In-situ spectroscopic ellipsometry was employed to monitor the growth and measure the refractive index of the films during the deposition. The authors found that an incubation stage only occurred for thermal ALD. The linear growth for plasma-enhanced ALD (PEALD) started instantly from the beginning due to the higher nuclei density provided by the presence of plasma. The authors observed the evolution of the refractive index of AlN during the growth, which showed a rapid increase up to a thickness of about 30 nm followed by a saturation. Below this thickness, higher refractive index values were obtained for AlN films grown by PEALD, whereas above that the refractive index was slightly higher for thermal ALD films. X-ray diffraction characterization showed a wurtzite crystalline structure with a (101{sup ¯}0) preferential orientation obtained for all the layers with a slightly better crystallinity for films grown by PEALD.

36 MATERIALS SCIENCE↗

Technique for forming ITO films with a controlled refractive index

A new method for fabricating transparent conducting coatings based on indium-tin oxide (ITO) with a controlled refractive index is proposed. This method implies the successive deposition of material by electron-beam evaporation and magnetron sputtering. Sputtered coatings with different densities (and, correspondingly, different refractive indices) can be obtained by varying the ratio of the mass fractions of material deposited by different methods. As an example, films with effective refractive indices of 1.2, 1.4, and 1.7 in the wavelength range of 440–460 nm are fabricated. Two-layer ITO coatings with controlled refractive indices of the layers are also formed by the proposed method. Thus, multilayer transparent conducting coatings with desired optical parameters can be produced.

36 MATERIALS SCIENCE↗

Study of the Effective Refractive Index Profile in Self-Assembling Nanostructured ITO Films

The optical characteristics and structural features of self-assembling nanostructured indium–tin oxide (ITO) films deposited onto substrates heated above 400°C are studied. Estimations of the distribution profiles of the material and effective refractive index in the films under study are obtained by computer simulation of a medium having spectral dependences of light transmission and reflection coefficients closest to those observed in the experiment. These results are in good agreement with scanning electron microscopy data for these films and make it possible to not only confirm the gradient character of such coatings but also restore some of its features. The further overgrowth of voids in self-assembling nanostructured films by means of the deposition of an additional material amount by magnetron sputtering at room temperature leads to a variation in the effective refractive index profile in them. Thus, it is possible to form transparent conductive films with an efficient refractive index profile adjusted for specific tasks. Adjustment of the refractive index profile in self-assembled ITO films acquires a special value for designing coatings with specified properties by virtue of a limited set of transparent conductive materials.

36 MATERIALS SCIENCE↗

Simultaneous Retrieval of Effective Refractive Index and Density from Size Distribution and Light Scattering Data: Weakly-Absorbing Aerosol

We propose here a novel approach for retrieving in parallel the effective density and real refractive index of weakly absorbing aerosol from optical and size distribution measurements. Here we define “weakly absorbing” as aerosol single-scattering albedos that exceed 0.95 at 0.5 um.The required optical measurements are the scattering coefficient and the hemispheric backscatter fraction, obtained in this work from an integrating nephelometer. The required size spectra come from a Scanning Mobility Particle Sizer and an Aerodynamic Particle Sizer. The performance of this approach is first evaluated using a sensitivity study with synthetically generated but measurement-related inputs. The sensitivity study reveals that the proposed approach is robust to random noise; additionally the uncertainties of the retrieval are almost linearly proportional to the measurement errors, and these uncertainties are smaller for the real refractive index than for the effective density. Next, actual measurements are used to evaluate our approach. These measurements include the optical, microphysical, and chemical properties of weakly absorbing aerosol which are representative of a variety of coastal summertime conditions observed during the Two-Column Aerosol Project (TCAP; http://campaign.arm.gov/tcap/). The evaluation includes calculating the root mean square error (RMSE) between the aerosol characteristics retrieved by our approach, and the same quantities calculated using the conventional volume mixing rule for chemical constituents. For dry conditions (defined in this work as relative humidity less than 55%) and sub-micron particles, a very good (RMSE~3%) and reasonable (RMSE~28%) agreement is obtained for the retrieved real refractive index (1.49±0.02) and effective density (1.68±0.21), respectively. Our approach permits discrimination between the retrieved aerosol characteristics of sub-micron and sub-10micron particles. The evaluation results also reveal that the retrieved density and refractive index tend to decrease with an increase of the relative humidity.

density↗

Remote Sensing of the Ocean Surface Refractive Index via Short-Wave Infrared Polarimetry

The linear polarization of sunlight reflected by ocean surfaces in the shortwave infrared (SWIR), at geometries where specular reflection dominates the signal, is a direct function of the refractive index of the surface microlayer(SML). This simple physical concept is at the base of a novel technique presented in this study. We invert observations obtained by the airborne Research Scanning Polarimeter (RSP) in the sun glint region, where each pixel's radiance is dominated by the signal originating from the wave slopes oriented precisely to cause specular reflection. The SWIR wavelength ensures minimization of aerosol interference when radiance travels through the atmosphere; strong absorption by the water body then limits the penetration depth to the first micrometer or so, effectively probing the SML. The resulting Degree of Linear Polarization (DoLP) is then governed by the refractive index via the Fresnel law for the specfic pixel geometry, independently of the wind speed. The selected dataset concerns several field deployments from both low- and high-altitude aircraft, including total reflectance measurements with the sole purpose of accounting for the residual aerosol effect.Stable retrievals from transects above pure seawater yielded values of refractive index that match the values published in the literature within an accuracy of 5 x 10 [superscript 4]. Flying over the oil spill caused by the explosion of the Deepwater Horizon platform, detected variations were found compatible with the presence of an oil slick. The robustness of the results, guaranteedby the high RSP polarimetric accuracy (less than or equal to 0:2%), opens the possibility for remote-sensing detection of other entities that similarly affect the refractive index including whitecaps, microplastics, biological gels, seaweed and grass mats.

Surface Microlayer↗

Refractive Index of Polyaryletherketone (PEEK) at X- and W-Band

This report details refractive index measurements of polyaryletherketone (PEEK) thermoplastic between X-band (8 to 12 GHz) and W-band (75 to 110 GHz) frequencies. Scattering-parameter data are collected using both traditional waveguide and modified free-space techniques. The complex-valued refractive index is calculated using the standard Nicolson-Ross-Weir method. Results indicate that PEEK’s refractive index is n = 1.783 – 0.001i across X-band and n = 1.792 – 0.007i across W-band. Therefore, PEEK exhibits a moderate real refractive index component and low transmission loss. Coupled with its favorable mechanical and thermal properties, this makes PEEK an ideal material to inspect using NASA’s submillimeter radiofrequency-based technology.

Polyaryletherketone↗

Digital and Gradient Refractive Index Planar Optics by Nanoimprinting Mesoporous Silicon

We report the realization of digital and gradient index flat-optics and planar waveguides using the ‘nanoimprinting refractive index’ (NIRI) technique applied to mesoporous silicon. This technique combines the distinct optical and mechanical metamaterial qualities of mesoporous silicon, including its widely tunable effective refractive index and ability to undergo plastic deformation with a near zero Poisson ratio. Nanoimprinting with premastered and reusable stamps containing analog or digital features enables the continuous or discontinuous patterning of refractive index with high contrast Δn ≥ 0.8 and subwavelength resolution. Using NIRI we experimentally demonstrate a wavefront shaping flat microlens array operating in the visible (405–635 nm) and mesoporous silicon and silica waveguides operating near 1310 nm. This study demonstrates the viability of patterning arbitrary refractive index distributions, n(x,y), on the surface of a chip while circumventing the challenges and limitations of top-down lithographic techniques – thus opening a low-cost and scalable approach for the realization of advanced planar optical technologies.

36 MATERIALS SCIENCE↗

Very High Refractive Index Transition Metal Dichalcogenide Photonic Conformal Coatings by Conversion of ALD Metal Oxides

Materials for nanophotonic devices ideally combine ease of deposition, very high refractive index, and facile pattern formation through lithographic templating and/or etching. In this work, we present a scalable method for producing high refractive index WS 2 layers by chemical conversion of WO 3 synthesized via atomic layer deposition (ALD). These conformal nanocrystalline thin films demonstrate a surprisingly high index of refraction (n > 3.9), and structural fidelity compatible with lithographically defined features down to ~10 nm. Although this process yields highly polycrystalline films, the optical constants are in agreement with those reported for single crystal bulk WS 2 . Subsequently, we demonstrate three photonic structures - first, a two-dimensional hole array made possible by patterning and etching an ALD WO 3 thin film before conversion, second, an analogue of the 2D hole array first patterned into fused silica before conformal coating and conversion, and third, a three-dimensional inverse opal photonic crystal made by conformal coating of a self-assembled polystyrene bead template. Furthermore these results can be trivially extended to other transition metal dichalcogenides, thus opening new opportunities for photonic devices based on high refractive index materials.

36 MATERIALS SCIENCE↗

Revisiting the Anisotropic Complex Refractive Indices of Sodium Nitrate for Interpretation of the Reflectance Spectrum of Pressed Pellets

Reflectance spectroscopy is notoriously confounding in that the measured spectral response is highly dependent upon the morphology of the sample. Fortunately, all such perturbations are neatly encoded by the complex refractive index of the sample. Herein, we seek to quantitatively model the measured infrared reflectance spectrum of a specularly flat pressed pellet sample of the birefringent compound, sodium nitrate. Single crystals of sodium nitrate were synthesized via a slow evaporation process and spectroscopically analyzed using polarization-dependent infrared single-angle reflectance spectroscopy. The anisotropic complex refractive index was measured from 7500 to 300 cm-1 (1.33 to 33.33 µm). The deduced anisotropic optical constants were found to be consistent with those previously reported. Once measured and validated, the optical constants were applied to model the pressed pellet reflectance spectrum. It was evident that an average of the anisotropic refractive indices was insufficient to account for the measured pellet reflectance. In order to account for contributions of all possible microcrystalline orientations within the pellet, the Python package PYELLI was used to calculate a basis set of orientation-dependent reflection spectra spanning the distinct ? and ? Euler rotations of the uniaxial crystal. When the population of orientations was allowed to vary freely in a spectral fit analysis, the fit-deduced orientations were tightly clustered along f = 45º, hinting at residual anisotropy in the pressed pellet sample. Conversely, an equally valid spectral fit (with marginally worse fit metric) was obtained when the population was constrained to an isotropic distribution of orientations. Subsequent non-zero cross-polarization reflectance measurements likewise suggested anisotropy in the pellet. However, both grazing incidence wide-angle x-ray scattering and scanning electron microscopy measurements revealed that the microcrystal orientations at the surface of the pressed pellet sample were isotropically distributed (and that the average crystallite size was larger than ?/10). Application of the measured complex refractive indices for modeling the reflectance spectrum of the pressed pellet, and rectification of these seemingly contradictory observations will be discussed.

Wilhelm, Michael J.↗

Dependence on pressure of the refractive indices of wurtzite ZnO, GaN, and AlN

We have measured both the ordinary and extraordinary refractive index of m-plane cuts of wurtzite ZnO, GaN, and AlN single crystals at room temperature and as a function of hydrostatic pressure up to 8 GPa. For that purpose we have developed an alternative optical interference method, called bisected-beam method, which leads, in general, to high contrast interference fringes. Its main feature, however, is to be particularly suitable for high pressure experiments with the diamond anvil cell, when the refractive index of the sample is low and similar to that of diamond and/or the pressure transmitting medium, as is the case here. For all three wide-gap materials we observe a monotonous decrease of the ordinary and extraordinary refractive indices with increasing pressure, being most pronounced for GaN, less marked for ZnO, and the smallest for AlN. The frequency dependence of the refractive indices was extrapolated to zero energy using a critical-point-plus-Lorentz-oscillator model of the ordinary and extraordinary dielectric function. In this way, we determined the variation with pressure of the electronic part (no-phonon contribution) of the static dielectric constant epsilon(infinity). Its volume derivative, r = d ln epsilon(infinity)/d ln V, serves as single scaling coefficient for comparison with experimental and/or theoretical results for other semiconductors, regarding the pressure effects on the dielectric properties. We have obtained an ordinary/extraordinary average value (r) over bar of 0.49(15) for ZnO, 1.22(9) for GaN, and 0.32(4) for AlN. With the values for the ordinary and extraordinary case being within experimental uncertainty, there is thus no apparent change in dielectric anisotropy under pressure for these wurtzite semiconductors. Results are discussed in terms of the pressure-dependent electronic band structure of the materials.

Goni, AR↗

Effective medium approximation for the refractive index of stratified metal oxide composites synthesized by atomic layer deposition

Atomic layer deposition (ALD) is a unique method for synthesizing conformal layers with precise composition. It is especially useful for the synthesis of mixed metal oxides for functional materials. One application of interest is the use of ALD for tailoring the refractive index of coatings. In homogeneously distributed composites of metal oxides, the refractive properties can be approximated as the average of the indices of the components. This is known as an effective medium approximation (EMA) and can be used to design the macroscopic properties of composites. ALD produces layered, anisotropic films, so the validity of an EMA in describing these films is not clear. Here, we use optical simulations and experimental characterization of stratified composites of TiO 2 and Al 2 O 3 to study the application of an EMA to the transmission and reflection behavior of ALD-prepared mixed metal oxide thin films. We found that when the characteristic layer thickness is smaller than roughly 10 nm, the optical spectra of theoretical and experimental ALD films match the equivalent theoretical spectra for a material with a refractive index calculated from a simple, compositionally weighted EMA. Hence, this EMA could describe the transmission and reflectance spectra in ALD-derived TiO2–Al 2 O 3 nanolaminates when the films were sufficiently stratified even without thorough characterization of the real layers in the films. As a result, we demonstrated that ALD can be used to prepare effectively homogenous mixed metal oxide films with a predictable, tailorable refractive index of any value between those of the TiO 2 and Al 2 O 3 component materials.

42 ENGINEERING↗

Single-shot Z eff dense plasma diagnostic through simultaneous refraction and attenuation measurements with a Talbot–Lau x-ray moiré deflectometer

The Talbot–Lau x-ray moiré deflectometer is a powerful plasma diagnostic capable of delivering simultaneous refraction and attenuation information through the accurate detection of x-ray phase shift and intensity. The diagnostic can provide the index of refraction n = 1 - δ + iβ of an object (dense plasma, for example) placed in the x-ray beam by independently measuring both δ and β, which are directly related to the electron density ne and the attenuation coefficient μ, respectively. Since δ and β depend on the effective atomic number Z eff , a map can be obtained from the ratio between phase and absorption images acquired in a single shot. The Talbot–Lau x-ray moiré deflectometer and its corresponding data acquisition and processing are briefly described to illustrate how the above is achieved; Z eff values of test objects within the 4–12 range were obtained experimentally through simultaneous refraction and attenuation measurements. We show that Z eff mapping of objects does not require previous knowledge of sample length or shape. The determination of Z eff from refraction and attenuation measurements with Moiré deflectometry could be of high interest to various domains of HED research, such as shocked materials and ICF experiments, as well as material science and NDT.

47 OTHER INSTRUMENTATION↗

Impact of high refractive coating material on the nodular-induced electric field enhancement for near infrared multilayer mirrors

Electric field enhancement due to nodular defects within quarter-wave optical thickness multilayer mirrors is impacted by the inclusion diameter, inclusion depth, inclusion composition, nodular shape, multilayer angular bandwidth, multilayer coating materials, number of layers, angle of incidence, and polarization. In this study, the electric field enhancement for surface inclusions with diameters up to 2 µm irradiated at 1064 nm at either normal or 45 deg incidence is calculated for high refractive index materials over a refractive index range of 1.7–2.3 for oxide materials commonly used in the near infrared. The thicknesses of the multilayer mirror thin films are determined for each high refractive index material by a requirement to meet a 99.5% reflection. The refractive index was found to have a significant impact on the electric field enhancement, which may offer some insight into the optimal material choice to produce high laser damage threshold mirrors.

36 MATERIALS SCIENCE↗

Dual-mode fiber-optic refractive-index gas thermometry with primary anchoring and continuous temperature tracking

Extending fiber-optic refractive-index gas thermometry beyond primary-only operation, we report a dual-mode argon-filled Fabry-Perot thermometer in which the same cavity first establishes a primary temperature anchor and then performs continuous secondary-mode tracking. The primary anchor is obtained from two-pressure fringe shifts using a virial-coefficient refractivity model. During secondary operation, pressure cycling is stopped, and temperature is recovered from the monitored fringe wavelength and gas pressure using a model that includes argon refractivity, pressure-induced cavity strain, and fused-silica thermal expansion. From 310 to 1013 K, secondary-mode temperatures agreed with a reference thermocouple with 0.21 K RMSE and 0.47 K maximum error; 45-min natural furnace cooldowns were also tracked from nearby anchors with close agreement. The dual-mode method retains the empirical-calibration-free primary measurement as an in-situ reference while enabling simpler continuous tracking between anchors, addressing a practical limitation of primary-only fiberoptic refractive-index gas thermometry for hightemperature applications.

Syed, Musaddeque [Michigan State University, East ↗

Low refractive index OLEDs for practical high-efficiency outcoupling. Final report

Improving OLED light extraction is a significant on-going challenge for the OLED lighting industry. The goal of this program was to explore the potential to improve internal light extraction in a manufacturable way by lowering the refractive index of the OLED stack through dilution with an electrically-inert, low refractive index molecule. We accomplished this goal, identifying a small molecule that can be co-evaporated in the hole transport layer of OLEDs at high loading to reduce the refractive index by 0.2-0.3 refractive index units without degrading charge transport. Implementing this dilution molecule in the hole transport layer of a range of single and multi-stack OLEDs, we demonstrated the ability to improve their internal light extraction by up to ~35% without increasing their drive voltage or reducing their operational lifetime. Importantly, these findings extend to state-of-the-art device architectures with proprietary OLED materials.

32 ENERGY CONSERVATION, CONSUMPTION, AND UTILIZATI↗

Simultaneous measurements of radar reflectivity and refractive index spectra in clear air convection.

Simultaneous measurements of radar reflectivity and radio refractive index at several altitudes in clear air convection have been made. The experimental data were compared with the theoretical relationship which relates the reflectivity to the refractivity spectrum. The agreement between the measurements and the theory is excellent and shows that the radar returns in clear air are the result of, and can be quantitatively described as being from, fine-scale refractivity fluctuations due to turbulent mixing. Further, the data give strong support to the -5/3 spectral decay of the refractivity spectrum in the inertial subrange.

Konrad, T. G.↗