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Lexan polymer films irradiated with 550 keV Electron Beam (EB) were characterized using Wide Angle Xray Scattering (WAXS) data to study the microstructural parameters. The crystal imperfection parameters like crystal size , lattice strain (g in %) and enthalpy ({alpha}) have been determined by Line Profile Analysis (LPA) using Fourier method of Warren.
In a scope of a collaboration between Thales Communications and Security and CEA DAM DIF, 11 keV Xrays were produced by inverse Compton scattering on the ELSA facility. In this type of experiment, X-ray observation lies in the use of accurate electron and laser beam interaction diagnostics and on fitted X-ray detectors. The low interaction probability between < 100 {mu}m width, 12 ps [rms] length electron and photon pulses requires careful optimization of pulse spatial and temporal covering. Another issue was to observe 11 keV X-rays in the ambient radioactive noise of the linear accelerator. For that, we use a very sensitive detection scheme based on radio luminescent screens.
X-ray based spectroscopy techniques are particularly well suited to gain access to local oxidation states and electronic dynamics in complex systems with atomic pinpoint accuracy. Traditionally, these techniques are applied in a quasi-static fashion that usually highlights the steady-state properties of a system rather than the fast dynamics that often define the system function on a molecular level. Novel x-ray spectroscopy techniques enabled by free electron lasers (FELs) and synchrotron based pump-probe schemes provide the opportunity to monitor intramolecular and interfacial charge transfer processes in real-time and with element and chemical specificity. Two complementary time-domain xray photoelectron spectroscopy techniques are presented that are applied at the Linac Coherent Light Source (LCLS) and the Advanced Light Source (ALS) to study charge transfer processes in N3 dye-sensitized ZnO semiconductor nanocrystals, which are at the heart of emerging light-harvesting technologies.
A database of published L-subshell X-ray production cross sections due to the impact of {sup 4}He{sup +} ions on several elements is compiled. In order to evaluate the data, they are compared with theoretical calculations using the ECPSSR theory (which modifies the Plane Wave Born Approximation) and its corrections, such as Multiple Ionization of the target atom (MI), United Atom (UA), and Intra-shell coupling (IS) models. It was found that the theory does not predict reliably the experimental results for all elements and energy ranges. Furthermore, a possible universal scaling for the xray production cross sections of the L{sub {alpha}}(L{sub 3}M{sub 4}+L{sub 3}M{sub 5}) and the L{sub {gamma}}(L{sub 2}N{sub 4}+L{sub 1}N{sub 2}+L{sub 1}N{sub 3}+L{sub 1}O{sub 3}+L{sub 1}O{sub 2}+L{sub 2}N{sub 1}+L{sub 2}O{sub 4}) lines is proposed, based on reduced velocity parameters {xi}{sub L}{sup R} and {xi}{sub L1,2}{sup R}, respectively. This scaling seems to be useful for the L{sub {alpha}} experimental points and not so good for the L{sub {gamma}} line, suggesting that more extensive theoretical studies in this direction should be followed.
Tungsten doped tin oxide (WTO) and Molybdenum doped tin oxide (MoTO) thin film were deposited on corn glass by thermal evaporation method. The films were annealed at 350°C for one hour. Structural analysis using Xray diffraction data shows both the films are polycrystalline in nature with monoclinic structure of tin oxide, Sn{sub 3}O{sub 4}, corresponding to JCPDS card number 01-078-6064. SEM photograph showed that both the films have spherical grains with size in the range of 20–30 nm. Compositional analysis was carried out using EDS which reveals the presence of Sn, O and the dopant Mo/W only thereby indicating the absence of any secondary phase in the films. The films are found to contain nearly 6 wt% of Mo, 8 wt% of W as dopants respectively. The transmission pattern for both the films in the spectral range 200 – 2000 nm shows that W doping gives a transparency of nearly 80% from 380 nm onwards while Mo doping has less transparency of 39% at 380nm. Film hardness measurement using Triboscope shows a film hardness of about 9–10 GPa for both the films. It indicates that W or M doping in tin oxide provides the films the added advantage of withstanding the mechanical wear and tear due to environmental fluctuations By optimizing the optical and electrical properties, W/Mo doped tin oxide films may be explored as window layers in opto-electronic applications such as solar cells.
In this work, CuCrO{sub 2} was synthesized by sol-gel method using citric acid as a gelling agent. The different parameters like ratio of citric acid to metal ions, calcination temperature, and duration were studied. A green colored powder with particle size around 300 nm was formed at the calcination temperature of 800 °C for four hours duration. The increase in temperature has a profound impact on crystallite size and in turn effected the optical properties. Band gap of the obtained CuCrO{sub 2} has varied from 2.3 to 1.7 eV by increasing the temperature from 800 °C to 900 °C. Doping studies were performed by introducing Mg{sup 2+} ion to substitute Cr{sup 3+} in CuCrO{sub 2}. X-ray powder diffraction and SEM studies on 2% Mg doped samples indicated a clear formation of side phases. According to the X-ray powder patterns, the reflections from side phases were increasing with the increase in doping concentrations of Mg from 2 to 5%. The side phases were found to be MgCr{sub 2}O{sub 4} spinel and CuO. The band gap has decreased for doped samples in comparison to undoped one. In this paper, sol-gel synthesis and characterization by Xray powder diffraction, SEM studies and UV-Vis-Diffuse Reflectance spectra are presented.
An interesting topic of recent Barkhausen noise (BN) method studies is the application of the method to case depth evaluation of hardened components. The utilization of BN method for this purpose is based on the difference in the magnetic properties between the hardened case and the soft core. Thus, the detection of case depth with BN can be achieved. The measurements typically have been carried out by using low magnetizing frequencies which have deeper penetration to the ferromagnetic samples than the conventional BN measurement. However, the penetration depth is limited due to eddy current damping of the signal. We introduce here a newly found sweep measurement concept for the case depth evaluation. In this study sweep measurements were carried out with various magnetizing frequencies and magnetizing voltages to detect the effect of different frequency and voltage and their correspondence to the actual case depth values verified from destructive characterization. Also a BN measurement device that has an implemented sweep analysis option was utilised. The samples were either induction or case-hardened samples and sample geometry contained both rod samples and gear axle samples with different case depth values. Samples were also further characterized with Xray diffraction to study the residual stress state of the surface. The detailed data processing revealed that also other calculated features than the maximum slope division of the 1st derivative of the BN signal could hold the information about the case depth value of the samples. The sweep method was able to arrange the axles into correct order according to the case depth value even though the axles were used.
In present paper, the combustion method synthesis of Dy{sup 3+} doped Sr{sub 3}B{sub 2}O{sub 6} nanophosphor and their luminescent properties have been reported. The crystalline structure and morphology of nanophosphors was confirmed and verify by the Xray powder diffraction (XRD) and transmission electron microscopy (TEM). The spectral properties of the Sr{sub 3}B{sub 2}O{sub 6}:Dy{sup 3+} nanophosphors have been studied with the photoluminescence (PL) spectroscopy. Under 300nm excitation, the PL emission shows three peaks at 482, 575 and 664 nm, corresponding to the {sup 4}F{sub 9/2}→{sup 6}H{sub 15/2}, {sup 4}F{sub 9/2}→{sup 6}H{sub 13/2} and {sup 4}F{sub 9/2}→{sup 4}H{sub 11/2} transition states. The 1931 CIE diagram gives the coordinates (x, y) as (0.38099, 0.40418) correspond to the shade of yellowish white emission of the Dy{sup 3+} ion which can be used as w-LED phosphors.
Advancements have been made in the diagnostic techniques to measure accurately the total radiated x-ray yield and power from z-pinch implosion experiments at the Z machine with high accuracy. The Z machine is capable of outputting 2 MJ and 330 TW of x-ray yield and power, and accurately measuring these quantities is imperative. We will describe work over the past several years which include the development of new diagnostics, improvements to existing diagnostics, and implementation of automated data analysis routines. A set of experiments on the Z machine were conducted in which the load and machine configuration were held constant. During this shot series, it was observed that the total z-pinch x-ray emission power determined from the two common techniques for inferring the x-ray power, a Kimfol filtered x-ray diode diagnostic and the total power and energy diagnostic, gave 449 TW and 323 TW, respectively. Our analysis shows the latter to be the more accurate interpretation. More broadly, the comparison demonstrates the necessity to consider spectral response and field of view when inferring x-ray powers from z-pinch sources.
The highly coherent and tightly focused x-ray beams produced by hard x-ray light sources enable the nanoscale characterization of the structure of electronic materials but are accompanied by significant challenges in the interpretation of diffraction and scattering patterns. X-ray nanobeams exhibit optical coherence combined with a large angular divergence introduced by the x-ray focusing optics. The scattering of nanofocused x-ray beams from intricate semiconductor heterostructures produces a complex distribution of scattered intensity. We report here an extension of coherent x-ray optical simulations of convergent x-ray beam diffraction patterns to arbitrary x-ray incident angles to allow the nanobeam diffraction patterns of complex heterostructures to be simulated faithfully. These methods are used to extract the misorientation of lattice planes and the strain of individual layers from synchrotron x-ray nanobeam diffraction patterns of Si/SiGe heterostructures relevant to applications in quantum electronic devices. The systematic interpretation of nanobeam diffraction patterns from semiconductor heterostructures presents a new opportunity in characterizing and ultimately designing electronic materials.
Solar cell performance is most affected by the quality of the light absorber layer. For thin-film devices, this becomes a two-fold problem of maintaining a low-cost design with well-ordered nanocrystal (NC) structure. The use of Cu 2 ZnSnS 4 (CZTS) NCs as the light absorber films forms an ideal low-cost design, but the quaternary structure makes it difficult to maintain a well-ordered layer without the use of high-temperature treatments. There is little understanding of how CZTS NC structures affect the photoconversion efficiency, the charge-carriers, and therefore the performance of the device manufactured from it. To examine these relationships, the measured photoresponse from the photo-generation of charge-carrier electron-hole pairs was compared against the crystal structure, as short-range and long-range crystal orders for the films. The photoresponse simplifies the electronic properties into three basic steps that can be associated with changes in energy levels within the band structure. These changes result in the formation of barriers to charge-carrier flow. In this work, the extent of these barriers was determined using synchrotron-based X-ray absorbance fine structure to probe the individual metal centers in the film, and comparing these to molecular simulations of the ideal extended xray absorbance fine structure scattering. This allowed for the quantification of bond lengths, and thus an interpretation of the distortions in the crystal lattice. The various characteristics of the photoresponse were then correlated to the crystallographic order and used to gain physical insight into barriers to charge-carriers in the bulk and surface regions of CZTS films.
A simplified model of bremsstrahlung production is developed for determining the x-ray spectrum output of a rod-pinch radiography machine, on a shot-by-shot basis, using the measured voltage, V(t), and current, I(t). The motivation for this model is the need for an agile means of providing shot-by-shot spectrum prediction, from a laptop or desktop computer, for quantitative radiographic analysis. Simplifying assumptions are discussed, and the model is applied to the Cygnus rod-pinch machine. Output is compared to wedge transmission data for a series of radiographs from shots with identical target objects. Resulting model enables variation of parameters in real time, thus allowing for rapid optimization of the model across many shots. “Goodness of fit” is compared with output from LSP Particle-In-Cell code, as well as the Monte Carlo Neutron Propagation with Xrays (“MCNPX”) model codes, and is shown to provide an excellent predictive representation of the spectral output of the Cygnus machine. In conclusion, improvements to the model, specifically for application to other geometries, are discussed.
Single-shot simultaneous beam monitoring of an x-ray free electron laser (XFEL) and a high-power femtosecond laser is demonstrated using 2D monochromatic Kα imaging. In a pump-probe experiment carried out at the Matter in Extreme Conditions end-station of the Linac Coherent Light Source, a thin solid titanium foil irradiated by a 25-TW relativistic intensity laser for fast electron isochoric heating was probed by a 7.0 keV XFEL beam for x-ray Thomson scattering measurements. Using a spherical crystal imager (SCI), the spatial overlap of the beams was examined by measuring 4.5 keV titanium Kα x rays produced by laseraccelerated fast electrons and the x-ray beam. Changes in XFEL-induced Kα emission patterns were observed down to a ~20×40 μm2 rectangular shape as the beam was focused. Laser-only and two-beam shots reveal that large spatial offsets of laser-induced Kα spots in a horizontal direction is attributed to imprecise target positioning rather than shot-to-shot laser pointing variations. As a consequence, successful beam overlapping was observed on ~58% of all two-beam shots for 10 μm thick samples. The Kα measurements also show a linear relationship between total Kα yields and integrated x-ray scattering signals. Monochromatic xray imaging with SCI could be used as an on-shot beam pointing diagnostic in XFEL-laser or multiple short-pulse laser experiments.
Optical trapping has been implemented in many areas of physics and biology as a noncontact sample manipulation technique to study the structure and dynamics of nano-andmesoscale objects. It provides a unique approach for manipulating microscopic objects without inducing undesired changes in structure. Combining optical trapping with hard X-ray microscopy techniques, such as coherent diffraction imaging and crystallography, provides a nonperturbing environment where electronic and structural dynamics of an individual particle in solution can be followed in situ. It was previously shown that optical trapping allows the manipulation of micrometer-sized objects for Xray fluorescence imaging. However, questions remain over the ability of optical trapping to position objects for X-ray diffraction measurements, which have stringent requirements for angular stability. Our work demonstrates that dynamic holographic optical tweezers are capable of manipulating single micrometer-scale anisotropic particles in a microfluidic environment with the precision and stability required for X-ray Bragg diffraction experiments-thus functioning as an "optical goniometer." The methodology can be extended to a variety of X-ray experiments and the Bragg coherent diffractive imaging of individual particles in solution, as demonstrated here, will be markedly enhanced with the advent of brighter, coherent X-ray sources.
We report on a systematic investigation of the {gamma}-ray properties of 120 hard X-ray-selected Seyfert galaxies classified as 'radio-quiet' objects, utilizing the three-year accumulation of Fermi Large Area Telescope (LAT) data. Our sample of Seyfert galaxies is selected using the Swift Burst Alert Telescope 58 month catalog, restricting the analysis to the bright sources with average hard X-ray fluxes F{sub 14-195keV} {>=} 2.5 Multiplication-Sign 10{sup -11} erg cm{sup -2} s{sup -1} at high Galactic latitudes (|b| > 10 Degree-Sign ). In order to remove 'radio-loud' objects from the sample, we use the 'hard X-ray radio loudness parameter', R{sub rX}, defined as the ratio of the total 1.4 GHz radio to 14-195 keV hard X-ray energy fluxes. Among 120 X-ray bright Seyfert galaxies with R{sub rX} <10{sup -4}, we did not find a statistically significant {gamma}-ray excess (TS > 25) positionally coincident with any target Seyferts, with possible exceptions of ESO 323-G077 and NGC 6814. The mean value of the 95% confidence level {gamma}-ray upper limit for the integrated photon flux above 100 MeV from the analyzed Seyferts is {approx_equal} 4 Multiplication-Sign 10{sup -9} photons cm{sup -2} s{sup -1} , and the upper limits derived for several objects reach {approx_equal} 1 Multiplication-Sign 10{sup -9} photons cm{sup -2} s{sup -1} . Our results indicate that no prominent {gamma}-ray emission component related to active galactic nucleus activity is present in the spectra of Seyferts around GeV energies. The Fermi-LAT upper limits derived for our sample probe the ratio of {gamma}-ray to X-ray luminosities L{sub {gamma}}/L{sub X} < 0.1, and even <0.01 in some cases. The obtained results impose novel constraints on the models for high-energy radiation of 'radio-quiet' Seyfert galaxies.
The atomic pair distribution function (PDF) technique is a powerful approach to gain quantitative insight into the structure of materials where the structural coherence extends only over a few nanometers. In this study I focus on PDF from synchrotron xrays and describe what is the PDF and where it came from, as well as key moments on the journey that have contributed to its enormous recent growth and expanding impact in materials science today. Synchrotron x-ray sources played a starring role in this story.
The extended nature of atomic 5d orbitals, together with a relatively short ~ 3 °A Ir-Ir distance across edge-shared octahedra in honeycomb iridate lattices, leads to a tendency to disrupt the local, spin-orbit entangled jeff = 1 2 moments of Ir4+ ions in favor of dimerization and formation of molecular orbitals, especially upon lattice compression. The sensitivity of Ir L-edge spectroscopy to both spin-orbit entanglement in jeff states and quenching of orbital degrees of freedom in dimerized states, results in a peculiar evolution of x-ray absorption spectra across dimerization transitions including energy shifts in opposite direction for L3 and L2 leading absorption edges, and substantial changes in their isotropic branching ratio. We present a theoretical description of the evolution of 5d electronic states, and related x-ray absorption spectra, in going from the single ion to the dimerized limit. The calculations reproduce the experimental results for hyper-honeycomb β-Li2IrO3[1, 2] and shed light into the weakening of the coupling between spin and orbital degrees of freedom as the strength of dimerization increases. The results provide a basis for interpretation of L-edge xray absorption spectra in 5d systems where competition between formation of local jeff states and molecular orbitals is at play.