Detection of Surface Defects on Fine Metallic Wires by Stimulated Cathode Emission
We describe a device and method that uses elevated electron emission rates to identify surface defects in fine wires. The device is a gas-tight cylinder with fine wires strung across it. The wire to be tested is positioned on the axis of the device. Eighteen field forming and six sensor wires surround the wire to be tested. Special algorithms control the wire voltages to independently vary the surface electric field of the test wire, while keeping the sensor wire's gains consistent. Good surface-quality wires show a constant electron emission rate as a function of the surface electric field strength up to values of ~80 kV/cm (depending on wire radius) while bad-quality wire shows the emergence of high emission rates at significantly lower electric fields.