Engineering Papers⌕ Search

SEARCH · Engineering Papers

Results for “Optical Metrology”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

Quote a phrase for an exact phrase match. Source license links do not imply unrestricted reuse.

At least 109 records · Page 6

[Development of Nanotechnology for X-Ray Astronomy Instrumentation]

This Research Grant provides support for development of nanotechnology for x-ray astronomy instrumentation. MIT has made significant progress in several development areas. In the last year we have made considerable progress in demonstrating the high-fidelity patterning and replication of x-ray reflection gratings. We developed a process for fabricating blazed gratings in silicon with extremely smooth and sharp sawtooth profiles, and developed a nanoimprint process for replication. We also developed sophisticated new fixturing for holding thin optics during metrology without causing distortion. We developed a new image processing algorithm for our Shack-Hartmann tool that uses Zernike polynomials. This has resulted in much more accurate and repeatable measurements on thin optics.

Schattenburg, Mark L.↗

Absolute Measurement of Tilts via Fourier Analysis of Interferograms

The Fourier method of interferogram analysis requires the introduction of a constant tilt into the inteferogram to serve as a 'carrier signal' for information on the figure of the surface under test. This tilt is usually removed in the first steps of analysis and ignored thereafter. However, in the problem of aligning optical components and systems, knowledge of part orientation is crucial to proper instrument performance. This paper outlines an algorithm which uses the normally ignored carrier signal in Fourier analysis to compute an absolute tilt (orientation) of the test surface. We also provide a brief outline of how this technique, incorporated in a rotating Twyman-Green interferometer, can be used in alignment and metrology of optical systems.

Toland, Ronald W.↗

Absolute Measurement of Tilts via Fourier Analysis of Interferograms

The Fourier method of interferogram analysis requires the introduction of a constant tilt into the interferogram to serve as a carrier signal for information on the figure of the surface under test. This tilt is usually removed in the first steps of analysis and ignored thereafter. However, in the problem of aligning optical components and systems, knowledge of part orientation is crucial to proper instrument performance. This paper outlines an algorithm which uses the normally ignored carrier signal in Fourier analysis to compute an absolute tilt (orientation) of the test surface. We also provide a brief outline of how this technique, incorporated in a rotating Twyman-Green interferometer, can be used in alignment and metrology of optical systems.

Toland, Ronald W.↗

Optical figure testing of prototype mirrors for JPL's Precision Segmented Reflector (PSR) program

JPL's PSR program is developing enabling technologies for large space telescopes employing segmented optics, and in particular, lightweight, thermally stable mirrors for telescopes operating at sub-mm wavelengths. JPL's vacuum cryointerferometric optical test facility includes a computer-controlled phase shifting interferometer operating at 10.59 microns and laser metrology for measurement of piston and absolute radius of curvature. The optical metrology has been integrated with a large vacuum chamber including a liquid nitrogen shroud capable of radiatively cooling 1.5 meter aperture mirrors down to 150 K. The facility is now being used to characterize prototype mirrors in both their room-temperature 'as-replicated' condition, and under orbital temperature conditions. The performance and limitations of the optical metrology hardware and software components are noted. Representative test results on prototype one meter-class composite mirrors being developed for PSR and related ground-based programs are also presented.

Hochberg, Eric B.↗

Towards Other Planetary Systems (TOPS): A technology needs identification workshop

The workshop identified a strong commonality between the technology needs for NASA's TOPS program and the technology needs that were identified for NASA's astrophysics program through its Astrotech 21 survey. The workshop encourages NASA to have the Solar System Exploration and Astrophysics Div. work cooperatively to share in technology studies that are common to both programs, rather than to conduct independent studies. It was also clear, however, that there are technology needs specific to TOPS, and these should be pursued by the Solar System Exploration Div. There are two technology areas that appear to be particularly critical to realizing the ultimate performance that is being sought under the TOPS program, these areas are metrology and optics. The former is critical in calibration and verification of instrument performance, while the latter is needed to provide optical systems of sufficient quality to conduct a search for and characterization of other planetary systems at the more extreme levels of performance identified in TOPS program.

Black, David C.↗

Advanced technology development multi-color holography

This is the final report of the Multi-color Holography project. The comprehensive study considers some strategic aspects of multi-color holography. First, various methods of available techniques for accurate fringe counting are reviewed. These are heterodyne interferometry, quasi-heterodyne interferometry, and phase-shifting interferometry. Phase-shifting interferometry was found to be the most suitable for multi-color holography. Details of experimentation with a sugar solution are also reported where better than 1/200 of a fringe order measurement capability was established. Rotating plate glass phase shifter was used for the experimentation. The report then describes the possible role of using more than two wavelengths with special reference-to-object beam intensity ratio needs in multicolor holography. Some specific two- and three-color cases are also described in detail. Then some new analysis methods of the reconstructed wavefront are considered. These are deflectometry, speckle metrology, confocal optical signal processing, and phase shifting technique related applications. Finally, design aspects of an experimental breadboard are presented.

Vikram, Chandra S.↗

Development of Constellation-X Optics Technologies at MSFC

One of the major technological challenges for the Constellation X-ray Mission is the development of light-weight, high-resolution, grazing-incidence optics. NASA's Marshall Space Flight Center is developing and evaluating candidate technologies, based upon full-shell replication off precision mandrels. Here we report on recent progress in meeting the weight and imaging-performance requirements, using very thin, high-strength electroformed nickel alloys. In addition, we briefly describe MSFC's optics fabrication, metrology, and x-ray test facilities.

Odell, S. L.↗

Development of Constellation-X Optics Technologies at MSFC

One of the major technological challenges for the Constellation X-ray Mission is the development of light-weight, high-resolution, grazing-incidence optics. NASA's Marshall Space Flight Center is developing and evaluating candidate technologies, based upon full-shell replication off precision mandrels. Here we report on recent progress in meeting the weight and imaging-performance requirements, using very thin, high- strength electroformed nickel alloys, In addition, we briefly describe MSFC's optics fabrication, metrology, and x-ray test facilities.

Ramsey, B. D.↗

Development of Constellation-X Optics Technologies at MSFC

One of the major technological challenges for the Constellation X-ray Mission is the development of light-weight, high-resolution, grazing-incidence optics. NASA's Marshall Space Flight Center is developing and evaluating candidate technologies, based upon full-shell replication off precision mandrels. Here we report on recent progress in meeting the weight and imaging-performance requirements, using very thin, high-strength electroformed nickel alloys. In addition, we briefly describe MSFC's optics fabrication, metrology, and x-ray test facilities.

ODell, S. L.↗

Assurance Technology Challenges of Advanced Space Systems

The initiative to explore space and extend a human presence across our solar system to revisit the moon and Mars post enormous technological challenges to the nation's space agency and aerospace industry. Key areas of technology development needs to enable the endeavor include advanced materials, structures and mechanisms; micro/nano sensors and detectors; power generation, storage and management; advanced thermal and cryogenic control; guidance, navigation and control; command and data handling; advanced propulsion; advanced communication; on-board processing; advanced information technology systems; modular and reconfigurable systems; precision formation flying; solar sails; distributed observing systems; space robotics; and etc. Quality assurance concerns such as functional performance, structural integrity, radiation tolerance, health monitoring, diagnosis, maintenance, calibration, and initialization can affect the performance of systems and subsystems. It is thus imperative to employ innovative nondestructive evaluation methodologies to ensure quality and integrity of advanced space systems. Advancements in integrated multi-functional sensor systems, autonomous inspection approaches, distributed embedded sensors, roaming inspectors, and shape adaptive sensors are sought. Concepts in computational models for signal processing and data interpretation to establish quantitative characterization and event determination are also of interest. Prospective evaluation technologies include ultrasonics, laser ultrasonics, optics and fiber optics, shearography, video optics and metrology, thermography, electromagnetics, acoustic emission, x-ray, data management, biomimetics, and nano-scale sensing approaches for structural health monitoring.

Chern, E. James↗

Comparison of full-aperture interferometry to sub-aperture stitched interferometry for a large diameter fast mirror

The Herschel Space Observatory (formerly known as FIRST) consists of a 3.5 m space telescope. Stitching sub aperture interferograms may offer considerable cost savings during testing of the flight telescope as compared to other techniques. A comparative demonstration is presented of interferogram stitching techniques that enable a composite map of a 3-D surface to be assembled from a sequence of sub-aperture measurements. This paper describes the fundamental procedures for stitching together component data sets and demonstrates such techniques with real data sets.

carbon fiber composite cryogenic optics high slope↗

Dual Target Metrology

Explore the source record for details and available documents.

metrology optical interferometry dual target heter↗

Error Modeling of Multi-baseline Optical Truss: Application to SIM Metrology Truss Field Dependent Error - Part II

The current design of the Space Interferometry Mission (SIM) employs a 19 laser-metrology-beam system (also called L19 external metrology truss) to monitor changes of distances between the fiducials of the flight system's multiple baselines. The function of the external metrology truss is to aid in the determination of the time-variations of the interferometer baseline. The largest contributor to truss error occurs in SIM wide-angle observations when the articulation of the siderostat mirrors (in order to gather starlight from different sky coordinates) brings to light systematic errors due to offsets at levels of instrument components (which include comer cube retro-reflectors, etc.). This error is labeled external metrology wide-angle field-dependent error. Physics-based model of field-dependent error at single metrology gauge level is developed and linearly propagated to errors in interferometer delay. In this manner delay error sensitivity to various error parameters or their combination can be studied using eigenvalue/eigenvector analysis. Also validation of physics-based field-dependent model on SIM testbed lends support to the present approach. As a first example, dihedral error model is developed for the comer cubes (CC) attached to the siderostat mirrors. Then the delay errors due to this effect can be characterized using the eigenvectors of composite CC dihedral error. The essence of the linear error model is contained in an error-mapping matrix. A corresponding Zernike component matrix approach is developed in parallel, first for convenience of describing the RMS of errors across the field-of-regard (FOR), and second for convenience of combining with additional models. Average and worst case residual errors are computed when various orders of field-dependent terms are removed from the delay error. Results of the residual errors are important in arriving at external metrology system component requirements. Double CCs with ideally co-incident vertices reside with the siderostat. The non-common vertex error (NCVE) is treated as a second example. Finally combination of models, and various other errors are discussed.

comer cube retro-reflector↗

The Mask Designs for Space Interferometer Mission (SIM)

The Space Interferometer Mission (SIM) consists of three interferometers (science, guide1, and guide2) and two optical paths (metrology and starlight). The system requirements for each interferometer/optical path combination are different and sometimes work against each other. A diffraction model is developed to design and optimize various masks to simultaneously meet the system requirements of three interferometers. In this paper, the details of this diffraction model will be described first. Later, the mask design for each interferometer will be presented to demonstrate the system performance compliance. In the end, a tolerance sensitivity study on the geometrical dimension, shape, and the alignment of these masks will be discussed.

Diffraction↗

Radiation-Resistant Photon-Counting Detector Package Providing Sub-ps Stability for Laser Time Transfer in Space

We are reporting on a design, construction and performance of photon-counting detector packages based on silicon avalanche photodiodes. These photon-counting devices have been optimized for extremely high stability of their detection delay. The detectors have been designed for future applications in fundamental metrology and optical time transfer in space. The detectors have been qualified for operation in space missions. The exceptional radiation tolerance of the detection chip itself and of all critical components of a detector package has been verified in a series of experiments.

radiation hardness↗

Sub-Femto-g Free Fall for Space-Based Gravitational Wave Observatories: LISA Pathfinder Results

We report the first results of the LISA Pathfinder in-flight experiment. The results demonstrate that two free-falling reference test masses, such as those needed for a space-based gravitational wave observatory like LISA, can be put in free fall with a relative acceleration noise with a square root of the power spectral density of 5.2 +/- 0.1 fm s(exp -2)/square root of Hz, or (0.54 +/- 0.01) x 10(exp -15) g/square root of Hz, with g the standard gravity, for frequencies between 0.7 and 20 mHz. This value is lower than the LISA Pathfinder requirement by more than a factor 5 and within a factor 1.25 of the requirement for the LISA mission, and is compatible with Brownian noise from viscous damping due to the residual gas surrounding the test masses. Above 60 mHz the acceleration noise is dominated by interferometer displacement readout noise at a level of (34.8 +/- 0.3) fm square root of Hz, about 2 orders of magnitude better than requirements. At f less than or equal to 0.5 mHz we observe a low-frequency tail that stays below 12 fm s(exp -2)/square root of Hz down to 0.1 mHz. This performance would allow for a space-based gravitational wave observatory with a sensitivity close to what was originally foreseen for LISA.

space science↗

Category B Plastic Pane Testing for JSC 66320 Rev A Requirements Verifiable Through Acceptance Testing

JSC 66320, Revision A, Optical Property Requirements for Glasses, Ceramics, and Plastics in Spacecraft Window Systems, lists several quantitative requirements that spacecraft windowpanes must meet. Recently, we were asked to establish a capability at the Kennedy Space Center to perform these measurements on category B plastic panes, i.e., plastic panes that could be used on a spacecraft for long-focal-length photography and piloting. Two of the criteria, normal wavefront and 30-degree wavefront attributes, can be measured with existing equipment and processes (see NASA TM NESC-RP-14-00951, April 2016) and are not discussed in this document. However, the other six criteria-haze, wedge angle, birefringence, reflectance, transmittance, and color balance-required substantial development and are the subject of this document. In this document, we do not discuss the rationale behind the requirements, but we did engage in discussions with the authors of JSC 66320 in order to better understand the requirements and the verifications being imposed on windows and their testing. Accordingly, this document presents our best understanding of the requested requirements and verifications. We also present our methodology for performing each of the six measurements, along with applicable mathematics and a description, with photos, of the hardware used. In addition, we supply the results of a test on a low-quality in-house plastic window as an example of the system operation. Only requirements that can be met by acceptance test and analysis, as opposed to optical inspection, are considered in this document.

spaceflight windows↗