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At least 109 records · Page 6

Static Strain Modelling, Calibration, and Measurements for High-Temperature Wireless SAW Resonator Operation

Static strain measurements are relevant for Integrated System Health Monitoring of civil structures, aircrafts, power plants and advanced manufacturing equipment, with implications for safety, process efficiency, and maintenance costs. Wireless strain sensing is highly desirable where the presence of wires poses significant safety concerns, increases maintenance, and thus overall costs, or where they are not feasible, such as in applications which contain moving parts. This paper presents wireless interrogation of surface acoustic wave resonators (SAWRs) fabricated on langasite (LGS) along Euler angles (0°, 138.5°, 32.9°) and aimed at the detection of static strain at hightemperature (HT, above 100°C). Both commercial HT strain gauges and finite element analysis (FEA Abaqus software) were used and compared for SAWR strain calibration from room temperature (RT) to HT. In addition, this work investigated a compromise between high temperature operation vs. sensitivity based on the thickness of ceramic adhesive used. For instance, a reduction in the adhesive thickness from about 150 μm to 135 μm, resulted in a 39% increase in sensitivity at RT. It was also observed that the sensitivity dropped up to 34% from RT to 200°C. Furthermore, wireless operation, calibration, and increase in sensitivity constitute important advances in the use of LGS SAW devices to monitor static stress in high-temperature harsh environments.

42 ENGINEERING↗

Calibration, modeling, parameterization, and verification of the instrument transfer function of an interferometric microscope

Interferometric microscopes are used to measure surface roughness, from which the computed power spectral density function can be used to extract bandwidth-limited values of the various surface properties, such as root-mean-square (rms) height and slope errors. Measurements with a microscope equipped with different objectives that have an overlapping spatial frequency range usually give different rms results over the common frequency bandwidth. This is a result of different instrument transfer functions (ITFs) that attenuate spatial frequencies by different amounts over the overlapping range. We report on the use of binary pseudo-random array (BPRA) standards to characterize the ITF of an interferometric microscope with the various objectives. We use a simple model of a 1D binary Results show that the spectrum for an undersampled array is a cosine function, rather than a straight line, constant white noise spectrum. We have an analytical model of the ITF that includes the effects of an obscured aperture and defocus, in addition to the usual parameters of numerical aperture, wavelength, and sampling period. In addition, the model includes the effect of aliasing of spatial frequency components beyond the Nyquist back into the sub-Nyquist region. We compare the model PSD predictions to the measurements performed with different objectives. Departures of the measured PSDs from the model predictions indicate that there are higher-order ITF corrections yet to be identified and included in the model.

Takacs, PZ↗